Download Agilent Technologies Option H48 Multiport Test Set Z5623A Specifications

安捷倫科技高頻元件量測研討會
時間: 2006年 2月23日
地點: 高雄金典酒店
Packaging Development
Trend of Integrated
Analysis
Sung-Mao Wu
安捷倫高頻元件量測研討會
Page 1
2/23/2006
Outline
Development Trend for PKG
-- PKG Technology Trend
-- Why SiP and POP/PIP
Challenges to PKG Integrity Design
-- Design Challenges on Simulation, Measurement and Design
-- Case I : Effective DK
-- Case II : Impedance Control verify by TDR
-- Case III: TDR FA Application
-- Case IV : Substrate Ball Pad Design
-- Case V : PDS Analysis
Integrated Design
-- Components of Optimization PKG Design
-- Advanced PKG Analysis Flow
-- Plan and Actions for PKG Design
安捷倫科技高頻元件量測研討會
2/23/2006
Page 2
1
Interesting Semiconductor
World
Fab/fabless
Copper wafer
Front/Back end
solution
Low K material
Environment friendly
12” wafer
Compact Size
Low power consumption
Naro meter tech
Semiconductor
Industry
Integrated
System
Bio tech / New form chip
IC/module/System Design
Low cost
High speed/high frequency
Short Time to
Market
High thermal / Stress solution
Worldwide strategy
安捷倫科技高頻元件量測研討會
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Packaging Technology Trend
Wire Bond
Single Chip Package
Wire Bond + FC Bond
New
Interconnection?
Multiple Chip Package
Stacked Package
QFP
BGA
Stacked Die
System in Package
MCM
PoP
Flip Chip
FC+WB
PiP
Chip
Multi-Layer
PCB
1995
Laminate
2 & 4 Layer
Build-Up
Substrate
2000
Functional Substrate
(Active & Passive Chip)
2005
2010
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2
Why SIP ?
SoC IC
Compare to Board Assembly:
MicroPassives
SIP
Performance Enhancement
component
Thinner, Smaller, and Lighter
Low Cost
Compare to SOC
Low Cost
Memory IC
Time to Market
Board Assembly
Sub-System
Flexible
Build-up
Substrate
Single Chip
Solution
Module
SIP
Platform
Die
Stacking
Platform
Flash SDRAM
ASIC
Package
Stacking
Platform
Flash SDRAM
Flash SDRAM
ASIC
ASIC
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Die Stacking Package Trend
• Smaller & Lighter Package Size
0.5mm
• High Density Device in Package
0.8mm
1.0mm
1.2mm
1.4mm
2 die
3 die
4 die
5 die
7 die
安捷倫科技高頻元件量測研討會
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3
PoP and PiP
PoP
Package/ Die
Count
Package Thickness
Package Structure
2 PKG/ 3 Chip
2 PKG/ 3 Chip
2 PKG/ 4 Chip
3 PKG/ 7 Chip
1.6 mm Max
1.4 mm Max
1.2 mm Max
2.0 mm Max
Flash
Flash
SDRAM
ASIC
W/B Type
Flash
F/C Type
SDRAM
ASIC
Flash
SDRAM
ASIC
SDRAM
ASIC
PiP
2 PKG/ 3 Chip
2 PKG/ 3 Chip
2 PKG/ 3 Chip
1.4 mm Max
1.2 mm Max
1.0 mm Max
Package/ Die Count
Package Thickness
Package Structure
Available
2006
2007
安捷倫科技高頻元件量測研討會
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Page 7
Fine Pitch Wire Bonding
IC Feature Size (um)
• Wire Bond pad Pitch (um)
0.25
0.18
0.13
0.09
0.065
50
45
40
35
80/40
70/35
60/30
50/25
40/20
90/45
80/40
70/35
60/30
50/25
100/50
90/45
80/40
70/35
60/30
60
(Single-In-Line)
• Wire Bond Pad Pitch (um)
(2 Row Staggered)
• Wire Bond Pad Pitch (um)
(Tri-Tier)
•Wire Bond pad pitch (um )
( Quad-Tier )
„ Leading-Edge Fine-Pitch Capabilities
ƒ In-Line: 45 um; Staggered: 60 um; Tri-Tier: 70 um ; Quad-Tier: 80um
„ Low k & Copper wafer capabilities available.
安捷倫科技高頻元件量測研討會
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4
Trends of Packaging Technologies
Focus Packages -
Bumping, WLCSP, FCBGA, SIP, SCSP and
modified LF package
Small & Light
Thin Thickness in Wafer, Substrate, Package
Fine Pitch in Wire Bonding, Flip Chip Bond and
Solder Ball
High Density by Stacked Die, Package, MultiSubstrate Layer,Substrate Stacked, Staggered Via
and Small Trace Via Hole Size
-
Good Thermal and Electrical Performance
Green
-
High Speed and Low Thermal Resistance
Cu / LowLow-K wafer,
wafer Nano-technology
-
Green Solution
Low Cost & Fast Time-to-market
12’’
12’’ Wafer Capacity
Total Turnkey Solution
Matrix design, Multi-die, package Design
LAB Design Support
安捷倫科技高頻元件量測研討會
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Page 9
Outline
Development Trend for PKG
-- PKG Technology Trend
-- Why SiP and POP/PIP
Challenges to PKG Integrity Design
-- Design Challenges on Simulation, Measurement and Design
-- Case I : Effective DK
-- Case II : Impedance Control verify by TDR
-- Case III: TDR FA Application
-- Case IV : Substrate Ball Pad Design
-- Case V : PDS Analysis
Integrated Design
-- Components of Optimization PKG Design
-- Advanced PKG Analysis Flow
-- Plan and Actions for PKG Design
安捷倫科技高頻元件量測研討會
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5
Challenges to PKG Integrated Design
Analysis Challenges
ÆMulti-port parameters analysis and broadband calibration skill
ÆDouble-side calibration and probing technology
ÆSignal-integrity, SSN/SSO and IP drop
ÆMixed-signal analysis
ÆSubstrate On-line testing, like via, bump and ball……
Design Challenges to SiP
ÆPKG selection for different thermal/electrical request
ÆSubstrate Design integrated thermal/electrical solution.
-- Embedded Die/passive, IPD, decoupling cap……
ÆPKG IP development.
ÆDesign Guideline and constraint
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Analysis Case I :
Æeffective dielectric constant
What is the effective Er of this mixture material ?
Er = 3.2
Er = 6.0
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6
Analysis Case I :
ÆMeasurement and ADS setup
VNA
Long trace
short trace
Short trace
Sample
Probe station
DUT: (Microstrip/Strip TL)
same cross-section with different length
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Analysis Case I :
Æextraction result
4.5
m4
4.0
3.5
Effective dielectric constant
3.0
2.5
Er_preg
Sim/mea comparison
200
m4
freq= 2.358GHz
Er_preg=3.828
2.0
1.5
1.0
0.5
0.0
-0.5
-1.0
0
8.00
7.84
7.68
7.52
7.36
7.20
7.04
6.88
6.72
6.56
6.40
6.24
6.08
5.92
5.76
5.60
5.44
5.28
5.12
4.96
4.80
4.64
4.48
4.32
4.16
4.00
3.84
3.68
3.52
3.36
3.20
3.04
2.88
2.72
2.56
2.40
2.24
2.08
1.92
1.76
1.60
1.44
1.28
1.12
0.96
0.80
0.64
0.48
0.32
0.16
0.00
0.5
Mea
-100
freq, GHz
0.4
loss_tan1
phase(S(6,5))
phase(S(2,1))
100
Sim
m5
freq=4.985GHz
loss_tan1=0.011
0.3
Loss tangent
0.2
0.1
-200
m5
0
2
4
6
8
10
12
14
freq, GHz
16
18
20
22
24
26
0.0
0
1
2
3
4
5
6
7
8
9
10
freq, GHz
Good Correlation between simulation and measurement
Once we have the accurate the dielectric constant of mixture material of
substrate, we can achieve good electrical substrate design.
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7
Analysis Case II :
ÆImpedance Control Verify by TDR/TDR System
Signal Trace in 1st Layer
W
S
T
GND Plane in 2nd Layer
T1
Dielectric Layer
ε= 4.0
Design Condition:
Substrate Type : 2 Layer
Impedance Control : Differential
Simulation Structure : Micro-Strip Line
Trace Width (W): 0.39mm
Trace Thickness (T): 22 um
Dielectric Thickness (T1): 200um
Separation (s): 0.15mm
TDR Measurement
Result
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Impedance Control
-- Manufacture Result and comparison
SEM-single ended trace
width measurement
SEM-differential trace
width/space measurement
Design / Measurement Comparison
Q2D
Q2D
TDR
Trace width(um)
388.95(from drawing)
429um
429um
Impedance comparison
separation(um)
Zodd(ohm) Zeven(ohm) Single ended(ohm)
41.2
58.8
50.9
150(from drawing)
38.1267
55.6689
47.5768/435um
116um
61.7
116um
42.4~42.8
52.3~53
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8
Analysis Case III ÆFA Application
▼ TDR of bare, good, and failure sample
bare substrate
Open
waveform
good unit 1
2202 T4
failure
Slight difference on the
chip capacitance charge
curve –
A possible reason of
this phenomenon is the
IMC makes the interface
resistance between wire
and bond pad growing,
which causes the
charge current different.
good unit 2
IMC
Chip capacitance
安捷倫科技高頻元件量測研討會
2/23/2006
Page 17
Analysis Case IV :
ÆBall pad effect analysis
Void the plane above
ball pad area at
PWR/GND will reduce
the capacitance,
Ball_Pad1
No Void
Ball_Pad2
Void layer3
Ball_Pad3
dB(Ball_Pad3_UP_1112..S(2,1
dB(Ball_Pad2_UP_1112..S(2,1
dB(Ball_Pad1_UP_1112..S(2,1
Void PWR/GNG plane above
the ball land on Layer3
Measurement Result
0
-5
-10
-15
-20
-25
0
Void layer2＆3
2
4
6
8
10
12
14
16
18
20
freq, GHz
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9
Analysis Case V :
PDS Analysis -- Measurement setup
27mm
27mm
Top view
Bottom view
安捷倫科技高頻元件量測研討會
2/23/2006
Page 19
Analysis Case V :
Æ Measurement and Simulation Result
(Test Board only)
Port 1
Port 2
S21_dB
Field propagation @750MHz
安捷倫科技高頻元件量測研討會
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10
Analysis Case V :
Æcomparison with bare PCB, Package and BGA+PCB
Bare PCB
Noise coupling between PKG&PCb?
package only
BGA and PCB
Effect of package
-5
-10
-15
S21 (dB)
-20
-25
-30
-35
-40
-45
-50
-55
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
5
Frequency (GHz)
安捷倫科技高頻元件量測研討會
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Page 21
Outline
Development Trend for PKG
-- PKG Technology Trend
-- Why SiP and POP/PIP
Challenges to PKG Integrity Design
-- Design Challenges on Simulation, Measurement and Design
-- Case I : Effective DK
-- Case II : Impedance Control verify by TDR
-- Case III: TDR FA Application
-- Case IV : Substrate Ball Pad Design
-- Case V : PDS Analysis
Integrated Design
-- Components of Optimization PKG Design
-- Advanced PKG Analysis Flow
-- Plan and Actions for PKG Design
安捷倫科技高頻元件量測研討會
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11
Components of Optimization Package Design
Characterization Lab
capability on Electrical,
Thermal, Stress
and Material
Substrate:
laminate,
build-up,
ceramic,
RLC embed
Design Rule/Spec
for substrate layout
•Knowing Electrical
Characteristics
deep inside
•Provide package solutions
from advanced pkg
technology
Wire &
Bumping
Pkg options:
structure,
cost,
thermal,
board level...
Leadframe:
L/F for SOP/QFP etc,
L/F for BCC/QFN etc.
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Integrity Design Flow for Advanced PKG
Substrate Design / Pre-simulation
Software
•Design Guideline and Constraint
Transfer interface
Simulation
Quasi-State EM
Simulator
•Whole PKG modeling
extracting
High Frequency/Speed
Simulator
•3D Field solver
•FTDT simulator
•2.5D Momentum
•PDS Simulator
POST-Analysis Capability
& Integrated plane
•Broadband modeling
•Signal Integrity (SI)
•PDS analysis
•EMI/EMC analysis
•data flow control plane
•PKG IP Development
System Integrity Analysis
and Design Guide for
Advance Package
Hardware
Frequency Domain
•VNA/PNA with PLTS/ADS
8722ES (40GHz, 2-port)
8364B (50GHz, 4-port)
•Impedance Analyzer
•Spectrum analyzer
Measurement Plane
•Probe Station
Single-side 2-port
Double-Side Multi-port
•High Performance Probe (50GHz)
•High Performance cable (50GHZ)
Time Domain
•Time Domain Reflectometer
with TDA/
•High Speed Pattern Generator
Design Constraint & PKG IP
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12
Plan and Actions for PKG Design
Substrate Design Integrity Electrical Performance
-Design Integrity Electrical performance flow
-Design Rule and Constraint setting for SiP PKG Application,
like RF Module, optical and wireless PKG
Active/Passive Device analysis capability
-Embedded passive (RF-MEMS, Substrate embedded RLC)
analysis and IP-development
-Sub-system measurement capability setting for advanced PKG
Co-Design and Co-development with key partners
-Co-working with key partners for more close and detail study
in Wireless, Optical or RF module
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Page 25
Contacts
z
Samuel_Wu, Leader of Electrical Lab
E-mail: [email protected]
Phone: 886-7-3617131 ext. 15290/85290
Fax:
886-7-3613094
z
Mark_Li, Project Engineer of Electrical Lab
E-mail: [email protected]
Phone: 886-7-3617131 ext. 15291/85291
Fax:
886-7-3613094
ASE, Inc (Kaohsiung)
26, Chin 3rd Rd.,
811, Nantze Export Processing Zone
Kaohsiung, TAIWAN
Website: www.aseglobal.com
安捷倫科技高頻元件量測研討會
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13
THE END
Thank You For Your Listening
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14
PNA Based Solutions
- Pulsed RF S-Parameter Measurements
- Multiport Test Solutions
- Physical Layer Test Systems
Agilent Technologies Ltd.
Ming-Fan, Tsai
Project Manager
Feb, 23, 2006
安捷倫科技高頻元件量測研討會
Page 1
Feb.23, 2006
Pulsed-RF S-Parameter Applications Using The
Agilent PNA Series Network Analyzer
安捷倫科技高頻元件量測研討會
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Feb.23, 2006
1
Agenda
• Why Measure in Pulsed Mode and the DUTs We Test
– Wafer Test
– Power Amplifiers
– Antenna RCS
– T/R Modules
• Review of Pulsed Measurements
• Wideband synchronous
• Narrowband asynchronous
• Evolution of Pulsed VNAs from Agilent
• 8510, 85108, 85120, CTS Platform to PNA
• Test Sets Available
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 3
Why Test Under Pulsed Conditions?
• Device may behave differently between CW and pulsed
stimuli
• Bias changes during pulse might affect RF performance
• Overshoot, ringing, droop may result from pulsed stimulus
• Measuring behavior within pulse is often critical to characterizing
system operation (radars for example)
• CW test signals would destroy DUT
• High-power amplifiers not designed for continuous operation
• On-wafer devices often lack adequate heat sinking
• Pulsed test-power levels can be same as actual operation
安捷倫科技高頻元件量測研討會
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Feb.23, 2006
2
On-Wafer Amplifier Test and Modeling
•Most applications are at microwave frequencies
•Devices lack adequate heatsinking for CW testing, so pulsed-RF used as a
test technique to extract S-parameters
•Arbitrary, stable temperature (isothermal
state) set by adjusting duty cycle
•Duty cycles are typically < 1%
•Often requires synchronization of
pulsed bias and pulsed RF stimulus
安捷倫科技高頻元件量測研討會
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Page 5
Wireless Communications Systems
• TDMA-based systems often use burst mode transmission
• Saves battery power
• Minimizes probability of intercept
• Power amplifiers often tested with pulsed bias
• Most of wireless communications applications ≤ 6 GHz
安捷倫科技高頻元件量測研討會
Page 6
Feb.23, 2006
3
Pulsed Antenna Test
• About 30% of antenna test involves pulsed-RF stimulus
• Test individual antennas, complete systems, or RCS
• RCS (Radar Cross Section) measurements often
require gating to avoid overloading receiver
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Page 7
Component-Level Characterization
• Accurate characterization of components such as amplifiers, mixers,
filters, and antennas is critical for effective system simulation
• Pulsed-RF stimulus crucial for many components in A/D applications
such as AESA Phased arrays and the individual T/R Modules that
are used in such systems
Transmit / Receive Module
Receive Module
安捷倫科技高頻元件量測研討會
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Feb.23, 2006
4
Radar and Electronic-Warfare
•Biggest market for pulsed-RF testing
•Traditional applications ≤ 20 GHz
•Many now include Multi-Mode Ka-Band
•Devices include
• amplifiers
• T/R modules
AN/APG-79 F16C Block 60
• up/down converters
Pave-Paws
AN/APG-81 JSF
安捷倫科技高頻元件量測研討會
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Page 9
Agenda
• Why Measure in Pulsed Mode and the DUTs We Test
– Wafer Test
– Power Amplifiers
– Antenna RCS
– T/R Modules
• Review of Pulsed Measurements
• Wideband synchronous
• Narrowband asynchronous
• Evolution of Pulsed VNAs from Agilent
• 8510, 85108, 85120, CTS Platform to PNA
• Test Sets Available
安捷倫科技高頻元件量測研討會
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Feb.23, 2006
5
VNA Pulsed-RF Measurements
VNA data display
Magnitude and phase data
averaged over duration of pulse
data
point
Frequency domain
Average Pulse
Swept
carrier
Data acquired only during specified
gate width and position within pulse
Frequency domain
Point-in-Pulse
CW
Data acquired at uniformly spaced
time positions across pulse
(requires a repetitive pulse stream)
Pulse Profile
dB
Magnitude
Time domain
deg
Phase
Note: there may not be a one-to-one correlation between data points
and the actual number of pulses that occur during the measurement
安捷倫科技高頻元件量測研討會
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Pulsed-RF Data Acquisition (Time Domain View)
Freq 6
carrier freq
Pulsed-RF
...
Freq 5
Point-in-Pulse
Freq 4
Freq 3
Freq 2
Freq 1
Trace
point 1
Trace
point 2
Trace
point 3
Trace
point 4
gate delay
Trace
point 5
Delay 6
...
Gate
Delay 4
Delay 3
Note: the number of pulses
per data point varies with
PRF and IF bandwidth
Delay 2
Delay 1
Page 12
t
...
Delay 5
Pulse Profile
Trace
point 1
Trace
point 6
Trace
point 2
Trace
point 3
Trace
point 4
Trace
point 5
Trace
point 6
t
...
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Pulse-to-Pulse (Single Shot) Measurements
• Carrier remains fixed in frequency
• Measurement point in pulse remains fixed with respect to pulse trigger
(requires wideband detection technique)
• One data point for each successive pulse, no pulses skipped
• Display magnitude and/or phase versus time
One data point for each successive pulse, no pulses skipped
CW pulses
P1
P2
VNA data display
P3
P4
P5
P6
…
Time domain
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Page 13
Pulsed S-parameter Measurement Modes
Wideband/synchronous acquisition
• Majority of pulse energy is contained within receiver bandwidth
• Incoming pulses and analyzer sampling are synchronous
(requires a pulse trigger, either internal (8510) or external (PNA)
• Pulse is “on” for duration of data acquisition
• No loss in dynamic range for small duty cycles (long PRI's),
but there is a lower limit to pulse width
Receiver BW
Pulse trigger
Time domain
Frequency domain
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Feb.23, 2006
7
Typical Hardware Setup For Wideband Detection
Point-in-Pulse and Pulse-to-Pulse
External pulse generator (e.g., 81110A/81111A)
Output 1
PNA (20, 40, 50, or 67 GHz) with:
• 014 Configurable test set
• UNL Source attenuators
• 080 Frequency offset mode
To TRIG IN (rear panel)
10 MHz
Ref
Output 2
Cplr Thru
Src Out
Ref In
Z5623A H81
2-20 GHz RF modulator
DUT
Note: pulse generator controls timing
Additional PNA setup:
• step sweep
• frequency offset on (0 Hz)
• Auto IF gain = off
安捷倫科技高頻元件量測研討會
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Page 15
Alternate Hardware Setup For Wideband Detection
PNA (20, 40, 50, or 67 GHz) with:
• 014 Configurable test set
• UNL Source attenuators
• 080 Frequency offset mode
External pulse generator
(e.g., 81110A/81111A)
TRIG OUT (rear panel) to pulse gen EXT INPUT
Output 1
10 MHz
Ref
Output 2
Src Out
Cplr Thru
Ref In
Z5623A H81
2-20 GHz RF modulator
DUT
Note: PNA controls timing
Additional PNA setup:
• step sweep
• frequency offset on (0 Hz)
• Auto IF gain = off
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Feb.23, 2006
8
Minimum Pulse Widths for Point-in-Pulse
Measurements Using Wideband Detection
Maximum
IF bandwidth
Minimum
pulse width
IF auto-gain
mode*
PNA models
(20, 40, 50, 67 GHz)
40 kHz
50 us
Yes
PNA-L models
(2-port, 20, 40, 50 GHz)
250 kHz
10 us
Yes
PNA-L models
(2-port, 6, 13.5 GHz; 4-port, 20
GHz)
600 kHz
2 us
No
* Note: for point-in-pulse measurements, the IF auto-gain
mode should be turned off (i.e., set IF gains manually)
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Page 17
Fastest PRI/PRF for Pulse-Pulse Measurements
Using Wideband Detection
Conditions: point sweep; external trigger, CW
sweep; IF autogain=off
Maximum
IF bandwidth
Minimum
PRI
Maximum
PRF
PNA models
(20, 40, 50, 67 GHz)
40 kHz
170 us
5.9 kHz
PNA-L models
(2-port, 20, 40, 50 GHz)
250 kHz
80 us
12.5 kHz
PNA-L models
(2-port, 6, 13.5 GHz; 4-port, 20
GHz)
600 kHz
40 us
25 kHz
PRI
CW pulses
P1
P2
P3
P4
P5
P6
…
安捷倫科技高頻元件量測研討會
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Feb.23, 2006
9
Pulsed S-parameter Measurement Modes
Narrowband/asynchronous acquisition
• Extract central spectral component only; measurement appears CW
• Data acquisition is not synchronized with incoming pulses (pulse trigger not required)
• Sometimes called “high PRF” since normally, PRF >> IF bandwidth
• “Spectral nulling" technique achieves wider bandwidths and faster measurements
• No lower limit to pulse width, but dynamic range is function of duty cycle
IF filter
Time domain
IF filter
D/R degradation = 20*log[duty cycle]
Frequency domain
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 19
Filtered Output Using Spectral Nulling
1
1
0.9
0.9
0.8
0.8
0.7
0.7
X
0.6
0.5
0.6
0.5
0.4
0.4
0.3
0.3
0.2
0.2
0.1
0.1
0
-3
-2
-1
0
1
2
3
0
-3
4
x 10
Pulsed spectrum
Digital filter (with nulls aligned with PRF)
-2
-1
0
Output
1
2
3
4
x 10
• With “custom” filters, number of filter sections (M) can be
chosen to align filter nulls with pulsed spectral components
• With spectral nulling, reject unwanted spectral components with
much higher IF bandwidths compared to using standard IF filters
• Result: faster measurement speeds!
安捷倫科技高頻元件量測研討會
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Feb.23, 2006
10
Typical Hardware Setup
(Narrowband)
External pulse generator
(e.g., 81110A/81111A)
GPIB
Output 1
PNA (20, 40, 50, or 67 GHz) with:
• 014 Configurable test set
• UNL Source attenuators
• 080 Frequency offset mode
• 081 Reference switch
• H11 IF access
• H08 Pulsed-RF measurement capability
• 016 Receiver attenuators (optional)
Pulse 2 drive to PULSE IN B (for point-inpulse measurements)
10 MHz
Ref
Output 2
PNA
Src Out
Cplr Thru
Ref In
Z5623A H81
2-20 GHz RF modulator
DUT
Option H08
VB application/DLL
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Feb.23, 2006
Page 21
Agenda
• Why Measure in Pulsed Mode and the DUTs We Test
– Wafer Test
– Power Amplifiers
– Antenna RCS
– T/R Modules
• Review of Pulsed Measurements
• Wideband synchronous
• Narrowband asynchronous
• Evolution of Pulsed VNAs from Agilent
• 8510, 85108, 85120, CTS Platform to PNA
• Test Sets Available
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Feb.23, 2006
11
85108A
First True pulsed Network Analyser
Still the most widely used system for TR
Module R&D and manufacturing test (>100
off world-wide still in use)
Wholly COTS solution
Affordable
Low cost of ownership
Low risk
Point-on-pulse
Pulse profile, repetitive
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 23
Pulsed PNA is the New Generation 85108A
COTS stand alone hardware
can perform:
– Point-on-pulse
– Pulse-to-Pulse
– Pulse profile
Timing generator can trigger custom
user hardware e.g.
TR Module controller
Very much faster measurement speed
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Feb.23, 2006
12
Comparing the 8510 and PNA
8510 (85108A)
• Dominant mode is wideband detection
• Detection is done BEFORE analog-to-digital conversion
• Analog synchronous detector produces baseband I/Q output
(detector bandwidth = 1.5 MHz)
• Pulse profiling achieved by varying sample point of baseband pulses
• Trade off speed and dynamic range with averaging
PNA
• Dominant mode is narrowband detection
• All processing (filtering and detection) is done digitally
• Widest bandwidth = 35 kHz
• Pulse profiling achieved with analog switches that gate IF (or RF) signals
• Trade off speed and dynamic range with variable IF bandwidths and averaging
PNA-L
• Dominant mode is wideband detection
• All processing (filtering and detection) is done digitally
• Widest bandwidth = 600 kHz
• Trade off speed and dynamic range with variable IF bandwidths and averaging
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 25
Agilent TR Module Test Systems
85120A S10 Family
84000A Family
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Feb.23, 2006
13
Agilent TR Module Test Systems
continued
CTS-I Family
CTS-II Family
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Feb.23, 2006
Page 27
Pulse Summary
Wideband/Synchronous Narrowband/Asynchronous
Advantages
Disadvantages
Constant dynamic range
Lower pulse width limit
Elevated noise floor
8510
PW > 1 us
PNA
PW > 50 us/10 us/2 us**
PNA Options
None required
Average
Point-in-pulse
Measurements
Pulse profile
Pulse-to-pulse
Narrow pulse widths
Dynamic range loss with small
duty cycles
No pulse-to-pulse
Limited* (High PRF Mode)
PW > 20 ns (limited by IF
gate)
H11/H08***
Average
Point-in-pulse
Pulse profile
* No nulling, no point-in-pulse
** PNA/PNA-L 2-port 20, 40, 50 GHz/PNA-L 2-port 6, 13.5, 4-port 20 GHz
*** Option H08 is usually used in conjunction with Option H11. Without H11, the user can perform average pulse, or point-in-pulse
measurements using external RF gates.
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Feb.23, 2006
14
Agenda
• Why Measure in Pulsed Mode and the DUTs We Test
– Wafer Test
– Power Amplifiers
– Antenna RCS
– T/R Modules
• Review of Pulsed Measurements
• Wideband synchronous
• Narrowband asynchronous
• Evolution of Pulsed VNAs from Agilent
• 8510, 85108, 85120, CTS Platform to PNA
• Test Sets Available
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 29
Z5623A Hxx RF Modulators
• Z5623A H81 (2-20 GHz)
• Expected to be most common configuration ($43K)
• Contains pin switch, amplifier, directional coupler
• Use jumpers to bypass internal amp or use high-power external amp
• Other quoted test sets:
• Z5623A H83 1-20 GHz
Bidirectional (two pin switches) $80K
• Z5623A H84 20-40 GHz
Bidirectional (two pin switches) $105K
• Z5623A H85 20-40 GHz
Unidirectional, no amplifier $35K
• Z5623A H86 2-40 GHz
Unidirectional, dual band (incl. band switch) $65K
• Customization via Agilent’s “Special Handling” group:
• Different frequency ranges
• No amplifier or higher power amplifiers
• High power components
Z5623A H81
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Feb.23, 2006
15
PNA Pulsed-RF Configuration Example 1
• User-supplied external modulator
• Average pulse measurements
81110A family pulse generator
Advantage: simplest – use
any standard PNA with 014
GPIB
Pulse out
10MHz
Ref
Src Out
Power Supply
Cplr Thru
RF in
Com
+25 -25
RF out
TTL
DC(+)
DC(-)
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Page 31
PNA Pulsed-RF Configuration Example 2
• Modulator test set, internal receiver gates
• Point-in-pulse, pulse profile of S21 and S11
81110A family pulse generators
GPIB
One output channel
drives RF modulator
Trigger
Advantages:
• easily make point-in-pulse and
pulse profile measurements
• more sophisticated RF
modulator boosts port power
10 MHz Ref
Src Out
PNA
Three output channels drive internal receiver
gates A, B, and R1 for point-in-pulse and
pulse-profile measurements
Ref In
DUT
Z5623A H81 pulsed-RF test set
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Feb.23, 2006
16
PNA Pulsed-RF Configuration Example 3:
Full Forward/Reverse S-Parameter Configuration
81110A family pulse generators
GPIB
One output channel
drives RF modulator
Trigger
10 MHz Ref
Three output channels drive internal
receiver gates A, B, and R1/R2 for pointin-pulse and pulse-profile measurements
PNA
DUT
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Feb.23, 2006
PNA Pulsed-RF Configuration Example 3:
Full Forward/Reverse S-Parameter Configuration a different view
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Feb.23, 2006
17
Z5623A H83 – H84 Test Set Control Macro
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Feb.23, 2006
Page 35
Z5623A H83 RF Modulator 1-20 GHz
AMP 1
TERM
1
2
1
3
4
SW2
4
1
AMP 2
TERM
AMP 1
TERM
AMP 2
TERM
2
2
3
3
1
2
4
SW5
4
3
SW6
SW3
1
2
2
SW1
4
16 dB
SW 7
Source Filter
IN
IN
Pulse
Out
6$
1
SW4
3
CPLR1
AMP
OUT
Pulse 1
IN
AMP
IN
Source CPLR
OUT
IN
CPLR
THRU
60 dB
ATN2
ATN1
10/20/30
10/20/30
RCVR
R1 IN
3
60 dB
4
16 dB
SW8
CPLR2
RCVR
R2 IN
CPLR
THRU
CPLR Source AMP
OUT
IN
IN
AMP
OUT
Pulse 2
IN
Pulse
Out
Filter Source
IN
IN
Z5623AH83 PULSE TEST SET, 1 GHz to 20 GHz
RCVR R1 OUT
AMP IN
SOURCE OUT
FILTER IN
FILTER IN
PORT STATUS "GPIB ONLY"
SOURCE OUT
AMP IN
RCVR R2 OUT
SOURCE IN
SOURCE IN
CPLR THRU
AMP OUT
CPLR IN
AVOID STATIC DISCHARGE
PULSE OUT
PULSE OUT
PULSE 1
IN
CPLR IN
AMP OUT
CPLR THRU
PULSE 2
IN
LINE
00
TTL 0,5 VDC, 10K OHM
1
CAUTION: SEE MANUAL FOR MAXiMUM POWER RATINGS
CAUTION: SEE MANUAL FOR MAXiMUM POWER RATINGS
安捷倫科技高頻元件量測研討會
Page 36
Feb.23, 2006
18
PNA Pulsed-RF Configuration Example 4
• Modulator test set, external receiver gate
• Point-in-pulse, pulse profile
81110A family pulse generator
GPIB
Advantage: gate widths < 20 ns
Pulse1 out
10 MHz
Ref
Pulse2 out
Src Out
External switch in receiver B
loop for external gating
Ref In
TTL
Power Supply
Com
+25 -25
DC(+)
DC(-)
Z5623A H81 pulsed-RF test set
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 37
PNA Pulsed-RF Configuration Example 5
• User-supplied pulsed bias to amplifier, internal IF gate
• Point-in-pulse, pulse profile
81110A family pulse generator
GPIB
Pulse1 out
Advantage: pulsed bias to
amplifier (with CW input)
10 MHz
Ref
Pulse2 drive to internal receiver
gates (for point-in-pulse)
Power Supply
CW
Pulsed-RF
Com
+25 -25
安捷倫科技高頻元件量測研討會
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Feb.23, 2006
19
PNA Pulsed-RF Configuration Example 6
• Customer-supplied pulsed bias and pulsed RF, internal IF gate
• Point-in-pulse, pulse profile
81110A family pulse generators
GPIB
Trigger
Pulse1 out
Advantage: both pulsed
bias and pulsed-RF
stimulus
10 MHz Ref
Src Out
Pulse3 drive to internal
receiver gate B (for point-inpulse)
Cplr Thru
RF in
Power Supply
RF out
Pulse2 out
TTL
DC(-)
Com
+25 -25
DC(+)
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 39
Summary
• Testing with pulsed-RF is very important for radar, EW, and wireless comms systems
• Narrowband detection:
• Spectral nulling technique improves measurement speed
• For radar and wireless comms applications, offers superior dynamic range/speed
• No lower limit to pulse widths
0
-10
-20
-30
S21 (dB)
• Although the PNA uses different hardware and detection techniques
than the 8510, measurement results are essentially the same!
-40
PNA
-50
8510
-60
-70
• PNA also offers numerous platform benefits:
-80
-90
12.74
12.49
12.24
11.99
9.99
11.74
11.49
9.74
11.24
10.99
9.49
9.24
10.74
10.49
8.99
8.74
10.24
8.49
8.24
7.99
7.74
-100
Frequency (GHz )
• Measurement flexibility (32 channels, 64 traces, 16 windows, 16,001 points)
• Connectivity (LAN, USB, …)
• Automation (open Windows®, COM, SCPI …)
• Ease of use (built-in HELP, Cal Wizard, ECal …)
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Feb.23, 2006
20
Resources
• www.agilent.com/find/pulsedrf
安捷倫科技高頻元件量測研討會
Page 41
Feb.23, 2006
Multiport - PNA based solutions
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Feb.23, 2006
21
Agenda
• Target Applications
• PNA Multiport Test Solutions
• Specials vs. Standard product
• Customer data required for new multiport specials
• Further Information
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 43
Target Applications
• Front End Module (FEM)
• Cellular FEM (see next slide)
• WLAN FEM (Base Band not included, 2.4G & 5G dual band)
• Filter array (see next slide)
– Multiple filter in single package
– Duplexer/Coupler array (see next slide)
– Multiple Duplexer/Coupler in single package
• High Frequency Multiport devices
– Triplexer, power splitter, multiport coupler etc.
– RF module, RF switch IC
•
High power device testing
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Feb.23, 2006
22
Cellular FEM #1 (Dual band, 1xEV,GPS)
Diversity Rx
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Page 45
Feb.23, 2006
Cellular FEM #2 (Quad band, UMTS,GSM)
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Feb.23, 2006
23
WLAN FEM（2.4G・５G dual band）
2.4 GHz / 5 GHz WLAN FEM
BPF
2.4 GHz Rx
5 GHz Rx
LNA
2.4 GHz Tx
Diversity SW
5 GHz Tx
Diplexer
PA
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 47
Multiport & High Power Testing Devices
• Typical High Frequency devices
– Switches, Couplers, Power Splitter/Divider and etc..
– Filter/Coupler array
• Multiport and high power
– PA Cellular/WLAN FEM with PA
– RF switch IC ( Switch filters)
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Page 48
Feb.23, 2006
24
Key Measurement Requirements
Cellular FEM without PA
• IL, RL for each path up 12.75GHz
• Isolation
– Frequency > 3x Carrier
– Signal level 0dBm or –10dBm
• Switch distortion
– Frequency up to 12.75GHz in R&D
– Signal Level up +36dBm
UMTS850
UMTS1900
GSM Tx
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 49
Key Measurement Requirements
BPF
WLAN FEM with PA
–
–
–
–
Gain, 1dB Compression, Pout,PAE
RL
Isolation
Harmonics distortion
• Frequency Cellular > 3x Carrier Frequency
• Frequency（WLAN）: 17.4GHz
• Power : 25dBm(WLAN)
36dBm(GSM/Mobile)
2.4 GHz Rx
5 GHz Rx
LNA
2.4 GHz Tx
Diversity
SW
5 GHz Tx
Diplexer
PA
安捷倫科技高頻元件量測研討會
Page 50
Feb.23, 2006
25
Agenda
• Target Applications
• PNA Multiport Test Solutions
• Specials vs. Standard product
• Customer data required for new multiport specials
• Further Information
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Feb.23, 2006
Page 51
New PNA Rev 6.0 Firmware (Available December 2005)
Sets GP-IB address, or Test Set IO address
Select Testset Control
File base on test set
New Functionality:
• External test set control
• “Any 2-port” capability
Set physical ports
in ANY order
Set control lines (if test set has them)
on a per channel basis
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Page 52
Feb.23, 2006
26
PNA/PNA-L Option 550
Measure
SParameter
Balanced
Receivers
Applications
• New firmware option 550 for the PNA/PNA-L adds full 4port capability and differential measurements to a two port
network analyzer
• CPL Dec 1, 2005
• $7k RFP
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 53
Variety Summary
Switching
Extension
Hybrid
Special Multiport Test Varieties
SCMM
Signal Conditioning
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Page 54
Feb.23, 2006
27
Test Sets Overview
Platform
Description
Benefits
87050A-Hxx/Kxx
Switching test sets.
Lower cost
No coupler inside test set
N4419/20/21B/H67 Extension test sets
4-port differential to 67Ghz
Coupler on each port
Z5623A-Hxx/Kxx
Depend on the particular option
Meets customer specific req’ts
Mixing of Switching and Extension
test sets
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 55
Agilent’s Promoted Multiport Products & Specials
安捷倫科技高頻元件量測研討會
Page 56
Feb.23, 2006
28
Agilent PNA > 4-port Products offering
Freq.
Coverage:
PNA Based Unit & Ext. Test set Total Test Ports
300 KHz – 20 GHz
N5230A opt. 245 & Z5623AK64
6
300 KHz – 20 GHz
N5230A opt. 245 & Z5623AK66
14
300 KHz – 20 GHz
N5230A opt. 245 & Z5623AKxx
20
.010 – 40GHz
E8363/4B or E8361A & 87050A-K62*
6
* 2-port cal only
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Feb.23, 2006
Multiport Specials – Variety
• Extension Test Sets
– Extension test sets provide signal paths from the network analyzer access
ports to the test set. All test ports to the DUT are Coupler or Bridge base.
Provides greater sensitivity.
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Feb.23, 2006
29
Multiport Specials – Variety
• Hybrid Test Sets
– Hybrid test sets are a combination of the switching and extension types.
Test ports can be either switched or coupler bridge based.
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Feb.23, 2006
Page 59
Multiport Specials – Variety
• Switching Test Sets
GPIB
J1
– Switching test sets provide signal paths from the network analyzer test ports
to the DUT.
A3 Driver
Daughter
Board
A2 Controller
Interface Mother
Board
A1 Power
Supply
J74-J79
J50-J55
A4 LCD
Controller
Board
C
J53
2
20058
20062
C
S50
C
S52
1
1
J54
20061
J52
J50
Z5623-60013
2
20060
C
20059
20051
S54
2 1
J51
S53
1
J55
C
2
C
2 1
S51
20054
20055
20056
S55
2
20052
C2
C1
1
20053
C3
20057
C
C4
C6
C5
Z5623-60012
1 2 34 5 67 8 9
Open / Collector
Lines
Reflection
R1
R2
R3
A
T1
T2/3
Transmission
GPIB
J1
(Type-N)
Z5623A Option H46
A3 Driver
Daughter
Board
A2 Controller
Interface Mother
Board
A1
Power
Supply
J14
J15
J10-J15
87050-60055
Sw15
Sw14
w3
2
w4
3
w23
w2
Sw12
2
3
5
6 w14
Sw11
2
3
w15
5
6
Sw10
2
3
5
w10
w17
w9
w19
w16
1
2 1
2 1
w11
2 1
3
5
6
w13
w12
2 1
2 1
2
6
w18
w8
w7
w6
3
J10
J13
Sw13
J11
w5
2
J12
w22
J74-J79
J10-J15,J50-J57
A4 LCD
Controller
Board
w20
2 1
2 1
2
w21
J50-J57 87050-60053
Sw50
C
w1
Sw51
C
w1
Sw52
C
w1
Sw53
C
w1
Sw54 C
w1
Sw55
C
w1
Sw56
C
w1
Sw57
C
w1
Z5623-60013
1 2 3 4 5 6 7 8 9
Open / Collector
Lines
Port 8
Port 7
Port 6
Port 5
Port 4
Port 3
Port 2
Port 1
Reflection
(Type-N)
Transmission
(Type-N)
(Type-N)
Z5623A Option H48
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Feb.23, 2006
30
Multiport Specials – Variety
• SCMM
– Single connection multiple measurement test sets allow the user to make
different types of measurements with out having to disconnect there DUT
form the test set.
Driver Daughter Board
Controller Interface Mother Board
Power Supply
Display LCD Board
SW 12
5
SW 10
2
6
5
2
3
4
6
SW 14
SW 15
5
3
6
4
1
1
3
SW 11
1
1
5
2
21
2 1
6
4
1
3
2
21
5
2 1
6
4
21
1
6
4
3
5
2
2 1
21
6
2 1
4
21
Aux1
3
SW 13
1
3
2
6
5
2
3
2
SW 61
SW 50
A i/p 1-4
5
SW 17
SW 16
2 1
21
2
1
2
3
4
5
10
9
6
7
8
Test Ports
11
Aux2
12
B i/p 4-1
Agilent 8720D Option K22
Multi-Function Switch Matrix
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Feb.23, 2006
Page 61
Multiport Specials – Variety
• Signal Conditioning
– Test sets that require couplers, attenuators, amplifiers, filters and mixers that may or
may not directly connect to the DUT.
A
Normal Mode
P1
R1
Z5623A Opt H61
IF
DUT MIXER
isolator
LO D UT
PORT
LO
RF
OU T
Up/Down
Filter/Mixer IN
Source OUT PNA
Coupler IN
R2
Source IN
PNA
P2
Coupler
OUT
RF
IF
B OUT
M1
B
LO
B IN
B IN
IN
LO EXTOUT
B OUT
Filter/Mixer OU T
IN
LO IN
PORT
Source
安捷倫科技高頻元件量測研討會
Page 62
Feb.23, 2006
31
Agenda
• Target Applications
• PNA Multiport Test Solutions
• Specials vs. Standard product
• Customer data required for new multiport specials
• Further Information
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 63
Multiport Specials – Why Specials?
•
Offer solutions for applications which can not be addressed with existing or
standard products
•
Increase sales of CTD standard products
•
Leverage standard platforms & OF capabilities to develop product extensions
•
•
Fastest development-shipment time for new opportunities & competitive
battles
Helps to identify market needs and trends of specific applications
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Feb.23, 2006
32
Multiport Specials –Specials vs. Standard product
Multiport Special
–
Custom
–
Does not follow the NPI PLC process
–
Fast development to shipment
–
Typical supplemental performance
–
Provide just enough performance
•
Functional Certificate
•
Return to Factory support
Standard Product
–
Follows the NPI PLC process
–
Specifications with uncertainties.
–
Box and System level performance
•
Calibration Certificate
•
Return to Bench support
•
Verification test
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 65
Multiport Specials –Test Set vs. System Performance
Multiport Test Set
•
Typical supplemental performance
specifications of the test set.
•
Measures the Insertion Loss, Port Match, and
path Isolation between ports.
•
Provide just enough performance
•
Functional Certificate
System Level (PNA and Test Set)
•
Raw or Corrected system performance is not
provided.
•
Customers must take into consideration the
performance of the PNA, Test Set, cabling,
fixtures, and other peripherals to characterize
their system level performance.
•
Once established that system level
performance meets the application
requirements. The customer can now define
the PNA Multiport Test Solution and calibrate
the system.
•
The customer can define a system verification
method by using either a golden standard or
by establishing an additional type of
verification process.
安捷倫科技高頻元件量測研討會
Page 66
Feb.23, 2006
33
Agenda
• Target Applications
• PNA Multiport Test Solutions
• Specials vs. Standard product
• Customer data required for new multiport specials
• Further Information
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Feb.23, 2006
Page 67
Multiport Qualification
Form
• Most >4-port applications
unique
• Define customer needs upfront
• Reduces time to quote and
minimizes error
FE/AE fill out with customer
and email back to CTD/Say
Phommakesone
Qualification Form for Multiport Device
Device Description and Specifications
Describe the device and application (please attach block diagram of device)
_______________________________________________________________________________
_______________________________________________________________________________
_______________________________________________________________________________
_______________________________________________________________________________
_______________________________________________________________________________
_____________________________________
Number of device ports: ______
Port impedance: ___ 50 ohms
___ 75 ohms
Connector type(s):__ Type N __SMA __ 3.5 mm __ 2.4 mm __ 1.85mm __ other
(if other, please explain) ___________________________________________________
Specify the frequency range of the device: _____________________________________
Specify the frequency range required for the device application: ____________________
Specify required test port power: _____________________________________________
Specify Insertion loss / gain of the device paths: _________________________________
_______________________________________________________________________________
_______________________________________________________________________________
_______________________________________________________________________________
___________________________________________________
Specify Isolation of other device ports: ________________________________________
_______________________________________________________________________________
_______________________________________________________________________________
_______________________________________________________________________________
___________________________________________________
Specify Port matches of the device: ___________________________________________
_______________________________________________________________________________
_______________________________________________________________________________
_______________________________________________________________________________
___________________________________________________
Specify desired measurement uncertainty: _____________________________________
_______________________________________________________________________________
_______________________________________________________________________________
_______________________________________________________________________________
___________________________________________________
Specify other measurement requirements: ______________________________________
_______________________________________________________________________________
_______________________________________________________________________________
_______________________________________________________________________________
___________________________________________________
If desired test system is complex (e.g. includes other analyzers, additional sources, etc), include
block diagram of overall test setup.
Page 1 of 4
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Feb.23, 2006
34
Agenda
• Target Applications
• PNA Multiport Test Solutions
• Specials vs. Standard product
• Customer data required for new multiport specials
• Further Information
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 69
Information Sources
Freq.
Coverage:
300 KHz – 20 GHz
300 KHz – 20 GHz
.45 – 20/40/50 GHz
.45 – 67.0 GHz
Ext. Test Set & #Ports
Z5623AK64 2-port
Z5623AK66 10-port
N4419/20/21B 2-port
N4421BH67 2-port
¾ http://mktwww.soco.agilent.com/Product-Info/Network-Analyzers/PNA/multiport.htm
¾ http://www.agilent.con/find/multiport
¾ http://www.agilent.con/find/PNA
¾ Agilent Test Solution for Multiport and Balanced Devices
5988-2461EN
¾Agilent PNA Series Configuration Guide
5988-7989EN
安捷倫科技高頻元件量測研討會
Page 70
Feb.23, 2006
35
Summary
• PNA multiport test solutions provide:
– Direct test set control made easy with PNA Firmware Rev 6.0s
– Flexible test port configuration that enables customer to perform variety kinds
of multiport device measurements
– Advanced measurement capabilities, such as the APE, result in accurate
measurements
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 71
Complete Characterization
of Backplane Differential
Channels
February 23, 2006
presented by:
Ming-Fan, Tsai
Agilent Technologies Ltd.
© Copyright 2003 Agilent Technologies, Inc.
Page 72
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Feb.23, 2006
36
Overview
Backplanes
Measurement set up
Single-ended
Differential
Frequency & time domain
Eye diagrams
Model extraction
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Feb.23, 2006
Page 73
All Next Generation High Speed Serial Links will use
Differential Signaling
Serial ATA
1.25 Gbps
Hypertransport
1.6 Gbps
AGP8x
2.1 Gbps
Infiniband
2.5 Gbps
PCI Express
2.5 Gbps
Serial ATA II
2.5 Gbps
XAUI
3.125 Gbps
PCI Express II
5.0 Gbps
OC-192
9.953 Gbps
10 GbE
10 Gbps
OC-768
39.81 Gbps
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Page 74
Feb.23, 2006
37
Important Physical Layer Properties of Differential
Channels
Differential impedance profile (diff return loss)
Transmitted differential signal quality (diff insertion loss)
Conversion of differential to common signal
Where conversion of differential to common signal occurs
Eye diagrams (1 Gbps Æ 10 Gbps)
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 75
Measurement System for Complete Physical Layer
Characterization
GigaTest Labs Probe Station
Device Under Test
(backplane)
Agilent
Physical
Layer Test
System
安捷倫科技高頻元件量測研討會
Page 76
Feb.23, 2006
38
Differential VNA/TDR Applied to All Passive, Linear Components and
Interconnects
z When an external precision signal is required
z Applies to any passive interconnect or component
z
z
z
z
z
z
Backplanes
Discretes
Packages
Connectors
PCB structures
Material properties
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 77
A Precision Instrument is Not Enough!
Component to
characterize
?
Instrument
?
Valuable
information
安捷倫科技高頻元件量測研討會
Page 78
Feb.23, 2006
39
Complete Characterization System Solution
DUT +
microprobes
GigaTest Probe
Station
Physical Layer Test System:
VNA + PLTS software
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 79
Microprobes Allow Precision Probing of Structures
with Minimal Artifacts
Close up
Pitch ~ 50µ – 1000µ
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Page 80
Feb.23, 2006
40
4 Port Differential VNA Techniques Applied to Tyco Electronics HM-Zd
Legacy Backplane System
Total channel lengths: 26 inches, 40 inches
2 inches,
daughter card
2 inches,
daughter card
16 inches, 30
inches backplane
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 81
4 Port Single-ended S-parameters
1
3
2
(and their return paths!)
4
Response
Stimulus
S11
S21
S31
S 41
S12
S 22
S 32
S 42
S13
S 23
S33
S 43
S14
S 24
S 34
S 44
Sout,in =
Pout
Pin
Interpreting single ended measurements:
S11 :
return loss, single ended
S21= S12 : insertion loss, single ended
S31= S13 : near end cross talk
S41= S14 : far end cross talk
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Page 82
Feb.23, 2006
41
TDR and VNA Techniques
t
TDR
t
S11
Incident wave
ed
lect
Ref
e
wa v
Incident wave
w
ed
lect
f
e
R
Transmitted wave
TDT
Transmitted wave
S21
DUT
DUT
ave
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 83
4 Port, Single-ended S-parameters: Tyco Backplane
Example
Interpreting single ended measurements:
S11 : return loss, single ended
S21= S12 : insertion loss, single ended
S31= S13 : near end cross talk
S41= S14 : far end cross talk
安捷倫科技高頻元件量測研討會
Page 84
Feb.23, 2006
42
Single-ended Return Loss and Insertion Loss: 26 inch
channel length
Input Single-ended Return Loss S11
Input Single-ended Insertion Loss S21
0 dB
-10 dB
-20 dB
-30 dB
2 GHz/div
-40 dB
-50 dB
2 GHz/div
安捷倫科技高頻元件量測研討會
Page 85
Feb.23, 2006
Microprobing on SMA Pads
Added ground pad
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Page 86
Feb.23, 2006
43
Bandwidth Limit of SMA vs. Microprobes
0 dB
S11- return loss
Measured with SMA connector
-10 dB
Measured with microprobe
-20 dB
Conclusions:
-30 dB
1.
Microprobes can be higher
bandwidth (important > 14 GHz)
2.
Identical performance < 10 GHz
for these SMA connectors
-40 dB
-50 dB
20 GHz full scale
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 87
Design for Test (DFT):
Optimized Pad Design for Micro-probing
Any signal via can be used as a probe point
Use a “copper fill” around the signal via with immediate connection to all adjacent ground vias
Every board should be designed with pads for optional microprobing- no impact on function
Ground vias shorted to the copper fill
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Page 88
Feb.23, 2006
44
Microprobing vs. SMA Connectors
Strengths
SMA
Connectors
• No additional fixturing to VNA
required
• Easy to use
• Mechanically robust
Micro Probes
Weaknesses
• Can’t use on functional boards- loads
the line too much
• Limited density
• Can use on any signal lines
• Probe station required
• No constraints on how many or where
• Probes can be damaged
• Can be used on functional board
• Important for active probing
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Feb.23, 2006
Page 89
Two Important Transformations Facilitate First Order
Analysis
From single-ended S-parameters to differential S-parameters
From frequency domain to time domain
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Page 90
Feb.23, 2006
45
4 Port Balanced Measurements:
Frequency and Time Domain
Differential
Single-ended
1
3
Diff pair
port 1
2
(and their return paths!)
Diff pair
port 2
(and their return paths!)
4
Stimulus
Differential Signal
Response
Stimulus
S11
S21
S31
S 41
S12
S 22
S 32
S 42
S13
S 23
S33
S 43
S14
S 24
S 34
S 44
Common Signal
Port 1
Port 2
Port 1
Port 2
SDD11
SDD21
SCD11
SCD21
SDD12
SDD22
SCD12
SCD22
SDC11
SDC21
SCC11
SCC21
SDC12
SDC22
SCC12
SCC22
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Feb.23, 2006
Page 91
The Meaning of the Quadrants
Differential in, differential out:
Behavior of differential signals
Stimulus
Differential Signal
Port 1
SDD11
SDD 21
SCD11
SCD 21
Differential in, common out:
Behavior of mode conversion
Common in, differential out:
Behavior of mode conversion
Port 2
SDD12
SDD 22
SCD12
S CD 22
Common Signal
Port 1
SDC11
SDC 21
SCC11
SCC 21
Port 2
SDC12
SDC 22
S CC12
S CC 22
Common in, common out:
Behavior of common signals
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Page 92
Feb.23, 2006
46
Important Performance Terms
Diff pair
port 1
Diff pair
port 2
(and their return paths!)
Stimulus
Differential Signal
Port 1
SDD11
SDD21
SCD11
SCD21
Port 2
SDD12
SDD22
SCD12
S CD22
SDD11
differential impedance profile
SDD21
Signal quality of differential signal,
time delay of differential signal
SCD21
Conversion of differential signal to
common signal in transmission
(emissions)
SDC21
Conversion of common signal to
differential signal in transmission
(susceptibility)
SCC11
Common impedance profile
SCC21
Signal quality of the common signal,
time delay of common signal
Common Signal
Port 1
SDC11
SDC21
SCC11
SCC21
Port 2
SDC12
SDC22
SCC12
S CC22
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Feb.23, 2006
Page 93
Single-ended to Differential S-parameters
Single-ended S-parameters
Differential S-parameters
Note: One measurement with Physical Layer Test System yields above information
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Feb.23, 2006
47
Differential Return Loss & Reflection Coefficient
0 dB--
Frequency Domain SDD11
Time Domain TDD11
t=0
1 nsec/div
120 Ω−
100 Ω−
80 Ω−
20 GHz full scale
-50 dB-Conclusions
-Connectors create large impedance discontinuity
-Daughter card differential impedance is 110 Ω
-Backplane differential impedance is 102 Ω
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Feb.23, 2006
Page 95
Single-ended and Differential TDR
Single-ended TDR
(NOT odd mode impedance)
t=0
60 Ω
50 Ω
inside connector
Differential TDR
Coupling brings differential
impedance down
120 Ω
100 Ω
Backplane trace
Via fields on either
side of connector
1 nsec/div
1 nsec/div
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Page 96
Feb.23, 2006
48
Important Design Feedback
Designing for 50 Ohm single ended line is not the same as a 100 Ohm differential
line.
Characterizing with single ended TDR will not measure differential impedance.
Design the daughter cards with as much care as the backplane.
Most discontinuities from connectors are not from the connectors- they are from
the via fields.
Optimizing connectors is all about optimizing the circuit board via field layout.
Design for test: add copper fills for microprobing
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Feb.23, 2006
Page 97
Differential TDR from Both Ends
Port 1
Port 2
TDD11
TDD22
1 nsec/div
ored 1 nsec/div
mirr
100 Ω
similar connector,
reduced bandwidth
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Page 98
Feb.23, 2006
49
Differential Transmitted Signal SDD21
Frequency Domain SDD21
0 dB-Conclusions:
-10 dB--
• Measurement system bandwidth >
40 GHz
-20 dB--
26 inch
backplane trace
40 inch
backplane trace
• 26 inch traces have a 15 dB BW ~
3.5 GHz
• 40 inch traces have a 15 dB BW ~ 2
GHz
10 GHz full scale
-100 dB--
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Feb.23, 2006
Page 99
Differential Transmitted Signal:
Time Domain TDD21
40 GHz bandwidth,
~20 psec input rise
time
Total of
26 inches
Total of
40 inches
1 nsec/div
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Page 100
Feb.23, 2006
50
Eye Diagrams: 26 inch Channel
1 Gbps, 200 psec/div
2.5 Gbps, 80 psec/div
5 Gbps, 40 psec/div
7.5 Gbps, 27 psec/div
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Feb.23, 2006
Page 101
Non-ideal Differential Signaling: Mode Conversion
Anything that affects one line and not the other will convert differential
signal into common signal
Drive is asymmetrical between channels
• skew
• output impedance and launched voltage
Signal environment in interconnect is asymmetrical
• different characteristic impedance in each leg
• length is different
• loading from connectors, jags, pads, ground planes
Real problem of common signal is EMI from unshielded twisted pair
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Page 102
Feb.23, 2006
51
Differential Signal Input Æ Common Signal Output
26 inch channel length
TDD21
~7% of differential
signal amplitude
converted to common
signal
TCD21, 20x scale
May be a problem if it
were on CAT5 twisted
pair
1 nsec/div
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Feb.23, 2006
Page 103
Where did the Conversion Happen?
TDD11
TCD11
x10 scale increase
Conclusion: most mode
conversion happens in the
via fields!
asymmetry of
backplane traces
Via field on
daughter card
Via field on
mother board
安捷倫科技高頻元件量測研討會
Page 104
Feb.23, 2006
52
Measurement and Model Extraction
TIME DOMAIN SIMULATORS
(HSPICE®, SPECTRAQUEST®, SMARTSPICE)
BEHAVRIOAL
MODELS
S-PARAMETERS
TOPOLOGICAL
MODELS
FREQUENCY-DOMAIN SIMULATORS
(ADS, ETC)
TDA SYSTEMS ICONNECT MEASUREXTRACTOR
Note
TIME DOMAIN
S-PARAMETERS
AGILENT TECHNOLOGIES
N1900-SERIES
PHYSICAL LAYER TEST SYSTEM
TDR or VNA
AGILENT TECHNOLOGIES
PNA SERIES
VECTOR NETWORK ANALYZERS
AGILENT TECHNOLOGIES
86100-SERIES
TIME DOMAIN REFLECTOMETERS
See Note
DEVICE UNDER TEST
DEVICE UNDER TEST
Page 105
Note: TDR is NEW measurement engine for PLTS v1.2
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Feb.23, 2006
Modeling Example with PLTS & IConnect
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Page 106
Feb.23, 2006
53
Conclusions
Differential pairs will proliferate
Differential characterization requires
•
•
•
•
microprobes
probe station
4 port VNA
Analysis software
Absolutely everything you ever wanted to know about the performance of
a differential pair is contained in the 4 port balanced S parametersdisplayed in either the frequency or time domain
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 107
Technical Information Resources
Visit www.gigatest.com for..
•
•
•
•
More than 100 application notes on high speed design
Schedule of signal integrity short courses
High-bandwidth measurement and modeling services
Complete signal integrity characterization systems
• Visit www.agilent.com/find/plts for..
•
•
•
•
•
Physical Layer Test System data sheet & user’s guide
Signal integrity solutions brochure
XAUI backplane design case study
PCI Express tools brochure
N1900 series product flyer
Contact Gigatest Labs for more information....www.gigatest.com/about/ReqForInfo.jsp
安捷倫科技高頻元件量測研討會
Page 108
Feb.23, 2006
54
FREE Agilent Email Updates
Subscribe Today!
Choose the information YOU want.
Change your preferences or unsubscribe anytime.
Keep up to date on:
Services and Support Information
Events and Announcement
- Firmware updates
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- eSeminars
Visit: www.agilent.com/find/eseminar-email
安捷倫科技高頻元件量測研討會
Page 109
Feb.23, 2006
55
Enhanced TDR Channel
Characterization Capabilities
Agilent Technologies Ltd.
Brian Chi
Senior Project Manager
Agilent Technologies
[email protected]
03-4959054
Feb, 23, 2006
安捷倫科技高頻元件量測研討會
Page 1
Feb.23, 2006
Impedance in Time Domain
Z Impedance?
High Speed Digital Design
安捷倫科技高頻元件量測研討會
Page 2
Feb.23, 2006
1
Impedance in Time Domain
Short Termination
PROBE
R
0Ω
E
What do you expect to see at the probe before,
during, and after you close the switch?
E
E/2
0
Time
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 3
Impedance in Time Domain
Open Termination
PROBE
R
E
∞Ω
What do you expect to see at the probe before,
during, and after you close the switch?
E
E/2
0
Time
安捷倫科技高頻元件量測研討會
Page 4
Feb.23, 2006
2
Impedance in Time Domain
Perfect Termination
PROBE
R
R
E
What do you expect to see at the probe before,
during, and after you close the switch?
E
E/2
0
Time
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 5
Impedance in Time Domain
Impedance Mismatch Terms
Z L = Z0
1+ ρ
1− ρ
ρ=
(∆V)
E
Vr
E/2
0
Vr
Vi
Vi
Time
Impedance Calculated from
Source Impedance and
Reflection Coefficient.
Reflection Coefficient:
How much was reflected?
∞Ω
ZL=Z0 Ω
Vr
Zero Ω
安捷倫科技高頻元件量測研討會
Page 6
Feb.23, 2006
3
Impedance in Time Domain
Mismatch Exercise
PROBE
Z0 = 50 Ω
Vi = 200 mV
R
Vr = 66.6 mV
?
E
ZL = ?
What is the value of ΖL?
Vr(ΔV)
Vi
200 mVolts
66.6 mV
200 mV
0 Volts
Time
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 7
Step Reflection Testing
OSCILLOSCOPE
Ei
Er
ZL
TRANSMISSION SYSTEM UNDER TEST
Er
STEP GENERATOR
Typical Step: 200 mV, 25 kHz square wave
with 35 ps rise time
Ei
T
Oscilloscope display
when Er ≠ 0
安捷倫科技高頻元件量測研討會
Page 8
Feb.23, 2006
4
Mismatches Location
Distance Formula
Where
νp = velocity of
propagation
T
D =υp ⋅
2
T
= transit time
from monitoring point
to the mismatch and
back
Why is the transit time
divided by two?
ZL
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 9
Simple Loads Reflection Analyzing
The shape of the reflected
wave reveals the nature and
magnitude of the mismatch
What is the nature of each
of the loads shown at the
right?
a) SHORT
b) OPEN
c) IMPEDANCE > Z0
d) IMPEDANCE < Z0
Z=?
Z L − Z0
= +1
ZL + Z0
Z=?
Z L − Z0
= −1
Z L + Z0
安捷倫科技高頻元件量測研討會
Page 10
Feb.23, 2006
5
Simple Loads Reflection Analyzing
The shape of the reflected
wave reveals the nature
and magnitude of the
mismatch
Z=?
0<
ZL − Z0
< +1
ZL + Z0
What is the nature of
each of the loads shown
at the right?
a) SHORT
b) OPEN
c) IMPEDANCE > Z0
d) IMPEDANCE < Z0
Z=?
−1<
ZL − Z0
<0
ZL + Z0
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 11
Complex Loads Reflection Analyzing
The shape of the reflected
wave reveals the nature
and magnitude of the
reflection
Complex load impedances
are also identified
Series R-L
Shunt R-L
R
L
L
R
安捷倫科技高頻元件量測研討會
Page 12
Feb.23, 2006
6
Complex Loads Reflection Analyzing
The shape of the reflected
wave reveals the nature
and magnitude of the
reflection
Complex load impedances
are also identified
Series R-C
Shunt R-C
R
C
R
C
安捷倫科技高頻元件量測研討會
Page 13
Feb.23, 2006
Analyzing Reflections of Complex Loads
安捷倫科技高頻元件量測研討會
Page 14
Feb.23, 2006
7
Analyzing Reflections of Complex Loads
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 15
Z DUT = Z 0
Vincident + Vreflected
Vmeasured
= Z0
Vincident − Vreflected
2 • Vincident − Vmeasured
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Feb.23, 2006
8
Required Parameters by Standard – S
Standard
Max Freq,
Impedance
Return Loss
Loss
parameters
GHz
PCI Express Gen 2
PCI Express
PCI-X
Serial Attached SCSI
IPC
Fully Buffered DIMM
IEEE 802.3ae
Infiniband
Serial ATA
EIA-364-90
EIA-108
HDMI
DVI
Firewire
USB 2.0
RapidIO
5
1.25
7.5
N/A
2.4
?
6.3
4.5
N/A
N/A
4.1
4.1
8
1.3
X
X
X
X
X
S11
S21
X
X
X
X
Crosstalk
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
Add: FSB, 1 GbE
8
IPC was Institute of Interconnecting and Packaging Electronic Circuits
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Feb.23, 2006
Introducing 86100C option 202
- TDR S-Parameters capability
S-parameter display
TDR -> S11 (Return loss)
TDT -> S21 (Insertion loss)
Single-end & Differential
No external PC needed
Run on only 86100”C”
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Feb.23, 2006
9
Introducing 86100C option 202
- Corrected Impedance Profile - Peeling
Peeling mitigate
measurement errors
caused by multiple
reflections at each
impedance
mismatch.
Blue: raw data
Yellow : corrected
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Page 19
Matching source Z0 to transmission line ZL
WHAT IF THE TRANSMISSION LINE OR CABLE
DOES NOT MATCH THE SOURCE IMPEDANCE?
WHAT WILL THE RESPONSE LOOK LIKE?
E
50
75
∞
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Feb.23, 2006
10
Peeling - Voltage Bounce Diagram
source
50Ω
75Ω
ΓS = - 0.2 -Γl = - 0.2
Open
50Ω
Raw Voltage
ΓR = = 1.0
240 mV
t=0
240 mV
192 mV
-48 mV
9.6 mV
192 mV
201.6 mV
t=2
(192 –1.92)mV
t=4
Peeled Voltage
383 mV
Keeps on approaching steady state of 400 mV
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Page 21
Corrected Z Profile into a 75 Ω Cable
Peeling assumes
Loss-less device.
Loss, Resistance [R],
degrade accuracy of
peeling.
Initial Z mismatch is
the most accurate.
Benefit is enhanced
with TDR calibration
Notice that multiple
reflections have been
removed
Peeled Trace Impedance
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Feb.23, 2006
11
TDR normalization (As VNA’s Calibration)
What is Normalization?
• Built-in Firmware
• Removes Test Fixture Error
• Increases Accuracy
• Allows Customer to Simulate
his own system risetime
Originally Licensed from Stanford
University (Bracewell
Transform)
Critical for Rambus!
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Feb.23, 2006
Page 23
The procedure of TDR Normalization
•First part of the calibration removes systematic errors due to trigger
coupling, channel crosstalk, and reflections from cables and
connectors by measuring the response with the DUT replaced by a
short circuit.
•The second part of the calibration generates a digital filter. The filter
removes errors by attenuating or amplifying and phase-shifting
components of the frequency response as necessary.
•For TDR, this is done by replacing the DUT with a termination having
an impedance equal to the characteristic impedance of the
transmission line, all of the energy that reaches it will be absorbed.
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Feb.23, 2006
12
The procedure of TDR Normalization
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Feb.23, 2006
Page 25
Effect of TDR Normalization Calibration
Fixture
DUT
Reference plane by Calibration
Remove Error caused by Test Fixture, Cable, connectors
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Feb.23, 2006
13
Fixture Error Correction Techniques
TDR Peeling
Measurement Goals
By VNA
•Accuracy
•Repeatability
•High Dynamic range
•Complete
characterization
= Post-measurement process
Source : DesignCon 2005 “Designing Transceiver
FPGA's Using Advanced Calibration Techniques”
= Pre-measurement process
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Page 27
Comparison of TDR and PNA
Agree well to 9-10 GHz
•TDR has wide band receiver
•Higher noise floor
•Lower S/N ratio
•Lower dynamic range
•VNA has narrow band receiver
•Lower noise floor
•Higher S/N ratio
•Higher dynamic range
PNA
TDR Norm@20pS
TDR with RPC
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Feb.23, 2006
14
Comparison of TDR and PNA (Error Correction)
Good Calibration yields ~1dB error below 10GHz
Magnitude
Phase
PNA
RPC
Norm@20pS
Norm@30pS
TDR
Waveforms
@30pS
RPC
@20pS & PNA
Comparison: TDR Calibration Methods versus PNA SOLT Calibration
Device Under Test: 3.5 mm Thru Adapter
Results: The magnitude loss increases as a function of frequency and is dependent upon the
calibration method for TDR-based measurements. Phase error due to timing jitter exists in TDRbased measurements.
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Page 29
TDR vs VNA comparison
Mismatch Line Device #1 Insertion Loss S21 (Magnitude dB)
50MHz
5.00E+07
10GHz
2.54E+09
5.04E+09
7.53E+09
1.00E+10
20GHz
1.25E+10
1.50E+10
1.75E+10
0
2.00E+10
0
-5
VNA
-5
-10
TDR
-10
-15
-15
-20
-20
-25
-25
-30
-30
-35
-35
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Feb.23, 2006
15
TDR vs VNA comparison
Mismatch Line Device #1 Return Loss S11 (Magnitude dB)
50MHz
5.00E+07
10GHz
2.54E+09
5.04E+09
7.53E+09
1.00E+10
20GHz
1.25E+10
1.50E+10
1.75E+10
2.00E+10
0
0
-5
-5
-10
-10
-15
-15 VNA
-20
-20
-25
-25
-30
-30
-35
-35
TDR
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Feb.23, 2006
Page 31
N1024A TDR Calibration Kit
Best for Differential normalization
2 x Loads and 2 x Shorts
Current 54754A-100
Accessory 3 36” SMA cables
Kit 1 SMA-f load
1 SMA-m load
1 SMA-f short
2 SMA-m to BNC-f
5 3.5mm 20dB pads
N1024A
2
2
2
2
2
2
1
1
36” SMA cables
3.5mm-f precision load
3.5mm-m precision load
SMA-f flush short
3.5mm-m flush short
3.5mm f-f adapter
SMA-f to BNC-m
Torque wrench
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Feb.23, 2006
16
Diff. TDR Probe
Used for handheld Differential meas.
2 x Diff. and 2 x Single Ended Probes
Current 54754A-100
Accessory 3 36” SMA cables
Kit 1 SMA-f load
1 SMA-m load
1 SMA-f short
2 SMA-m to BNC-f
5 3.5mm 20dB pads
PS-X10-100
2
2
2
2
2
1
1
1
SMA cables
SMA-m precision load
SMA-m flush short
Size Diff. TDR probe
Size Single Ended Probe
Calibration Subtract
Hand Held holder
ESD protection (option)
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Feb.23, 2006
Page 33
TDR Accessories
Do you know we have ;
N1020A-K08 FireWire TDR Cable
(IEEE 1394)
N1020A-K09 HSSDC* TDR Cable
Gigabit Ethernet (IEEE 802.3
Standard)
N1020A-K10 DB-9 TDR Cable
Fibre Channel (ANSI x3.297-1997)
InfiniBand 1x, 4x will be available
* High Speed Serial
Data Connector
USB2.0 & HDMI are under investigation
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Feb.23, 2006
17
On Wafer & Packages measuring example
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Feb.23, 2006
Interconnects – Using Excess L/C
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Feb.23, 2006
18
How close can two reflection sites be and still be
seen as independent events?
The TDR edge needs time
to reach its full height
before the next event is
encountered
So what determines the
two-event resolution?
Answer: It’s not just the
TDR step speed!
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Feb.23, 2006
Page 37
A 35 picosecond step is insufficient to see closely spaced
reflections
With a 35 ps step, all you know is the device is there
If there is more than one reflection, we can’t tell
35ps
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Feb.23, 2006
19
High resolution allows your customers to see what they
could never see before
hermetic
feedthrough
9ps
V-connector
pin-collette
coaxial
feedthrough
V-connector
pin-collette
coaxialmicrostrip
launch
microstrip
transmission line
At 9 ps step speed, we see 5
separate reflections
Each event is easily seen
and quantified
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Feb.23, 2006
Page 39
86100/Picosecond Pulse Labs 4020/4022 Measurement
capabilities
The Picosecond Pulse Labs 4020 modules takes the 35 Picosecond pulse
from the Agilent TDR and increases the speed to under 9 picoseconds
Two-event resolution is improved by a factor of 4!
(1.5 mm ‘air’, less than 1 mm in common dielectrics)
<9ps
35ps
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Feb.23, 2006
20
Optimizing
Measurements
54754A TDR
module
86118A
You will lose your edge speed
if you have:
• Excess or poor quality cabling to
and from the DUT
Sampling
Port
• The scope receiver channel has
insufficient BW
Recommend TDR with the
86118A ~75 GHz remote plugin:
4020 Remote
TDR Head
• Max. bandwidth
• Minimum cabling distances
• Connector recommend as
2.4mm
Device
Under
Test
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Feb.23, 2006
Configuring a system
86100 C mainframe
54754A TDR plug-in
86118A 70 GHz plug-in
• Lower BW channels can be used, but edgespeed
and resolution will be reduced
• Cabling between the DUT and the receive
channel degrades TDR speed
Picosecond 4020 (Single-end) or
4022 (differential) TDR or TDT
enhancement module
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Feb.23, 2006
21
Physical Layer Test System (PLTS) is the Most Complete
for Differential S parameters
•Extensive Calibration
•Eye diagram simulation
•N5320A-225 20G VNA
•N5320A-240 20G VNA
•54754Ax2 TDR base
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Feb.23, 2006
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Feb.23, 2006
22
Using ADS for Signal
Integrity Design
Signal Integrity and
Advanced Design System
Agilent Technologies Ltd.
Ming Chih, Lin
Application Engineer
Feb, 23, 2006
安捷倫科技高頻元件量測研討會
Page 1
Feb.23, 2006
Overview
Part I
• Unified Environment for SI Design
Part II
• Application Guides for SI
• Eye Diagram
• IBIS Model
• Momentum
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Feb.23, 2006
1
Using ADS for Signal
Integrity Design
Unified Environment for SI
Design
安捷倫科技高頻元件量測研討會
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Feb.23, 2006
Signal Integrity Problems are Everywhere!
Wafers
Backplanes
PC Boards
IC Packages
Cables
安捷倫科技高頻元件量測研討會
Page 4
Feb.23, 2006
2
Signal Integrity (SI)- What is it?
“Signal integrity is a field of study half-way between
digital design and analog circuit theory”
Dr. Howard Johnson
It is the application of engineering principles to:
Control impedance and reflections
Minimize parasitic and unwanted coupling effects
Control skew
Adjust for skin-effect and dielectric losses
Transmitter Pre-emphasis
Receiver Equalization
So chips can communicate at higher data rates
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Feb.23, 2006
Page 5
Projected Increase of Clock Frequencies
17500
Microprocessor based products
Clock Frequency (MHz)
15000
on-board
on-chip
12500
10000
R&D
7500
Parallel bus
Serial bus
5000
2500
Production
0
1998
2000
2002
2004
2006
2008
2010
2012
2014
2016
Year
Source: ITRS 2003 SIA Roadmap
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Feb.23, 2006
3
Computer Interconnect Standards
Second gen PCI-Express (5-6.25Gb/s)
10Gb Ethernet
6Gb/s SATA III
VXS Backplane (VITA41)
6.25Gb/s double XAUI
GigE Backplane (VITA 31.1)
AdvancedTCA (PICMG 3.x)
5.0Gb/s
Serial Mesh Backplane (PICMG 2.20)
XAUI
3.125Gb/s
RapidIO
3.0Gb/s
3.125Gb/s
3GIO/PCI-Express
2.5Gb/s
InfiniBand
2.5Gb/s
2.5Gb/s
Fibre-Channel
Flexbus 4
POS-PHY L3/L4
IEEE 1394
CSIX
VME
USB
CompactPCI
SCSI
1.6Gb/s
PCI-X 66 & 100
XAUI
2.0Gb/s
Serial ATA
HyperTransport
PCI 32/33 & 64/66
On Chip
6.0Gb/s
StarFabric Backplane (PICMG 2.17)
VME320
CoreConnect
10.0Gb/s
Chip-to-Chip
Local Bus
1.5Gb/s
1Gb Ethernet
Backplane
1.0Gb/s
System
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Page 7
High-Speed Signaling Standards
Data Rate
(Gb/s)
Standard
Serial
PCI Express (3GIO)
RapidIO Serial
10GbE XAUI
Fibre Channel 2125
Infiniband
Serial ATA
Parallel
RapidIO 8/16
HyperTransport
9Edge
2.5
3.125
3.125
2.125
2.5
1.5
Driver Edge
Rate (ps)
Receiver
Sensitivity
Receiver Eye
Opening or
Setup/Hold
50ps
to
140ps
200mVpp
to
400mVpp
100ps
to
140ps
2
1.6
rates are decreasing below 100ps
9Differential
voltage swings are shrinking
9The model bandwidth required for accurate measurements is primarily
dependent on the signal’s risetime, not its data rate.
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Feb.23, 2006
4
Agilent’s Signal Integrity Solutions
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 9
Simulation Leadership
Linear
Harmonic Balance
Circuit Envelope
Frequency
Advanced Design System
AC/
S-Parameters
Harmonic
Balance
Vector Signal
Instrument Links
Planar EM (Quasi-static)
Planar EM (Full-wave)
Custom EM-based Models
Numeric
Ptolemy
Ptolemy Fixed Point
Physical
Convolution
High Frequency SPICE
Domain
Time
Circuit Envelope
HF
SPICE
(Transient)
Convolution
Ptolemy
Synchronous
Dataflow
Circuit and Numeric
CoCo-Simulation
High Speed
Interconnect
Library
Momentum
Layout
Components
Ptolemy
Timed
Synchronous
Dataflow
(TSDF)
Advanced Model
Composer
Capabilities
安捷倫科技高頻元件量測研討會
Page 10
Feb.23, 2006
5
Agilent – 20 years of Simulation Innovation
RFIC
From Touchstone to ADS
stem
n Sy
High
YEAR
ve
owa
ra,
Micr
& Lib
tone
s
h
c
u
f To
EEso
198
0
d dig
ital
MDS
ies IV
, Ser
e my
d
a
c
1990
A
Layout-driven
simulation
Yield Optimization
Wireless Design
Libraries
Discrete-valued
Optimization
Phase-noise
Analysis
Ptolemy Timesynchronous
Dataflow
Simulator
High-Frequency
SPICE
Optimization from
Layout
MDS for Unix
Harmonic Balance
Simulator
Standards-based
Communications
Libraries
Transient-assisted
Harmonic Balance
Genetic Optimization
Multilayer Interconnect
Library
Smart Simulation
Wizards
2.5D EM Adaptive
polygonal meshing
Circuit Envelope Simulator
4
Signal Integrity
DesignGuide
RF/ Analog co-simulation
Transient
Convolution
Simulator
Microwave System
Simulation
20 0
Yield Analysis
8510A Vector
Network Analyzer
PC-based Linear
Simulator
TECHNOLOGY
-spee
sig
d De
ance
Adv
0
200
E
RFD
High-speed
Krylov Harmonic
Balance
Advanced Model
Composer
4-PORT VNA
and PLTS
Developer’s Studio
GaAs Foundry
Design Kits
Automated thickmetal EM
RFIC Foundry
Design Kits
ROOT MOSFET, Schottky
and Varactor Models
Fast 2.5D EM
simulator for RF
DesignGuides
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Feb.23, 2006
Page 11
ADS for Signal Integrity
1924 pin LTCC Package Designed using ADS
Measured vs Modeled, 50 ps TDT response
Measured vs Modeled, Insertion Loss (S21)
0
dB(S(4,3))
dB(S(2,1))
-10
-20
-30
-40
0
2
4
6
8
10
12
14
16
18
20
22
freq, GHz
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Feb.23, 2006
6
4-port Measurement of Connector
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Page 13
Simulated Step-response of Measured Connector
•Differential pair simulated
their response to a voltage step.
•Main through line is held fixed
during simulation
600
• The complement line is swept
from +/-50ps
400
200
Vport4, mV
Vport2, mV
• magnetic effect in board is
evident in measurement.
differential, true/complement skew +/- 50 ps.
Both output steps shown Below.
0
-200
-400
-600
0.4
0.5
0.6
0.7
0.8
0.9
1.0
time, nsec
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Feb.23, 2006
7
Simulated Eye Diagram of Measured Connector
Differential, true/compliment skew +/- 50 ps
• Eye opening on left-side is
smaller than on right-side of
crossing point for –50, -40, 30ps.
• Jitter is higher for – 50, -40
and -30 ps eyes
• Slope of rise is shallower for
+ and – 50 ps eyes
• Eye opening is balanced and
and rise is faster for 0, +10 and
+20ps
• Physical line added to board
to adjust delay based on these
results
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 15
Typical SI Problem
Channel Adaptation
Pattern
Generator
Encoder
Pre-emphasis / Driver
Die
Card
High speed Connectors
Card
Board Traces 2” (51mm) – 10” (254mm)
Die
Receiver
Physical Channel
IBIS or Spice model
Physical Channel
IBIS or Spice model
Driver
Package
Backplane Traces
10” (254mm) – 40” (1016mm)
Package
Card
Receiver
Decoder
Equalizer
Signal Recovery
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Feb.23, 2006
8
ADS for Signal Integrity – Link Level Simulation
Channel Adaptation
Simulators
•
•
•
•
•
Frequency-domain
Time-domain
Numeric Domain
3-D Planar Electromagnetic
3-D Electromagnetic
•
•
•
•
•
•
Optimized equivalent circuit models
Analytic transmission line models
Static field-solver based models
EM simulation models
Models from measurements
Matlab, VHDL, C++, SystemC, Verilog_A
Measurements
• TDR and TDT
• 2-port and 4-port VNA
• Eye Diagram
Encoder
Pre-emphasis / Driver
Die
Driver
Package
Card
Physical Channel
Models
Pattern
Generator
Die
Receiver
Package
Card
Decoder
Equalizer
Receiver
Signal Recovery
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 17
Simulators - Solve the Whole Problem
Each part of the Link can be modeled and designed
separately, however…
What happens when the parts are brought together for
the first time?
Would it be beneficial if the Link could be analyzed as a
whole?
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Feb.23, 2006
9
Agilent Ptolemy
•
•
•
•
•
•
Agilent Ptolemy is the Data Flow
simulator
System Level Simulation Kernel
based on UC Berkeley Ptolemy
Timed Synchronous Data Flow (TSDF)
Numeric Synchronous Data Flow (SDF)
Links to other simulators & instruments
Ptolemy Data Flow (discrete numeric/time-domain)
•
•
Signal Processing Verification – FEC, Encoding/Decoding
System Performance Verification – uncoded/coded BER
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Feb.23, 2006
Page 19
What is Synchronous Data Flow (SDF)?
•
Statically Scheduled Simulation
1.
2.
3.
4.
5.
•
•
•
A component maps input tokens (current or numbers) onto
output tokens
A set of firing rules specify when a node (component) runs
A firing consumes input tokens and produces output token
Nodes (components) connected by arcs (wires)
Schedule is constructed once and repeatedly executed
Enabled
Fired
Suitable for synchronous multi-rate signal processing
Synchronous Data Flow has no concept of time, just
numeric data
Tokens can also be “time stamped” - then they
become samples. Now you can simulate time and
frequency domain models and impairments such as
reflections and dispersion Æ TSDF
安捷倫科技高頻元件量測研討會
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Feb.23, 2006
10
Agilent Ptolemy - The “IP Integrator”
ADS Ptolemy is a solution for the following:
• Design & verification of Communication Systems
(physical path).
•
Co-Simulation of Baseband (DSP) and Analog/RF (A/RF)
circuits in a single simulation:
ƒ Ptolemy system with ADS circuit simulators (which
can also contain Verilog-A models).
ƒ Ptolemy system with 3rd party tools (Matlab, RTL-HDL
simulators, C++, SystemC)
•
•
”Connected Solutions” connect Simulation, Design &
Verification flows to Instrumentation and Measurements
Circuit verification with System Test Benches (WTBs) to
link ADS and Cadence (IC) design tools.
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Feb.23, 2006
Page 21
Link Level Simulation
1
Pre-channel
Interactive
Measurements
1
R
R6
R=50 Ohm
TkEye
T14
Label="Pre Channel Eye"
NumSamplesPerSymbol=S amples_per_clock
NumSymbols=2
Amplitude=1
2
TimedToFloat
T12
1
2
TkPlot
T13
Label="Pre Channel scope"
xTitle="waveform"
yTitle="amplitude"
xRange="0 1000"
yRange="-2 2"
Style=connect
1
1
3
1
SplitterRF
S8
2
S plitterRF
S6
1
Pre-channel measurements
Bit-stream Transmitter
with Pre-emphasis
Pre-emphasis
TimedS ink
Pre_channel_t
Plot=None
RLoad=DefaultRLoad
Start=DefaultTimeStart
Stop=Data_Collection_time nsec
ControlSimulation=YES
3
1
2
Channel
SpectrumA nalyzer
Pre_channel
Plot=None
RLoad=DefaultRLoad
Start=DefaultTimeStart
Stop=Data_Collection_time nsec
Window=K aiser 7.865
WindowConstant=0.0
Equalization
2
This upsample sets
measurement resolution
1
Bits
LogicToNRZ
B1
L5
Type=Random
Amplitude=1.0
ProbOfZero=0.5
LFSR_Length=12
LFSR_InitState=1
2
Repeat
R5
NumTimes=Samples_per_clock
BlockSize=1
P re-Emphasis
X6
Bipolar signal, +1, -1
1
1
2
3
3
2
1
3 1
21
1
2
Add2
A2
Var
Eqn
Tk Sl i de r
Sc al e 1
Lo w= 1
Hi g h= 2
Va l ue =1
1
Ide nti fi e r= "Pre-e m ph as i s Ga in "
Pu tIn Co ntrol Pan el =YES
VA R
Gra nu la rity =1 00
VA R1
Clock=12.8e9
Samples_per_clock=12
Sample_rate=Clock*S amples_per_clock
Sample_step=1/S ample_rate
Data_Collection_time=40
Data_Collection_start=4
Typical Pre-emphasis is progrmaple in steps from 5% to 25%
This equates to 1.05 to 1.25 on this controller.
Mpy2
M3
1
1
S plitterRF
S4
I
O
3
21
drive_lines_cosim3_sub_s2p
X7
Trace_Spacing=3
2
1
2
1
3
Post Eq
Interactive
Measurements
2
1
2
1
3
1
2
TkEye
T17
Label="Eye Eq"
NumSamplesPerSymbol=Samples_per_clock
NumSymbols=2
Amplitude=1.5
1
1
TimedToFloat
T6
R
R3
2 R=50 Ohm
1
S plitterRF
S2
LMS_TkPlot
L4
Taps="-2.3 0 0.4 1.0 1.3 1.3 1.2 0.8 -0.1 -0.8 -1.6"
Decimation=1
DecimationPhase=0
StepSize=0.02
ErrorDelay=1
SaveTapsFile="tapsout.tap"
Identifier="LMS filter taps"
Sub
S9
DownSample
TkHistogram
D3
T19
Label="Bit S lice Histogram Eq"
Factor=S amples_per_clock
Top=1.5
P hase=11
Bottom=-1.5
For the histograms to be correct
NumberOfBars=32
the phase needs to be set to the
DataPoints=10000
correct bit slice sample delay.
(11 will work for the default design).
The SampleDelay of 11 will work for the
2
default design. If the Channel is changed
this delay can be set via a slider in the Tk
1
controller. S et the slider to the same delay
as the Eye delay slider when the widest part
of the eye is at t=0 on the eye plot.
TkConstellation
1
T18
Label="Bit S lice Eq"
NumSamplesPerSymbol=Samples_per_clock
Amplitude=1.5
Const
SampleDelay=6
C1
Style=dot
Level=0.0
Receiver with Equalization
Trace_Spacing sets the distance betwen line pairs
as a multiple of intrapair spacing.
1
FIR
F4
Decimation=1
DecimationP hase=0
Interpolation=1
2 1
1
1
Del a y
D1
N=1
2
3
1
2
RateLimiter
R8
RMax=4e10
3
2
2
DF
DF2
Channel Model
FloatToTimed
F3
TStep=Sample_step sec
IID_Gaussian
I1
Mean=0
V ariance=.1
1
TkEye
T5
Label="Eye Post Channel "
NumSamplesPerSymbol=Samples_per_clock
NumSymbols=2
Amplitude=1.5
For the histograms to be correct
the phase needs to be set to the
correct bit slice sample delay.
(3 will work for the default design).
T k Sl id er
Sc a l e2
L ow=0
Adding noise or other artefacts to the
Hi gh =1
signal can be done in this fashion.
Val u e= 0
Id en ti fi er="Add ed Noi s e"
PutInCon tro l Pa ne l= YES
Gran ul ari ty = 10 0
1
Adding Noise
Post-channel
Interactive
Measurements
PTOLEMY-SPICE CO-SIM SI CHANNEL WITH TX PRE-EMPHASIS AND RX EQUALIZATION
2
DownSample
D2
Factor=S amples_per_clock
P hase=3
2
TkPlot
T7
Label="Post Channel scope"
xTitle="waveform"
yTitle="amplitude"
xRange="0 1000"
yRange="-1 1"
Style=connect
1
Const
C2
Level=0.0
TkConstellation
T20
The S ampleDelay of 3 will work for the
Label="Bit S lice"
default design. If the Channel is changed
this delay can be set via a slider in the Tk
NumSamplesPerSymbol=Samples_per_clock
controller. Set the slider to the same delay
Amplitude=1.5
as the E ye delay slider when the widest part SampleDelay=10
of the eye is at t=0 on the eye plot.
Style=dot
3
1
1
TkHistogram
T21
Label="Bit S lice Histogram"
Top=1.5
Bottom=-1.5
NumberOfBars=32
DataPoints=10000
1
1
(Using the "drive_lines" channel example)
1
2
1
1
TimedToFloat
T22
R
R7
2 R=50 Ohm
1
TimedS ink
Post_E q_t
Plot=None
RLoad=DefaultRLoad
Start=DefaultTimeS tart
Stop=Data_Collection_time nsec
ControlSimulation=YES
Post Eq measurements
1
2
SpectrumAnalyzer
Post_channel
Plot=None
RLoad=DefaultRLoad
Start=DefaultTimeS tart
Stop=Data_Collection_time nsec
Window=Kaiser 7.865
WindowConstant=0.0
SplitterRF
S7
1
Post-channel measurements
TimedS ink
Post_channel_t
Plot=None
RLoad=DefaultRLoad
Start=DefaultTimeS tart
Stop=Data_Collection_time nsec
ControlSimulation=YES
安捷倫科技高頻元件量測研討會
Page 22
Feb.23, 2006
11
Transmitter with Pre-Emphasis
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Feb.23, 2006
Page 23
Channel Model
Aggressor Lines
Channel Subnetwork
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Page 24
Feb.23, 2006
12
Channel Subnetwork
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 25
Models
Accurate models of interconnects
+
Accurate models of the active devices
+
Accurate models of Tx and Rx Functions
+
Robust simulator
=
Accurate Prediction of performance
The earlier in the design cycle that problems are
found and designed out, the shorter the cycle time,
the lower the development costs
安捷倫科技高頻元件量測研討會
Page 26
Feb.23, 2006
13
Interconnect Models
Account for impedance,
delay, conductor loss,
dielectric loss, and
coupling
Multilayer Interconnect Models use a
built-in field-solver, and have both
layout and schematic representations
Analytic models are fast,
and have a layout and
schematic representation
Momentum EM simulator for
arbitrary planar structures. Has
layout and schematic
representations
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 27
EM Models - Momentum
Current ADS Capabilities
•
•
•
•
•
•
Integrated Momentum EM Simulator
Layout editing
Momentum RF
and port
Model Composer
assignment
Co-Simulation w/Layout Components
Co-Optimization w/Layout Components
Layout lookalike components
30 GHz transition
Layout look-alike
component in the
schematic
安捷倫科技高頻元件量測研討會
Page 28
Feb.23, 2006
14
Momentum RF
Quasi-Static Electromagnetics
reduction
Low Frequency approximation :
e − jk |r −r '| ≈ 1 − jk | r − r ' |
10
cells
Electro- and magnetostatic
Green’s functions
4
cells
Quasi-static frequency
scaling (jw, 1/jw)
L’s and C’s are real and
frequency independent
1
cell
reduction
R’s are complex (DC loss +
skin effect √w)
topology
mesh
Mesh strips, Vias and slots with rectangles
and triangles (conformal surface mesh)
[Z].[I]=[V]
Performs mesh reduction while maintaining
integrity of solution
Model surface current in each mesh cell
(linear distribution)
[S]
[Z] matrix load is frequency
independent !
• near field / low freq approximation
L(ω) = L0 + L1 ωR + L2(ωR)2 + …
C(ω) = C0 + C1ωR + C2(ωR)2 + …
Solve matrix equation for the unknown
current coefficients
• neglecting far field radiation
Calculate S-parameters
• [Z0] matrix reload very fast
• [L0] & [C0] frequency independent
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Feb.23, 2006
Page 29
Comparison of Models
Layout
DC
Spice
Momentum
Spice model
S parameters
RF
• quasi-static inductance . . . . . .
• quasi-static capacitance . . . . .
• DC conductor loss (s) . . . . . . . .
• DC substrate loss (s) . . . . . . . .
• dielectric loss (tgd) . . . . . . . . . . . . . . . . . . . . . . . . . . .
• skin effect loss . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
安捷倫科技高頻元件量測研討會
Page 30
Feb.23, 2006
15
Models in Matlab, VHDL, C++, SystemC, Verilog-A
IP for “Link Level” blocks and functions often already exist,
e.g.
ƒ Pre-emphasis
ƒ EQ
ƒ Encoding/Decoding
ƒ Interleaving/De-interleaving
ƒ Source descriptions
Easy to include with Ptolemy, either natively or with Cosimulation
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Feb.23, 2006
Page 31
Models - MATLAB Co-Simulation in ADS Ptolemy
Co-simulate with Matlab in ADS
Use full Matlab UI or as math function only
Components in “Numeric Matrix” library
scripting code
M atlab_M
M8
ScriptDirectory=""
DeleteOldFigures=YES
M atlabSetUp=""
M atlabFunction=""
M atlabWrapUp=""
MatlabLibLink
M4
Library=""
Setup=""
SetupParm=""
Function=""
Mode=AUTO
MatlabCx_M
M1
ScriptDirectory=""
DeleteOldFigures=YES
MatlabSetUp=""
MatlabFunction=""
MatlabWrapUp=""
MatlabLibLinkCx
M5
Library=""
Setup=""
SetupParm=""
Function=""
Mode=AUTO
script files
M atlabSink
M6
ScriptDirectory=""
DeleteOldFigures=YES
M atlabSetUp=""
M atlabFunction=""
M atlabWrapUp=""
NumberOfFirings=1
M atlabF_M
M3
ScriptDirectory=""
DeleteOldFigures=YES
M atlabSetUp=""
M atlabFunction=""
M atlabWrapUp=""
M atlabFCx_M
M2
ScriptDirectory=""
DeleteOldFigures=YES
M atlabSetUp=""
M atlabFunction=""
M atlabWrapUp=""
MatlabSinkF
M7
ScriptDirectory=""
DeleteOldFigures=YES
MatlabSetUp=""
MatlabFunction=""
MatlabWrapUp=""
NumberOfFirings=1
MATLAB compiler – generate
native shared libraries
安捷倫科技高頻元件量測研討會
Page 32
Feb.23, 2006
16
Models - HDL Co-Simulation in ADS Ptolemy
In the HDL Blocks library
IN
___
Set
IN
___
Set
OU T
C lock
HdlCosim
H1
HdlSrcFile=""
Inputs=""
InputPrecisions=""
Outputs=""
OutputPrecisions=""
HdlModelName=""
HdlLibrary=""
HdlSimulatorGUI=Off
IN
OU T
C lock
NCCosim
N1
HdlSrcFile=""
Inputs=""
InputPrecisions=""
Outputs=""
OutputPrecisions=""
HdlModelName=""
HdlSimulatorGUI=Off
___
Set
OUT
Cloc k
VxlCosim
V1
HdlSrcFile=""
Inputs=""
InputPrecisions=""
Outputs=""
OutputPrecisions=""
HdlModelName=""
HdlSimulatorGUI=Off
安捷倫科技高頻元件量測研討會
Page 33
Feb.23, 2006
Integration of other Models
C++ Based Model Creation and SystemC
C++
• Native Language for Ptolemy Kernel
• Model Development Through GUI and Command Line
Interface
• Full Debug Capability Through 3rd Party Development
Environments
• Microsoft Visual Studio for PC Platforms
SystemC
•
•
Application Note 1482: Importing SystemC Designs into
Advanced Design System
http://eesof.tm.agilent.com/pdf/5989-0234EN.pdf
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Page 34
Feb.23, 2006
17
Measurement-based Models
Probing Solution + PLTS + ADS
View and analyze
measurement data
using PLTS
software
Calibration and
Measurements
Device Under Test,
Microprobes & Probe
Station
PLTS Software
4-Port TDR or VNA
View and analyze
measurement data
S-parameters
• Citifile
• Touchstone
RLCG
• Measured Parameters
• ML2CTL Model
ADS Design SW
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 35
Link Level Simulation
Data based Channel Models can be derived from simulation
models or measurements.
Channel Model
3
2
SplitterRF
S4
Di
n
tio
ula
m
i
o-s
tc
Port
rec
Rad a
i 1
l
MLRADIAL 2
Radial2
MLRA DIAL2
I
O
21
drive_lines_cosim3_sub_s2p
X7
Trace_Spacing=3
1
P1
Num=1
Simulated Channel
1
1
3
2
1
4
1
S2P_Eqn
S2P1
S[1,1]=file{DAC1, "S[1,1]"}
S[1,2]=file{DAC1, "S[1,2]"}
S[2,1]=file{DAC1, "S[2,1]"}
S[2,2]=file{DAC1, "S[2,2]"}
Z[1]=file{DAC1, "PortZ[1]"}Ohm
Z[2]=file{DAC1, "PortZ[2]"}Ohm
SplitterRF
S2
1
Port
P2
Num=2
TRANSIENT
Tran
Tran2
StopTime=Data_Collection_time nsec
MaxTimeStep=Sample_step
TDR or VNA Measurements
R4
R
R12
R
Slant 1
MLSLANTED2
DAC
CL n
i 5
ML6CTL _V
ar bitr ar y4p_ 1
a rbit rar y4p
CL n
i 4
ML4CTL _V
CLin6
ML4CTL _V
R9
R
R10
R
DataAccessComponent
DAC1
File="drive_lines_s2p.ds"
Type=Dataset
InterpMode=Linear
InterpDom=Rectangular
ExtrapMode=Interpolation Mode
iVar1="freq"
iVal1=freq
iVar2="Trace_Spacing"
iVal2=Trace Spacing
Parameterized Data
安捷倫科技高頻元件量測研討會
Page 36
Feb.23, 2006
18
Bringing it All Together
•ADS has been used for SI design for over 10 years
•ADS can act as a scalable design whiteboard
•ADS encourages you to be curious about your design ideas
•ADS has a multitude of accurate built-in models
•ADS allows you to build accurate physical models
•ADS lets you use your existing models
•ADS agrees with measurements
•ADS shows results the way you want to see them
•ADS brings IP, simulations and measurements together
•ADS Ptolemy lets you work with the whole Link before you build it!
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Feb.23, 2006
Page 37
Signal Integrity Resources
Gigatest for probe stations and
package modeling services
www.GigaTest.com
CST for 3D EM Simulator
www.cst.com
Fastest, Inc for designing high speed
hardware and resolving signal
integrity problems.
www.fastestco.com
Admos for active and passive model
extraction services
www.admos.com
安捷倫科技高頻元件量測研討會
Page 38
Feb.23, 2006
19
SI Resources on the Agilent EEsof website
Agilent EEsof EDA home page
http://eesof.tm.agilent.com
Signal Integrity Applications and Wireline Applications
http://eesof.tm.agilent.com/applications/signal_integrity-b.html
http://eesof.tm.agilent.com/applications/wireline-b.html
Momentum
http://eesof.tm.agilent.com/products/e8921a-a.html
Agilent Signal Integrity eSeminar Series
www.agilent.com/find/sigint
NetSeminar: Challenges of Differential Bus Design http://eesof.tm.agilent.com/news/news400.html#bus_design
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 39
Application Web site for 2005A
http://eesof.tm.agilent.com/applications/signal_integrity-b.html
安捷倫科技高頻元件量測研討會
Page 40
Feb.23, 2006
20
Signal Integrity Training Class
http://www.agilent.com/find/education
Signal Integrity Class: N3215A Designing for Signal
Integrity with ADS
ƒ
ƒ
ƒ
ƒ
ƒ
ƒ
ƒ
Transient Simulation Setup
Convolution and Frequency-Domain Simulations
Transmission Lines, Crosstalk and Resonances
TDR/TDT
Noise and Jitter
2.5D EM Simulations (Momentum)
Differential Circuits and Mixed-Mode S-Parameters
– Length – 2 days – hands-on
Ptolemy training: N3206A Signal Processing using ADS
•
ƒ Ptolemy SDF / TSDF
ƒ Co-simulation
Length – 3 days – hands-on
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Page 41
Feb.23, 2006
Using ADS for Signal Integrity Design
Models, Simulations and Measurements
安捷倫科技高頻元件量測研討會
Page 42
Feb.23, 2006
21
Using ADS for Signal
Integrity Design
Application Guides for SI
安捷倫科技高頻元件量測研討會
Page 43
Feb.23, 2006
DesignGuides in ADS – Bridging the Gap
DesignGuides
Passive
RF System
Filter
Applications
Amplifier, Filters
Mixers, Oscillator
Passives, System
Mod/Demods
Packaging
Radar, A-to-D, UWB,
High-Speed Digital
Linearization
SI
Mixer
Amplifier
Oscillator
PLL
Simulation
Technology
Linear, Nonlinear
Circuit Envelope
Time Domain
Agilent Ptolemy
Electromagnetic
Others
安捷倫科技高頻元件量測研討會
Page 44
Feb.23, 2006
22
Helps SI designer to use ADS for common
tasks
Application Guides
DesignGuides
DesignGuides / Application Guides
IBIS model import and
examples
Signal integrity simulations
and examples
Highspeed circuits typical
for wireline
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 45
Wireline Applications
Photodiode
Bandgap
Transimpedance Amp
Limiting Amp
Laser Driver
VCSEL
TWA
Ring Oscillator
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Page 46
Feb.23, 2006
23
Wireline Applications
Buffer, Divider
Latch, Selector
Multiplexer
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Feb.23, 2006
Page 47
Wireline Applications
Ckt-level Logic
Bandgap
Behavioral Logic
D Flip Flop
Phase Detectors
Multivibrator VCO
Clock Recovery
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Page 48
Feb.23, 2006
24
IBIS Library
IBIS Model Import
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Feb.23, 2006
Page 49
Components from the IBIS Library Component
Palette
Ideal Source Buffers
Octal Pulse Source
Impedance Meter
Octal Loads
Impedance Optimizer
Oscilloscope Probe
安捷倫科技高頻元件量測研討會
Page 50
Feb.23, 2006
25
Signal Integrity Applications
Eye Diagram
measurements including
jitter, FrontPanel and DCA
file import
Single Ended TDR/TDT
Linear/Nonlinear Differential
TDT
Mixed Mode S-Parameters
Impedance Simulations
Pre-emphasis and Equalization
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Page 51
Feb.23, 2006
TDR Simulation Instrument
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Feb.23, 2006
26
TDR Responses Using Time-domain Simulation
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Page 53
Feb.23, 2006
Differential Nonlinear Test Component
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Page 54
Feb.23, 2006
27
Using ADS for Signal
Integrity Design
Eye Diagram
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Page 55
Feb.23, 2006
Qualitative vs. Quantitative: How close are
these waveforms?
“This 40 Gb/s eye diagram was then compared to the 40 Gb/s eye diagram
derived from the internal PLTS eye diagram generating algorithms.
The qualitative correlation of these two simulated eye diagrams was very good.“
DesignCon 2004 paper “Utilizing TDR and VNA Data to
Develop 4-port Frequency Dependent Models for
Simulation” Mayrand, Resso, Smolyansky
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Page 56
Feb.23, 2006
28
Data Display strengths and weaknesses
Data Displays are flexible but require extensive use of equations and a
lot of user expertise.
Some measurements are calculated, but most characteristics are left
up to the user to determine.
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Feb.23, 2006
FrontPanels: Eye Diagram
Convenience – dedicated display and push-button measurements focused on
a common task. Provides over 30 data display pages and over 300
equations.
Consistency – measurement algorithms checked against instrumentation.
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Page 58
Feb.23, 2006
29
Inspired by Agilent DCA-J Instrument
Histograms
Pointers, masks
Oscilloscope and Eye
Modes of operation
Measurements/Tests
Summary of measurement results
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Page 59
Feb.23, 2006
Oscilloscope Mode
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Feb.23, 2006
30
Eye/Mask Mode
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Feb.23, 2006
Page 61
Convert DCA data (*.csv format) into Dataset
Data Parser available in Signal Integrity Application Guide
*.csv file from
DCA
Dataset file
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Page 62
Feb.23, 2006
31
Compare Eye FP to DCA on Same Data
1G Data Rate through 20” trace
Eye Diagram FrontPanel on the DCA output
file.
DCA Measurement
Level 1
Level 0
Rise Time
Fall Time
Eye Amp
Eye Height
Eye S/N
Jitter p-p
Jitter rms
FrontPanel
212mV
-177.4mV
219pS
212pS
389.4mV
274.7mV
10.18
22.2pS
5.8pS
DCA typ
DCA
min/max
211.3mV 211.3/213.5
-177.5mV -177.5/-178.5
222pS
219/226
215pS
211/219
389mV
386.3/389.4
274.7mV 273.9/274.9
10.07
10.01/10.23
22.2pS
22.2/22.2
5.7pS
5.7/5.8
[NOTE: FrontPanel data is from a single trace.
DCA measurements are averaged with 16
measurements.]
[NOTE: FrontPanel results are preliminary until
ADS 2005A final release.]
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Feb.23, 2006
Page 63
Compare Eye FP to DCA on Same Data
5G Data Rate through 20” trace
Eye Diagram FrontPanel on the DCA output file.
DCA Measurement
Level 1
Level 0
Rise Time
Fall Time
Eye Amp
Eye Height
Eye S/N
Jitter p-p
Jitter rms
FrontPanel
157mV
-136mV
136.3pS
140.6pS
293.8mV
61.3mV
3.79
53.44pS
12.6pS
DCA typ
157.5mV
-136mV
136.2pS
140.6pS
293.7mV
61mV
3.79
54.02pS
12.5pS
DCA min/max
156.4/157.5
-136.6/-136
136.2/136.9
140.6/140.6
293.4/293.8
60.8/61.5
3.79/3.80
53.28/54.02
12.43/12.65
[NOTE: FrontPanel data is from a single trace. DCA
measurements are averaged with 16
measurements.]
[NOTE: FrontPanel results are preliminary until
ADS 2005A final release.]
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Feb.23, 2006
32
Using ADS for Signal
Integrity Design
Example Measurements
安捷倫科技高頻元件量測研討會
Page 65
Feb.23, 2006
Common SI Problem
Objective: 1m of “improved FR-4” through multiple high speed connectors.
10” (254mm) Line Card > 20” (508mm) Backplane > 10” (254mm) Line Card.
Check Eye Diagram at various points along the path.
IBIS or Encrypted
Die
Hspice model
Card
Driver
Package
High speed Connectors
Card
IBIS or Encrypted Die
Hspice model
Receiver
Backplane Traces
2-3 chassis/rack = 10” (254mm) worst case
5-8 chassis/rack = 40” (1016mm) worst case
Package
Card
Board Traces 2” (51mm) – 10” (254mm)
安捷倫科技高頻元件量測研討會
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Feb.23, 2006
33
Example Test Board
Several trace lengths on “improved FR-4” six metal layers, 62.5 mil total thickness
10” (254mm)
15” (381mm)
30” (762mm)
40” (1016mm)
20” (508mm)
Launch detail
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Feb.23, 2006
Page 67
Measurements on various length of trace
S-Parameter
measurements
Differential S-Parameter
measured with PLTS
10” (254mm)
15” (381mm)
20” (508mm)
Traces are lossy
Measurement shows
multiple reflections
Data is band limited
30” (762mm)
40” (1016mm)
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Feb.23, 2006
34
Create Models from Data
Data-based Model
Measure with 4-port NWA
Layout Look-alike component
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Feb.23, 2006
Page 69
DCA/BERT Measurement Setup
Measure the input waveform
Bypass the Board, record the waveform
Capture waveform with Connection Manager or output
*.csv file to translate to dataset.
86100C
*.csv
Trigger
E8251A
*.ds
Splitter
+5dBm
PRBS Data Out
11636B
1 GHz, 2.5 GHz, 5 GHz
BERT
Measure the DUT (board and cable)
86100C
Trigger
E8251A
Splitter
+5dBm
PRBS Data Out
11636B
1 GHz, 2.5 GHz, 5 GHz
BERT
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Feb.23, 2006
35
Simulation through Measured S-Parameter Data
Simulation
Simulation of
measurement-based
waveform through
measured S-Parameter
data for the board and
cable.
Adjust gain to compensate
for loss through
resistor. May need to
adjust gain slightly to
match measurements.
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Feb.23, 2006
Page 71
Simulation compared to DCA Measurement
Simulation with Measured Data
1G Data Rate through 20” trace
Gain set to 1.95
DCA Measurement of BERT
Level 1
Level 0
Rise Time
Fall Time
Eye Amp
Jitter p-p
Jitter rms
FrontPanel
210.8mV
-179mV
197pS
192pS
389mV
22.17pS
5.7pS
DCA typ
DCA
min/max
211.3mV 211.3/213.5
-177.5mV -177.5/-178.5
222pS
219/226
215pS
211/219
389mV
386.3/389.4
22.2pS
22.2/22.2
5.7pS
5.7/5.8
[NOTE: FrontPanel data is from a single trace.
DCA measurements are averaged with 16
measurements.]
[NOTE: FrontPanel results are preliminary until
ADS 2005A final release.]
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Feb.23, 2006
36
Simulation compared to DCA Measurement
Simulation with Measured Data
2.5G Data Rate through 20” trace
Gain set to 1.90
DCA Measurement of BERT
Level 1
Level 0
FrontPanel
187mV
-158.9mV
DCA typ
186mV
-157.7mV
DCA
min/max
186.8-188.6
-158.6-157.4
Rise Time
Fall Time
Eye Amp
157.9pS
157.9pS
346mV
178pS
172pS
344mV
169-178
172-176
344-345.8
Jitter p-p
Jitter rms
40.8pS
9.39pS
37.1pS
9.4pS
37.1-38.5
9.1-9.4
[NOTE: FrontPanel data is from a single trace.
DCA measurements are averaged with 16
measurements.]
[NOTE: FrontPanel results are preliminary until
ADS 2005A final release.]
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Feb.23, 2006
Page 73
Simulation compared to DCA Measurement
Simulation with Measured Data
5G Data Rate through 20” trace
Gain set to 1.90
DCA Measurement of BERT
Level 1
Level 0
Rise Time
Fall Time
Eye Amp
Jitter p-p
Jitter rms
FrontPanel
155mV
-137mV
133pS
133pS
292mV
54pS
12.3pS
DCA typ
157.5mV
-136mV
136.2pS
140.6pS
293.7mV
54.02pS
12.5pS
DCA
min/max
156.4/157.5
-136.6/-136
136.2/136.9
140.6/140.6
293.4/293.8
53.28/54.02
12.43/12.65
[NOTE: FrontPanel data is from a single trace.
DCA measurements are averaged with 16
measurements.]
[NOTE: FrontPanel results are preliminary until
ADS 2005A final release.]
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Feb.23, 2006
37
Using ADS for Signal
Integrity Design
IBIS Model
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Feb.23, 2006
IBIS Model
Digital IC
Digital IC
Circuit Level
Intellectual property
Simulation requirements
• Non Linear driver and receiver circuits
• High speed board layout ( critical paths)
IBIS (Input/Output Buffer
Information Specification)
models enable IC vendors
to communicate device
characteristics without
revealing circuit /
process information.
IBIS Model
Behavioral Level
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Feb.23, 2006
38
IBIS Model
Vcc
Ramp up (or
Vt table)
Pull up I-V
Power clamp
I-V
input
I/O pin
Ramp down
(or Vt table)
Pull down IV
GND clamp IV
Gnd
A basic IBIS model consists of
Four I-V curves: pullup & Power clamp, pulldown and Gnd
clamp
Two ramps (Rampup and Rampdown) and/or Two/Four Vt
tables
Die capacitance: C_comp
Packaging: RLC values
For each buffer on a chip
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Feb.23, 2006
Page 77
For one pair of V(t) waveform,
The other pair is created for a
different value of V-fixture.
Red- V(t) waveform
pair in IBIS data
Blue- Synthesized
V(t) waveform
pair in IBIS data
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Page 78
Feb.23, 2006
39
Comparison of IBIS model Vt table vs. Rise/Falltime
Rise/Fall Time
Vt Table
uses an average value of risetime/falltime to
set the time constant of a capacitor.
uses voltage lookup table (Vt)
Usable starting with IBIS v2.x
Usable back to IBIS v1.0
Uses FDD-based equivalent circuit
Uses SDD-based equivalent circuit
Can be used only in Transient simulation
Can be used in HB as well as Transient
2.5
simulation
Rise/Fall Time
Amplitude
2.0
Vt Table
1.5
1.0
0.5
4.0E-8
3.8E-8
3.6E-8
3.4E-8
3.2E-8
3.0E-8
2.8E-8
2.6E-8
2.4E-8
2.2E-8
2.0E-8
1.8E-8
time
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Page 79
Importing IBIS Component
1. Select*.ibs file
2. Define design kit name
3. Define bitmap label
4. Create design kit
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Feb.23, 2006
40
Installation of design kit
Select the design kit from
$HOME directory
Install design kit
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Feb.23, 2006
IBIS design kit components
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Feb.23, 2006
41
Simulation Setup and Simulation Results
V_fixture
Pin Number
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Feb.23, 2006
Page 83
IBIS Model with Transistor Level Simulation
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Feb.23, 2006
42
Using ADS for Signal
Integrity Design
Momentum
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Page 85
Feb.23, 2006
Momentum RF for Digital Board Interconnect
full board
isolated trace
port 1
port 1
port 2
port 2
S(1,1)
S(1,2)
S(1,1)
S(1,2)
isolated trace
isolated trace
full board
full board
Momentum
Momentum RF
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Page 86
Feb.23, 2006
43
Digital Board Interconnect - off resonance
isolated trace
port 1
harmonic signal
0.4 GHz
port 2
output
S(1,1)
S(1,2)
isolated trace
isolated trace
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 87
Digital Board Interconnect - on resonance
isolated trace
port 1
harmonic signal
2.33 GHz
port 2
no output
resonance
blocks the signal
S(1,1)
S(1,2)
isolated trace
isolated trace
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Feb.23, 2006
44
Digital Board Interconnect
harmonic signal
2.33 GHz
harmonic signal is coupled to neighboring traces
and spread around the board
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Feb.23, 2006
Page 89
Momentum RF for Package Models
96-Ball Grid Array Package
3
Vchip
4
ref 4
1
port 4
port 3
ref 3
2
Vboard
7.6 mm
epoxy
FR4
GND
ref 4
ref 3
port 2
port 1
S(1,1)
S(1,2)
S(1,3)
S(1,4)
7.6 mm
Momentum
Momentum RF
Mesh: 20 cells/wavelength, 5 GHz
Mesh: 20 cells/wavelength, 5 GHz
Matrix size
: 8244
Process size : > 1 GB
User time
: > 2 days
Matrix size
: 1354
Process size : 106.57 MB
User time
: 5h 17m 53s
PC-NT Pentium II workstation (330 MHz)
Rule of thumb: freq < 13.8 GHz
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Feb.23, 2006
45
Transient Simulation from Schematic
Layout lookalike
component used in the
schematic
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Feb.23, 2006
Page 91
Bringing it All Together
•ADS has been used for SI design for over 10 years
•ADS can act as a scalable design whiteboard
•ADS encourages you to be curious about your design ideas
•ADS has a multitude of accurate built-in models
•ADS allows you to build accurate physical models
•ADS lets you use your existing models
•ADS agrees with measurements
•ADS shows results the way you want to see them
•ADS brings IP, simulations and measurements together
•ADS Ptolemy lets you work with the whole Link before you build it!
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Feb.23, 2006
46
Advanced Calibration
Techniques and Fixturing
Issues for VNAs
Agilent Technologies Ltd.
Ming-Fan, Tsai
Application Engineer
Feb, 23, 2006
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Page 1
Feb.23, 2006
Agenda
Overview of PNA FW Rev. 6.0
Cal Registers
TRL Calibration with 4-port 20 GHz PNA-L
Unknown Thru Calibration
Offset Load Cal
Fixture And Probe Techniques
• Auto port extensions
• Embedding/de-embedding
• Frequency Converter Applications – SMC
• Measuring fixtures/probes
Q&A
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Page 2
Feb.23, 2006
1
Introduction - Goals and Objectives
Course Goal
• Understand new calibration paradigm and features of PNA
• Get hands-on time on analyzer
Objectives
• Upon completion of this course you will be able to:
– Calibrate a PNA and save a user cal set
– Explain concept of Unknown Thru cal
– Understand how a two-tier TRL cal is done
– Recommend best cal approach for fixtured measurements
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Feb.23, 2006
Page 3
Welcome to PNA Firmware Revision A.06.0x
Added PNA-L models
(released Dec 2003)
A.04.xx
A.01.xx
Original RF PNA code
(released Sep 2000)
A.02.xx
A.03.xx
Added 3-port RF
and 50 GHz PNAs
Added 20, 40, 67 GHz
and frequency offset
(released Dec 2001)
(released Dec 2002)
A.06.xx
Re-merged code set
A.05.xx
4-port PNA-L ONLY
(released Dec 2005)
“Hawaii”
(released Aug 2004)
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Feb.23, 2006
2
What’s Totally New in 6.0…
• Target release date: 12 December, 2005
• Features
– Calibrate using external trigger (e.g., during wideband pulse detection)
– Calibrate with offset loads
– External test set control
– New FCA capability
• file embedding during cal
(for wafer probes and fixtures)
• fixed input for up converters
– 1.1 GHz CPU and related capabilities
– Agilent VEE Runtime installed
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Feb.23, 2006
Page 5
What’s New in 6.0 From 5.0…
Note: Highlighted text describes features that are new for 2-port PNA/PNA-L models.
These features have already been released for 4-port PNA-L models.
covered in
this module
TRL calibration for 4-port PNA-L
C∆ on status bar
Dedicated calibration window
.pdf version of Help file available
Calibration class label
New 4-port PNA Models:
Data-based cal kits can now be modified
• N5230A Options 240 and 245
• Balanced measurements
Calibration registers
Guided SmartCal supports ECal modules
Option H11 verification
Safely shutdown the PNA without a mouse
New *.csa save/recall file type
4-port fixture simulator functions
• 4-Port network embed/de-embed
• Balanced conversion
• Differential-/ common-mode port Z conversion
• Differential matching circuit embedding
Automatic port extensions
Number of user ranges expanded to 16
(Stats and Markers)
Port extension toolbar features
Magnitude offset
2-port fixture compensation
Two LO sources for millimeter-wave measurements
Material handler trigger control
Global pass / fail dialog
Interface control
Revised operator's check
Agilent 5091A test set control
Revised system verification
8 traces per window (previously 4)
Guided calibration COM interface
Receiver power cal saved with cal set
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Page 6
Feb.23, 2006
3
Will A.06.xx Work on Discontinued PNAs?
; “T1” RF PNA’s (E8356/7/8A): Yes, with upgrade to Windows XP
; “T2” 2-port (E8801/2/3A): Yes, with upgrade to Windows XP
x “T2” 3-port (N3381/2/3A): No
; “M1” (E8364A): Yes, with upgrade to Windows XP
; XP upgrade: Order new disk drive from Agilent
Order N8980A ($550)
安捷倫科技高頻元件量測研討會
Page 7
Feb.23, 2006
What’s New for the ENA
Rev 6.0 released 11/1/05
New features
• TRL/LRM & waveguide calibration
• Automatic port extensions
• 20,001 measurement points
• Complex reference impedance for balanced matching
• Flexible marker value display function
• User preset
• User recovery
• 13/16-port configurable test set control function
More info at:
kobemktg.jpn.agilent.com/field_eng/product/ena/customer_viewable/index.htm
安捷倫科技高頻元件量測研討會
Page 8
Feb.23, 2006
4
Agenda
Overview of PNA FW Rev. 6.0
Cal Registers
TRL Calibration with 4-port 20 GHz PNA-L
Unknown Thru Calibration
Offset Load Cal
Fixture And Probe Techniques
• Auto port extensions
• Embedding/de-embedding
• Frequency Converter Applications – SMC
• Measuring fixtures/probes
Q&A
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 9
Old Calibration Paradigm
All calibrations were saved in a “calibration set”
“.cst” file pointed to data in a calibration set, but did NOT contain
calibration data itself
“.cal” files contained calibration data but NOT instrument
parameters
Saves instrument state using current state name
(does not automatically select a .cst file if current state is .sta)
Old file save dialog
Opens a file dialog box to save instrument state with
a new file name (choose .sta or .cst)
Saves instrument state with an auto-incremented name that
won’t overwrite existing states (e.g. “at004.cst”)
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Feb.23, 2006
5
New Calibration Paradigm
Cal Registers
• Each channel has its own cal register
• All cal data is saved to the channel cal register
• Data in cal register is “temporary” –
data is saved on hard drive, BUT will be
overwritten by the next calibration in that channel
User Cal Sets
• Old “Cal Sets” are now called “User Cal Sets”
• User must manually save data to a User Cal Set
• User cal sets are stored on the hard drive as before
You no longer have a choice
to save an instrument state!
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Feb.23, 2006
Page 11
Cal Registers Should Be Familiar…
Cal register model is similar to that used in 8720s and 8510s
Cal registers prevent accumulation of unneeded cal sets
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Feb.23, 2006
6
Old Calset File Location
All calset data was contained in this file
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Feb.23, 2006
New Cal File Locations
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Feb.23, 2006
7
Saving Instrument States and Cal Data
*.cst - save instrument state and reference pointer to the cal set data
• data could be in cal register (not recommended)
New!
• data could be in a user cal set (recommended)
*.csa - save instrument state and actual cal data (cal/state archive)
*.sta - save instrument state ONLY (no calibration data)
*.cal - save actual calibration data ONLY (no instrument state)
安捷倫科技高頻元件量測研討會
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Page 15
Instrument States and Cal Data
Pointer to Calset
• Name
• Description
• GUID
Extended Instrument State
.cst
•
•
•
•
•
Channels/Traces
Windows
Triggering
Format
Scale
•
•
•
•
•
Averaging
Markers
Math/memory
Limits
More…
.sta
Limited Instrument State
•
•
•
•
•
Frequency range
Number of points
IF bandwidth
Sweep type
Sweep mode
•
•
•
•
•
Alternate sweep
Port powers
Source attenuators
Receiver attenuators
Testset map
•
•
•
•
•
•
Reflection tracking (1,1)
Reflection tracking (2,2)
Source match (1,1)
Source match (2,2)
Transmission tracking (1,2)
Transmission tracking (2,1)
.cal
Error Terms
•
•
•
•
•
•
Crosstalk (1,2)
Crosstalk (2,1)
Directivity (1,1)
Directivity (2,2)
Load match (1,2)
Load match (2,1)
.csa
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Feb.23, 2006
8
Receiver calibration
Receiver calibration gives corrected absolute power reading (for
unratioed traces as opposed to an S-parameter traces)
Often used with FOM for measurements like harmonics, TOI
Uses power-meter-corrected internal source as a reference
(source power cal)
Now saved as a cal set
New!
Multiple receiver cals requires
separate channels for each cal
Source power calibrations
• No change from current behavior
• Saved as part of instrument states
• Not saved in cal sets
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Feb.23, 2006
Page 17
Correction Indicator on Status Bar
Symbol
C
C*
C∆
No Cor
Correction level
Full
Interpolated
Changed
No correction
Accuracy
Highest
Uncertain
Uncertain
Lowest
C - Full correction
“C” is displayed immediately after a calibration is performed
or when a valid Cal Set is applied. If you require optimum
accuracy, avoid adjusting the analyzer’s settings after calibration.
C* - Interpolated correction
"C*" appears in the status bar when interpolation is used during a measurement.
C∆ − Changed settings
"C∆" appears in the status bar when one or more of the following stimulus settings change. The
resulting measurement accuracy depends on which parameter has changed and how much it has
changed. For optimum accuracy, recalibrate using the new settings.
• Sweep time
• IF bandwidth
• Port power
• Stepped sweep enabled/disabled
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Feb.23, 2006
9
Agenda
Overview of PNA FW Rev. 6.0
Cal Registers
TRL Calibration with 4-port 20 GHz PNA-L
Unknown Thru Calibration
Offset Load Cal
Fixture And Probe Techniques
• Auto port extensions
• Embedding/de-embedding
• Frequency Converter Applications – SMC
• Measuring fixtures/probes
Q&A
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 19
TRL Calibration with 4-port 20 GHz PNA-L’s
Yes, it can be done! (requires firmware A.05.25 and later)
Is “true” TRL calibration, not an approximation like TRL*
Two-step (two-tier) calibration process:
Why 2 steps?
• Step 1: “Delta Match” calibration
• Step 2: Normal TRL calibration
What is a “Delta Match” cal?
• characterizes the difference (delta) between the source match
and load match of each port of the VNA
• allows a VNA having a single reference receiver to
perform TRL-style calibrations (including Unknown-Thru)
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Feb.23, 2006
10
Assumptions for TRL (and Unknown Thru)
8-term error model assume match at each test port remains
constant, independent of whether it is a source or receiver
With real hardware, assumption is poor due to port switch
Generalized S-parameters for a two-port device:
 S 11
 S 21

 b11
S 12   a11
=
S 22   b 21
 a11
b12  
1
a 22  • 
b 22   a 21
 
a 22   a11
Ideal S-parameters
a12 
a 22 

1 

−1
b1
a1
a2
b2
Note: a11 = a1f ; a12 = a1r
Switch correction
a21 = a2f ; a22 = a2r
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Feb.23, 2006
Page 21
Two-Port Four-Receiver VNAs (like PNA)
Dual reflectometers replaced by splitters and 3-port couplers
Incident wave detection is still after the port switch
Switch corrections a12/a22 and a21/a11 can be directly measured
RF Source
LO
R1
A
Test port 1
R2
B
Test port 2
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Feb.23, 2006
11
Single Reference Receiver VNAs (like 4-Port PNA-L)
Reference receiver is prior to port switch
Switch corrections cannot be directly measured
TRL* ignores switch correction terms by setting them to zero
R
A
B
 b11
 S 11 S 12   a11
≅
 S 21 S 22  b 21
 

 a11
D
C
b12 
−1
a 22  • 1 0



b 22 0 1

a 22 
TRL* sets switch correction to zero
Test port 1
Test port 2
Test port 3
Test port 4
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Alternative to Measuring Switch Corrections
Instead of ignoring the switching terms, we can characterize the
match differences and then apply them during the TRL cal
To do so, we can restate the switch correction terms:

1
 a 21

 a11
−1
a12 

1

a 22 = 

 b 21 a 21

1 

 a11 b 21
−1
b12 a12 


 1
a 22 b12
 =  b 21
 Γf
1 

 a11
Gf and Gr are “delta-match” terms, and they
can be derived from an SOLT calibration
b12 
Γr
a 22 

1 

−1
SHORT
SHORT
OPEN
OPEN
LOAD
LOAD
Thru
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Feb.23, 2006
12
Delta Match Cal
Delta match cal characterizes internal match differences,
so it can be performed…
• with mixed connector types
• with or without test port cables, in any combination
• with adapters that can remain or be removed for subsequent TRL cals
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When is Delta Match Used?
Cal Method
SOLT - Known Thru
(Includes Flush-Thru, Known-Thru and Minimized Thru)
SOLT - Adapter Removal
SOLT - Unknown Thru
TRL - Known Thru
TRL - Adapter Removal
ECal Internal Thru
ECal Unknown Thru
Uses Delta Match?
No
No
Yes
Yes
Yes
No
Yes
Definitions
• Flush thru: insertable, zero-length
• Known thru: characterized (all 4 S-parameters)
• Unknown thru: reciprocal (S21=S12); usually low-loss and well matched
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Feb.23, 2006
13
Two Ways to Perform the Delta-Match Calibration
Global Delta Match
• Covers entire frequency range of instrument
• Interpolation used for TRL cals with smaller spans and/or less points
• Only one global delta match cal set can exist at a time
• Future: considering providing factory global delta match cal set
User Delta Match
• Perform a non-TRL calibration, such as mechanical SOLT, SOLR or ECal
• Save data as a normal user cal set
• Frequency range and number of points must be identical to that of the follow-on
TRL calibration
• Interpolation is not used during the calibration, but can be used for measurements
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Feb.23, 2006
Performing the Global Delta Match Cal
Default Settings:
Points: 1601
IF BW: 100 Hz
Freq: 300 kHz 20.1 GHz
User cannot change
these settings!
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Feb.23, 2006
14
Performing the Global Delta Match Cal
• Select DUT connectors (the only choice you
have is in choosing the “DUT Port 1” connector)
• Add adapters to match those shown in the table
• ECal provides the easiest solution,
especially with the new 4-port
20 GHz module (N4432/3A)
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Using 2-Port ECal Modules
Note: when using a 2-port ECal module to
perform the Global Delta Match calibration,
you must use an N4691B (300 kHz – 26.5 GHz)
With a 2-port ECal, it only takes two steps to complete the cal!
Step 1 of 2: connect ECal to ports 1 and 2
Step 2 of 2: connect ECal to ports 3 and 4
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Feb.23, 2006
15
User Delta Match
Instead of selecting the Global Delta Match
CalSet, select an available user CalSet that
matches the current stimulus conditions
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Performing the TRL Calibration
Calibration > Calibration Wizard
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Feb.23, 2006
16
Performing the TRL Calibration
Use dropdown menu to select connectors.
Appropriate cal kits should appear
based on connector type. Use
dropdown menu to select Cal Kit.
Select this
and the
following
screen will
appear.
Otherwise,
the default uses the existing Global Delta Match Cal.”
Here, as a test case, we created a cal kit definition using “probe” as
connector type. In this cal kit, we defined Short, Thru and Line
standards. Plus, we have given them TRL class assignments.
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Performing the TRL Calibration
Default is “minimum thru’s” (known bug: TRL always measures all paths, regardless of the
status of this box)
Select to modify thru path
choices and cal standards.
Select this to choose the “delta match” calset.
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17
Performing the TRL Calibration
• Selecting “Mod Stds” brings up this screen
• In this case, the default is TRL with Defined Thru
• If you select another thru choice, then cal type will be SOLT
• Generally, you do not need to select “View/Modify”
Click here to view class assignments
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Performing the TRL Calibration
Selecting “Choose Delta Match” brings up this screen
• All cal sets will appear, but not all will work for delta match
• Highlight the file you want and click OK
• If you pick a “bad” user
cal set, you get this error:
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Feb.23, 2006
18
Performing the TRL Calibration
• At this point, the calibration should start.
• Based on the “probe” cal kit we created, we went through the
following steps for a 3-port TRL cal:
Step 1 of 9, short to port 1
Step 2 of 9, short to port 2
Step 3 of 9, thru between ports 1 and 2
Step 4 of 9, line between ports 1 and 2
Step 5 of 9, short to port 3
Step 6 of 9, thru between ports 1 and 3
Step 7 of 9, line between ports 1 and 3
Step 8 of 9, thru between ports 2 and 3
Step 9 of 9, line between ports 2 and 3
9
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What About Calibrating On-Wafer?
Because delta-match cal can be performed at any interface,
on-wafer customers have the following options:
• Use ECal (or mechanical cal kit) at the end
of the cables, before connecting to the probes
(probes tend to have female connectors, so
simply add adapters to make up two pairs of
insertable cals)
• Use the probes with a 4-port with SOLT ISS
Cascade’s WinCal 2006
• Will not support 4-port TRL calibrations initially
• Allows advanced 2-port calibrations, such as the LRRM family
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Feb.23, 2006
19
Frequently Asked Questions
Can I perform a 4-port TRL calibration?
-- Yes, simply follow the same steps covered in this presentation
Is TRL calibration limited to only 2 ports?
-- No, it can be used with 3- or 4-port calibrations as well
Can I perform a 4-port TRL calibration on-wafer? -- Yes
Since the 4-port 20 GHz PNA-L has only one reference receiver, do I
need a hardware upgrade before I can perform a TRL calibration?
-- No, the 2-step calibration process does NOT require any
hardware upgrade, but may require a firmware upgrade
Since the 4-port 20 GHz PNA-L has only one reference receiver, does
this mean we can only do TRL*?
-- No, the 2-step cal process provides true TRL calibration
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TRL Summary
PNA’s & 2-port PNA-L’s with
TRL – directly measure
dedicated two reference receivers “switch correction” terms
(incident wave detectors occur
after the switch)
Legacy 872x family with one
reference receiver (switch occurs
after the incident wave detector)
TRL* – ignore “switch
correction” terms
4-port 20 GHz PNA-L with one
reference receiver (switch occurs
after the incident wave detector)
TRL – first characterize the
match differences with delta
match cal and then use them
during TRL calibration
New application note:
On-Wafer Calibration Using a 4-Port 20 GHz PNA-L, 5989-2287EN
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Feb.23, 2006
20
Agenda
Overview of PNA FW Rev. 6.0
Cal Registers
TRL Calibration with 4-port 20 GHz PNA-L
Unknown Thru Calibration
Offset Load Cal
Fixture And Probe Techniques
• Auto port extensions
• Embedding/de-embedding
• Frequency Converter Applications – SMC
• Measuring fixtures/probes
Q&A
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Unknown Thru – Agilent’s Secret Weapon!
“Unknown Thru” (aka SOLR) algorithm is useful for
both insertable and non-insertable calibrations
Traditional non-insertable methods:
• Swap equal adapters
• Use characterized thru (S-parameters known)
• Perform adapter removal cal
• Add adapters after cal, then, during measurement…
– use port extensions
– de-embed adapters (S-parameters known)
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21
Compromises of Traditional Methods
Swap equal adapters
• Need phase matched adapters of different sexes (e.g., f-f, m-f)
• Error results from loss and mismatch differences of adapters
Use characterized thru
• Multi-step process
• Need a non-insertable cal to measure S-parameters of characterized thru
Perform adapter removal cal
• Accurate but many steps in calibration (two 2-port calibrations)
Add adapters after cal, then, during measurement…
• Use port extensions – doesn’t remove adapter mismatch effects
• De-embed adapters (S-parameters known) – similar to characterized thru
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Non-Insertable ECal Modules
ECal resolves many, but not all non-insertable situations
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Feb.23, 2006
22
Unknown Thru to the Rescue!
Unknown Thru calibration makes
2-port calibrations much easier!
No need for matched or
characterized thru adapters!
Works great for
• Non-insertable calibrations
• Fixed port positions
• Physically looooooooong DUTs
• Port orientations that are not in-line
Note: Unknown Thru only
works with guided calibrations
• Multiport devices
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Unknown Thru Algorithm
Unknown thru algorithm uses “TRL” 8-term error model
α
a1m
EDF
b1m
a1m
b1m
S11
ESF
ERF/α
S21
a1
b1
b2
a1
[A]
ESR
S22
S12
a2
b2m
EDR
β
b2
[T]
b1
ERR/β
[B]
a2
a2m
b2m
a2m
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23
Unknown Thru Calibration Requirements
Systematic errors of all test ports (directivity, source match,
reflection tracking) can be completely characterized
“Unknown thru” calibration standard:
• Must be reciprocal (Sij = Sji)
• Phase known to within a quarter wavelength
VNA signal-path switch errors can be quantified
• Requires dual reflectometers on all ports
(e.g., a 2-port 4-receiver VNA) OR
• Requires delta-match correction
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Two-Port Unknown Thru Calibration Sequence
Measure open, short, load on port 1
Measure open, short, load on port 2
Measure insertable adapter (unknown thru)
between ports 1 and 2
Confirm estimated electrical
delay of unknown thru
Unknown thru
Unknown Thru calibration is performed
just like a “flush thru” 2-port calibration!
1-port calibrations
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Feb.23, 2006
24
Measuring Physically Long Devices (Usual Way)
CABLE MOVEMENT
DUT
2-PORT
CALIBRATION PLANE
2-PORT
CALIBRATION PLANE
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Cable Movement Error
Cable Movement Drift Error
0.00
-0.02
-0.04
-0.06
dB
-0.08
Good Cable
-0.10
Bad Cable
-0.12
-0.14
-0.16
-0.18
-0.20
0.00
5.00
10.00
15.00
20.00
25.00
30.00
Frequency
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Feb.23, 2006
25
Measuring Physically Long Devices (Unknown Thru)
Unknown thru
1-PORT
CALIBRATION PLANES
No cable movement!
DUT
2-PORT
CALIBRATION PLANES
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Page 51
Measuring Devices with Non-Aligned Ports
(Usual Way)
CABLE MOVEMENT
DUT
2-PORT
CALIBRATION PLANE
2-PORT
CALIBRATION PLANE
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26
Measuring Devices with Non-Aligned Ports
(Unknown Thru)
DUT
Unknown thru
1-PORT
CALIBRATION PLANES
2-PORT
CALIBRATION PLANES
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Multiport and Non-Aligned Case (Usual Way)
2-PORT
CALIBRATION PLANE
2-PORT
CALIBRATION PLANE
CABLE MOVEMENT
A
3 PORT DEVICE
B
DUT
C
L
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27
Multiport and Non-Aligned Case (Usual Way)
2-PORT
CALIBRATION PLANE
CABLE MOVEMENT
CABLE MOVEMENT
CABLE MOVEMENT
C
B
DUT
L
A
B
L
OR
A
C
C
DUT
DUT
B
A
3 PORT DEVICE
L
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Multiport and Non-Aligned Case (Unknown Thru)
B
A
ANY THRU DEVICE
1-PORT
CALIBRATION PLANES
3 PORT DEVICE
DUT
C
L
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Feb.23, 2006
28
Multiport and Non-Aligned Case (Unknown Thru)
B
A
1-PORT
CALIBRATION PLANES
B
A
DUT
C
C
3-PORT
DEVICE
ANY RECIPROCOL
3-PORT THRU
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Page 57
Multiport Unknown Thru with Different Connectors
Port 1
Different connector
on each port
Port 2
1-port calibrations, ECal or mechanical
Port 3
Port N
Port 1
Port 2
Finish multiport cal
using unknown thru’s
Port 3
Port N
Unknown thru’s (adapters)
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29
On-Wafer Calibrations Using Unknown Thru’s
Port 1
Port 2
Straight Thru’s
TRL on-wafer cal
Port 3
Port 4
and/or
Port 1
Port 2
Port 3
Port 4
Imperfect thru’s
Unknown thru’s
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Unknown Thru and Adapter Removal Compared
1.85 f-f adapter comparison
0.00
-0.03
-0.05
Magnitude dB
-0.08
-0.10
-0.13
-0.15
-0.18
-0.20
-0.23
-0.25
0.00
10.00
20.00
30.00
40.00
50.00
60.00
70.00
Frequency GHz
1.85 adapter removal cal
1.85 unknown thru cal
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30
Unknown Thru and Flush Thru Compared
Long (Aspect Ratio) Device, 3.5 inch x 1 mm cable, Test Comparison
0.0
-0.2
Magnitude (dB)
-0.4
-0.6
-0.8
-1.0
-1.2
-1.4
0.0E+00
2.0E+01
4.0E+01
6.0E+01
8.0E+01
1.0E+02
Frequency in GHz
Unknown Thru
Flush Thru
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Unknown Thru For Different Waveguide Bands
Watch out for these potential problems:
1. Non-overlapping waveguide bands
2. Attenuation near cutoff may be too high for thru calibration
3. Higher-order modes
(longer adapters better attenuate undesired modes)
Band X
Band Y
Tapered or
stepped adapter
Long enough?
Higher cutoff frequency
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31
Known Thru Versus Unknown Thru
Known Thru
Unknown Thru
Requires data or model and
VERY stable device
Requires S21=S12
Can not use any device
Any passive device OK
Accuracy sensitive to ED, ES,
S-parameter errors and thru S21
Accuracy sensitive to ES and ER errors
S-parameters can change
NA
Characterization error sensitive
to cable movement stability
NA
Requires periodic calibration
NA
Can not tolerate bad connection
Bad connection not a problem
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Agenda
Overview of PNA FW Rev. 6.0
Cal Registers
TRL Calibration with 4-port 20 GHz PNA-L
Unknown Thru Calibration
Offset Load Cal
Fixture And Probe Techniques
• Auto port extensions
• Embedding/de-embedding
• Frequency Converter Applications – SMC
• Measuring fixtures/probes
Q&A
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Feb.23, 2006
32
Offset Load Calibration Overview
Offset load calibration originated with 8510
Offset load is a compound standard – load is connected multiple
times with differing offsets
In simplest and most common form, there are just two connections:
the load by itself, and the load with an offset
Similar to a sliding load standard, except
offsets are set by a known, precise
transmission line (e.g., a waveguide section)
Not the same as a load standard
with defined delay, which is a
single standard
Load
offset
Offset (shim)
1. Measure load by itself
2. Measure load plus offset
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Offset Load Calibration Advantages
Provides higher directivity and load match accuracy when the definition of the
offset is better known than the load definition
Does not require a dual reflectometer VNA as it uses SOLT error model
instead of TRL error model
Ideal for 1-port calibrations
Also helpful in situations where calibration planes cannot physically move,
such as fixed probe or waveguide positions, where TRL calibrations are
difficult
Offset standard can include
loss term (especially valuable
near cutoff
frequency)
Probe
Probe
Probe
Probe
Attenuation constant
in WR-159 waveguide
Not a good
TRL standard
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33
Offset Load Definition
Only available in guided calibration (SmartCal)
Math is enhanced over what 8510 did
New FW added offset load standards to waveguide cal kits
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Feb.23, 2006
Offset Load Class Assignments
SmartCal uses as many standards as it needs to complete
calibration, based on frequency range of standards
In this case, only offset load is used
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Feb.23, 2006
34
Thru Loss Definition
Enter waveguide loss here (different
model than coaxial loss model)
8510 did not use loss term
PNA includes loss for better
accuracy, especially near cutoff
and with poor raw source match
offset loss (waveguide) =
µo = free space permeability
fc = waveguide cut off frequency
p = resistivity of waveguide metal
h = waveguide height (short dimension)
v = velocity of light
er = permitivity of dielectric (usually air)
πµofcρ  v 
h
×

 er 
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Page 69
Waveguide Connector Definition
New!
When defining waveguide cal kits,
be sure to set Media to WAVEGUIDE
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Feb.23, 2006
35
Agenda
Overview of PNA FW Rev. 6.0
Cal Registers
TRL Calibration with 4-port 20 GHz PNA-L
Unknown Thru Calibration
Offset Load Cal
Fixture And Probe Techniques
• Auto port extensions
• Embedding/de-embedding
• Frequency Converter Applications – SMC
• Measuring fixtures/probes
Q&A
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Page 71
Error Correction Choices
Direct
Measurement
Modeling
Port extensions
have gone APE!
Port
Extensions
Normalization
(response cal)
De-embedding
Full 2/3/4-port corrections
(SOLT, TRL, LRM...)
Easier
Difficulty
Harder
Lower
Accuracy
Higher
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Feb.23, 2006
36
APE = Automatic Port Extensions
1st
• First solution to apply both electrical delay
and insertion loss to enhance port extensions
• First approach to give reasonable alternative to building
in-fixture calibration standards or de-embedding fixture
APE accounts for loss
and phase of fixture
transmission lines
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Page 73
Automatic Port Extensions – Step 1
• First, perform coaxial calibration at fixture connectors to remove errors
due to VNA and test cables
• At this point, only the fixture loss, delay and fixture mismatch remain
as sources of error.
Coaxial calibration
reference planes
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Feb.23, 2006
37
Automatic Port Extensions – Step 2
• After coaxial calibration, connect an open or short to portion of fixture
being measured
• Perform APE: algorithm measures each portion of fixture and computes
insertion loss and electrical delay
• Values calculated by APE are entered into port extension feature
• Now, only fixture mismatch remains as source of error
(dominated by coaxial connector).
Coaxial calibration
reference planes
Open or short
placed at end of each
transmission line
Ports
extended
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Page 75
Measurement Results
With Automatic
Port Extension
Delay & loss compensation
(values computed by APE)
Without
Automatic Port
Extension
Balanced
DUT
“Quattro”
demo
board
Balanced
Unbalanced
Balanced
Opens UnbalancedShorts
Unbalanced
Stepped Impedance
Adjacent
Structure
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Feb.23, 2006
38
Automatic Port Extension – Implementation
Measures Sii (reflection) of each port
Uses ideal open or short models
Computes electrical delay using best-fit straight-line model
Computes insertion loss using a best-fit dielectric loss model
• Default setting uses frequencies in Active Channel Stimulus
(results in loss at two frequencies)
• Active Marker choice uses frequency at Active Marker
(results in loss at one frequency only)
Computed delay & loss values are automatically displayed via
new port-extension tool bar
Values can be saved as part of instrument state or recorded
for manual insertion next time
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How is the Loss Term Calculated?
Loss is calculated for each frequency data point (f) as follows:
If Use1 is checked and NOT Use2 then:
• Loss(f) = Loss1 * (f/Freq1) ^ 0.5 (coaxial loss model)
If Use1 AND Use2 are checked, then:
• Loss(f) = Loss1 * (f/Freq1) ^ n (printed circuit board dielectric loss model)
• Where n = log10 [abs(Loss1/Loss2)] / log10 (Freq1/Freq2)
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39
Which Standards Should I Use?
For broadband applications, shorts or opens work equally well
Choose the most convenient standard (often an open) –
this is a key benefit of Automatic Port Extensions!
Will using both an open and a short improve accuracy?
• Using two standards makes little difference for broadband applications, as
many ripples occur and calculated loss is the same for open or short
• Using two standards improves accuracy
for narrowband applications, where a full
ripple cycle does not occur
short
Calculated loss is basically
same for open or short
open
Broadband
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Page 79
Broadband APE Example
APE with short
APE with open
Very little difference up to 10 GHz
DUT = short
No port extension applied
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Narrowband APE Example
APE with short
APE with open
Large variation between
open and short
APE with both
open and short
DUT = short
400 MHz span
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Adjusting for Mismatch
Don’t adjust for
mismatch
Adjust for mismatch
No port extension
applied
Adjusting for mismatch
keeps reflection below 0 dB
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Active Span or Active Marker
APE using active marker
APE using active span
Note: when using active marker, selecting or not
selecting “adjust for mismatch” makes no difference
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Loss at DC
Offsets the entire freq span to account for a fixed loss (e.g. 3 dB attenuator)
Use positive value to compensate for loss added after APE
Fixture and 3 dB pad with
DC loss compensation
Fixture, no pad
Fixture and 3 dB pad
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42
Summary of Automatic Port Extensions
1st
Ideal for in-fixture applications where
complete calibration standards are not available
Eliminate the need to design and build difficult load standards
50
Applicable to a wide range of fixture designs
Works with probes too
Easy to use and quick to get results
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Agenda
Overview of PNA FW Rev. 6.0
Cal Registers
TRL Calibration with 4-port 20 GHz PNA-L
Unknown Thru Calibration
Offset Load Cal
Fixture And Probe Techniques
• Auto port extensions
• Embedding/de-embedding
• Frequency Converter Applications – SMC
• Measuring fixtures/probes
Q&A
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Fixturing for the Masses
Fixturing features are same or similar to 4-port PNA-L, ENA, and PLTS
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Order of Fixturing Operations
First, single-ended functions
are processed in this order:
• Port extensions
• 2-port de-embedding
• Port Z (impedance) conversion
• Port matching / circuit embedding
• 4-port network embed/de-embed
Then, balanced functions are
processed in this order:
Example circuit simulation
• Balanced conversion
• Differential- / common-mode port Z conversion
• Differential matching / circuit embedding
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Port Matching
Port matching feature
is same as embedding
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Feb.23, 2006
Differential Port Matching
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Port Z (Impedance) Conversion
Zs
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Differential Port Z (Impedance) Conversion
Zs
Zs
Zs
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46
2-Port De-Embedding
1
.s2p file
Fixture A
2
DUT
2
.s2p file
1
Fixture B
If “Fixture B” is measured in the
forward direction, the columns in
the .s2p file must be swapped:
S11
S22
S21
S12
In all cases, the assumption is:
• Port 1 of the fixture is connected to the PNA
• Port 2 of the fixture is connected to the DUT
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4-Port Embedding/De-Embedding
For two-port
balanced devices
For one-port
balanced devices
For balanced to
single-ended devices
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Two Versus Four Port Embedding / De-Embedding
Question: On a balanced port, what is the difference between:
• Two .s2p embedding/de-embedding files
• One .s4p embedding/de-embedding files
Answer: Crosstalk terms!
2
.s2p file
2
DUT
PNA
1
.s2p file
Cannot simulate fixture leakage
between PNA ports 1 and 2
PNA
DUT
.s4p file
1
Can use full leaky model
to simulate fixture
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Feb.23, 2006
Don’t Forget to Turn Fixturing On!
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Feb.23, 2006
48
On-wafer SMC Measurements
Previous versions of FCA (Option 083) did not allow
on-wafer measurements using Scalar Mixer Cal (SMC)
A.06.xx allows embedding of probe data files during SMC
Perform power-meter and S-parameter calibrations in coax
After coax calibrations, reference plane is at probe tip
Power-meter and
S-parameter
calibration plane
.s2p
data
Extended (de-embedded)
measurement plane
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Agenda
Overview of PNA FW Rev. 6.0
Cal Registers
TRL Calibration with 4-port 20 GHz PNA-L
Unknown Thru Calibration
Offset Load Cal
Fixture And Probe Techniques
• Auto port extensions
• Embedding/de-embedding
• Frequency Converter Applications – SMC
• Measuring fixtures/probes
Q&A
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Feb.23, 2006
49
How Do I Get My Probe De-Embedding Data?
Perform an SOLT or TRL cal using wafer probes
Measure thru device and save data in .s2p file for deembedding in later step
Measure thru after
2-port calibration
Probe
Thru
Probe
2-port calibration
planes
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How Do I Get My Probe De-Embedding Data?
Perform an adapter removal calibration using coaxial and onwafer standards
“Adapter”
2-port
cal
Probe
Probe
coaxial cal
Probe
2-port
cal
Probe
wafer cal
Final 2-port
calibration planes
Probe
Probe
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How Do I Get My Probe De-Embedding Data?
Measure thru plus probe
De-embed swapped thru data to obtain probe data
Save probe data in .s2p file for later use in measuring DUTs
Repeat for other probe(s) if desired
2-port calibration
planes
Probe
Thru
Probe
1
DUT
.s2p file
2
De-embed swapped
thru data from DUT
data to get probe data
DUT
2
.s2p file
1
Probe
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Alternate Way to Get Probe + Thru Data
Perform unknown thru cal in coax and with probe
Measure thru plus probe
De-embed swapped thru data to obtain probe data
Save probe data in .s2p file for later use in measuring DUTs
Repeat for other probe(s) if desired
2-port calibration
planes
Probe
Thru
Probe
1
Unknown thru and DUT
De-embed swapped
thru data from DUT
data to get probe data
.s2p file
2
DUT
2
.s2p file
1
Probe
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Feb.23, 2006
51
How Do I Get My Fixture De-Embedding Data?
Perform an unknown thru cal using coax on one side, a probe on
the other side, and the fixture itself for the unknown thru
Measure the fixture section and save data as .s2p file
Repeat for each section of fixture
2-port calibration
planes
Probe
Unknown thru
and DUT
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52
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Issued date : 06/2005
Printed in Taiwan
02/2006
5989-4862ZHA