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Figure 5.0-1: Programming IC Adapter Modules
5.3
HBM (Method 3015.7, ANSI/ESD-STM5.1 & JESD22-A114-B)
A sample of devices shall be characterized for the device ESD failure
threshold using voltage steps of 500. 1000, 2000 and 4000 Volts as a
minimum. Finer voltage steps may optionally be used to obtain a more
accurate measure of the failure voltage. Testing may begin at any voltage
step, except for devices which have demonstrated healing effects, including
those with spark gap protection, which shall be started at the lowest step.
Cumulative damage effects may be eliminated by retesting at the failure
voltage step using a new sample of devices starting at one or two voltage
steps lower than the failure threshold.
5.3.1 Control Settings
Initially select the LO Range, + Polarity and adjust the level to 500
Volts. Select the AUTO Mode and set the number of DISCHARGES to
3 and the INTERVAL (cool down period) to a minimum of 1 second.
5.3.2 Testing Procedure
Refer to the appropriate test standard being used to establish the
correct testing protocol (starting voltage, number of discharges, pin
combinations, etc).
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