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Project No. : LBE081805
LCD Monitor
MG32PS
4.10 Voltage dips, short interruptions and voltage variations
The EUT is tested for each selected combination of test levels and duration with a sequence of tree
dips/interruptions with intervals of 10 s minimum (between each test event).
Each representative mode of operation shall be tested. Abrupt changes in supply voltage shall occur at zero
crossings of the voltage waveform. The basic test procedure was in accordance with IEC 61000-4-11.
Performance criteria
Environmental
phenomenon
Voltage dips
Voltage interruptions
Test
specification
Units
>95
0,5
30
25
Performance
criteria
Remarks
B
% reduction periods
>95
250
C
See NOTE
C
[NOTE] Changes to occur at 0 degree crossover point of the voltage waveform.
4.10.1 Test instrumentation
Test instrumentation used in the Voltage dips, short interruptions and voltage variations test was as follows:
Serial or
Calibration
Test
Model name
Manufacturer
Firmware
Interval
instrumentation
date
(No./Ver.)
(Month)
PFS503/63A
PFS 503
EM TEST
2007-06-16
12
-0513100236
Voltage Dip &
Interruption
PLINE 1610
HAEFELY
083690-21
2008-05-13
12
-62/65This report must not be reproduced, except in full, without written permission from SEC EMC Laboratory.