Download SigmaGT MI 3310 / MI 3310A Instruction Manual

SigmaGT
MI 3310 / MI 3310A
Instruction Manual
Version: 1.2, Code no. 20 751 671
Distributor:
Manufacturer:
Metrel d.d.
Ljubljanska cesta 77
SI-1354 Horjul
E-mail: [email protected]
http://www.metrel.si
© 2010 Metrel
Mark on your equipment certifies that this equipment meets the requirements of the
EU (European Union) regulations concerning safety and electromagnetic
compatibility
No part of this publication may be reproduced or utilized in any form or by any means
without permission in writing from METREL.
2
MI 3310 / MI 3310A SigmaGT
1
General description ............................................................................................6
1.1
1.2
1.3
1.4
1.5
2
Table of contents
Warnings ...........................................................................................................7
Warning markings on connector panel ..............................................................7
Standards applied .............................................................................................7
Battery and charging .........................................................................................8
New battery cells or cells unused for a longer period ........................................9
Instrument description .....................................................................................11
2.1
Front panel ......................................................................................................11
2.2
Connector panels ............................................................................................12
2.3
Safety pre-tests ...............................................................................................13
2.4
Warnings, messages and symbols..................................................................14
Warnings and messages ........................................................................................14
Warning symbols ....................................................................................................17
PASS /FAIL indication ............................................................................................17
Battery and mains supply indication .......................................................................18
Bluetooth indication ................................................................................................18
Alpha-numeric entry indication ...............................................................................18
3
Technical specifications...................................................................................19
3.1
Earth bond resistance......................................................................................19
3.2
Insulation resistance, Insulation – S resistance...............................................19
3.3
Subleakage current, Subleakage – S current ..................................................20
3.4
Differential leakage current..............................................................................20
3.5
Power / Functional test ....................................................................................20
3.6
Touch leakage current.....................................................................................21
3.7
Polarity test......................................................................................................21
3.8
Clamp current..................................................................................................21
3.9
PRCD and RCD testing ...................................................................................22
3.9.1
Portable RCD trip-out time .......................................................................22
3.9.2
General RCD Trip-out time.......................................................................22
3.10 Calibration unit – checkbox (optional) .............................................................23
3.11 General data....................................................................................................23
4
Main menu and test modes ..............................................................................25
4.1
Help menus .....................................................................................................25
4.2
Instrument main menu.....................................................................................26
4.2.1
Autotest organizer menu ..........................................................................26
4.2.2
Autotest custom menu..............................................................................27
4.2.3
Project autotests menu.............................................................................27
4.2.4
Single test menu.......................................................................................28
4.2.5
Edit appliance data menu.........................................................................28
4.2.5.1 Users submenu ............................................................................................... 28
4.2.5.1.1 Name editing menu ................................................................................... 29
4.2.5.2 Device submenu ............................................................................................. 29
4.2.5.3 Test sites submenu ......................................................................................... 30
4.2.5.4 Locations submenu ......................................................................................... 30
4.2.6
4.2.7
4.2.8
Recall / delete / send memory menu ........................................................31
Data upload / download menu..................................................................31
Setup menu..............................................................................................32
3
MI 3310 / MI 3310A SigmaGT
4.2.8.1
4.2.8.2
4.2.8.3
4.2.8.4
4.2.8.5
4.2.8.6
4.2.8.7
4.2.8.8
4.2.8.9
4.2.8.10
4.2.8.11
5
Table of contents
Setting date and time ...................................................................................... 32
Language selection ......................................................................................... 33
Print header..................................................................................................... 33
Viewing of instrument data............................................................................. 34
Display contrast adjustment ............................................................................ 34
Instrument settings.......................................................................................... 35
Reset instrument settings................................................................................ 36
Communication settings................................................................................. 37
Wireless (Bluetooth) communication setup .................................................... 38
Password..................................................................................................... 39
Calibration unit – checkbox (optional) ......................................................... 40
Single tests ........................................................................................................42
5.1
Performing measurements in single test mode ...............................................42
5.2
Measurements.................................................................................................43
5.2.1
Earth bond resistance ..............................................................................43
5.2.2
Insulation resistance.................................................................................44
5.2.3
Insulation resistance – S probe ................................................................46
5.2.4
Substitute leakage current........................................................................48
5.2.5
Substitute leakage – S probe ...................................................................50
5.2.6
Differential leakage current ......................................................................52
5.2.7
Touch leakage current..............................................................................53
5.2.8
Polarity test ..............................................................................................55
5.2.9
Clamp current test ....................................................................................56
5.2.10 RCD/PRCD test........................................................................................59
5.2.10.1
5.2.10.2
5.2.11
6
RCD single test ........................................................................................... 60
Automatic RCD test..................................................................................... 60
Functional test ..........................................................................................62
Autotest sequences ..........................................................................................64
6.1
Autotest organisator – general menu ..............................................................64
6.1.1
Autotest organisator operation .................................................................66
6.1.2
Example of creating a test sequence with autotest organisator ...............67
6.2
Custom autotests ............................................................................................68
6.2.1
Viewing, modifying and saving an custom autotest ..................................68
6.2.1.1
6.2.1.2
Modification of an autotest sequence.............................................................. 69
Saving autotest sequences ............................................................................. 70
6.2.2
Deleting an existing custom test sequence ..............................................71
6.3
Project autotests..............................................................................................71
6.3.1
Selecting a project autotest ......................................................................72
6.3.2
Starting a project autotest ........................................................................74
6.3.3
Comparison of results (evaluation of result trends) ..................................74
6.4
Working with barcode / RFID tag.....................................................................76
6.4.1 Working with RFID tags .................................................................................77
6.4.2 Reading barcode for autotest ........................................................................79
6.4.3 Reading barcode for working with results ......................................................79
6.5
Performing autotest sequences.......................................................................79
6.5.1
Visual inspection ......................................................................................80
6.5.2
Earth bond resistance measurement........................................................80
6.5.3
Insulation resistance measurement..........................................................81
6.5.4
Insulation resistance – S probe measurement .........................................82
6.5.5
Substitute leakage current measurement.................................................82
4
MI 3310 / MI 3310A SigmaGT
6.5.6
6.5.7
6.5.8
6.5.9
6.5.10
6.5.11
6.5.12
7
Table of contents
Substitute leakage – S probe measurement ............................................83
Differential leakage current ......................................................................83
Touch leakage current measurement.......................................................84
Polarity test ..............................................................................................85
TRMS current measurement using clamp current adapter.......................85
RCD/PRCD test........................................................................................86
Power/ Functional test..............................................................................86
Working with autotest results ..........................................................................88
7.1
Saving autotest results ....................................................................................88
7.2
Recalling results ..............................................................................................89
7.3
Deleting results................................................................................................91
7.4
Downloading and printing results ....................................................................92
7.4.1
Send to barcode printer............................................................................94
7.5
Data upload / download...................................................................................95
8
Maintenance ......................................................................................................96
8.1
8.2
8.3
8.4
Periodic calibration ..........................................................................................96
Fuses...............................................................................................................96
Service ............................................................................................................96
Cleaning ..........................................................................................................96
9
Instrument set and accessories.......................................................................97
A
Appendix A – Preprogrammed autotests........................................................98
B
Appendix B – Autotest shortcut codes .........................................................104
C Appendix C – Country notes .................................................................................106
C.1 List of country modifications ..............................................................................106
F.2 Modification issues - NL .....................................................................................106
F.2.1 Autotest organizer .......................................................................................106
F.2.2
Example of creating a test sequence with autotest organizer ................107
F.2.3 Autotest codes.............................................................................................108
5
MI 3310 / MI 3310A SigmaGT
General description
1 General description
The multifunctional portable test instrument SigmaGT is intended to perform all
measurements for testing the electrical safety of portable electrical equipment. The
following tests can be performed:
-
Earth bond / continuity resistance,
Insulation resistance,
Insulation resistance of isolated accessible conductive parts,
Substitute leakage current,
Substitute leakage current of isolated accessible conductive parts,
Differential leakage current,
Touch leakage current,
IEC cord polarity test,
Leakage and TRMS load currents with current clamp,
Portable RCD test,
RCD test,
Functional test.
The instrument has a powerful test data management system. Autotests and single
tests can be stored (depending on the application) in approx. 6000 memory locations.
Some instrument's highlights:
-
Large graphic LCD display with resolution of 240 × 128 dots, with back-light,
Over 6000 memory locations in data flash memory for storing test results &
parameters,
Three communication ports (USB and 2 x RS232C) for communication with PC,
barcode reader, RFID reader/writer and printers,
Bluetooth communication with external printer and barcode reader (MI 3310A
only),
Soft touch keyboard with cursor keys,
Built in real time clock,
Built in calibration unit – checkbox (optional),
Fully compatible with new METREL PATLink PRO PC software package.
Powerful functions for fast and efficient periodic testing are included:
-
Pre-programmed test sequences,
Fast testing with barcode and/or RFID tag identification systems,
Test data can be uploaded from PC,
Comparisons between old and new test results can be performed on site,
Enables on site printing of test labels.
The operation of the unit is clear and simple – the operator does not need any special
training (except reading this instruction manual) to operate the instrument.
6
MI 3310 / MI 3310A SigmaGT
1.1
General description
Warnings
In order to reach high level of operator safety while carrying out various measurements
using SigmaGT instrument, as well as to keep the test equipment undamaged, it is
necessary to consider the following general warnings:
† Read this user manual carefully, otherwise use of the instrument may be
dangerous for the operator, for the instrument or for the equipment under test!
†
†
†
†
†
†
†
†
†
Warning on the instrument means »Read the Instruction manual with
special care to safety operation«. The symbol requires an action!
If the test equipment is used in manner not specified in this user manual the
protection provided by the equipment may be impaired!
Do not use the instrument and accessories if any damage is noticed!
Consider all generally known precautions in order to avoid risk of electric
shock while dealing with hazardous voltages!
Do not use the instrument in supply systems with voltages higher than
CAT II 300 V!
Use only standard or optional test accessories supplied by your distributor!
Use only correctly earthed mains outlets to supply the instrument!
In case a fuse has blown follow the instructions in this user manual to replace
it!
Instrument servicing and calibration is allowed to be carried out only by a
competent authorized person!
†
It is advisable not to run tested devices with load currents above 13 A for
more than 15 minutes. Load currents higher than 13 A can result in high
temperatures of main supply connector and fuse holders!
† Instrument contains rechargeable NiCd or NiMh battery cells. The cells should
only be replaced with the same type as defined on the battery placement label
or in this manual. Do not use standard alkaline battery cells while power
supply cable is connected, otherwise they may explode!
† If a test code with an earth bond test current not supported by the instrument
is selected the SigmaGT instrument will automatically perform the earth bond
test with lower test current (200 mA or 10 A). The operator must be competent
to decide if performing the test with lower test current is acceptable!
1.2
Warning markings on connector panel
Refer to chapters 2.1 Front panel and 2.2 Connector panels.
1.3
Standards applied
The SigmaGT instrument is manufactured and tested according to the following
regulations, listed below.
Electromagnetic compatibility (EMC)
EN 61326-1
Electrical equipment for measurement, control and laboratory use -
7
MI 3310 / MI 3310A SigmaGT
General description
EMC requirements -- Part 1: General requirements
Class B (Portable equipment used in controlled EM environments)
Safety (LVD)
Safety requirements for electrical equipment for measurement,
EN 61010-1
control, and laboratory use – Part 1: General requirements
Safety requirements for electrical equipment for measurement, control
and laboratory use - Part 031: Safety requirements for hand-held
EN 61010-031
probe assemblies for electrical measurement and test
Safety requirements for electrical equipment for measurement,
control, and laboratory use - Part 2-032: Particular requirements for
hand-held and hand-manipulated current sensors for electrical test
EN 61010-2-032 and measurement
Functionality
Testing and measuring equipment for checking the electric safety of
VDE 0404-1
electric devices - Part 1: General requirements
Testing and measuring equipment for checking the electric safety of
electric devices - Part 2: Testing equipment for tests after repair,
VDE 0404-2
change or in the case of repeat tests
Inspection after repair, modification of electrical appliances –
Periodic inspection on electrical appliances
VDE 0701-0702 General requirements for electrical safety
Safety of machinery - Electrical equipment of machines - Part 1:
EN 60204-1 Ed.5 General requirements
EN 60439
Low-voltage switchgear and controlgear assemblies
Low-voltage switchgear and controlgear assemblies - Part 1:
EN 61439-1
General rules
AS / NZS 3760
In-service safety inspection and testing of electrical equipment
Operation of electrical installations - Additional Netherlands
NEN 3140
requirements for low-voltage installations
Note about EN and IEC standards:
Text of this manual contains references to European standards. All standards of EN
6xxxx (e.g. EN 61010) series are equivalent to IEC standards with the same number
(e.g. IEC 61010) and differ only in amended parts required by European harmonization
procedure.
Notes:
Various devices and appliances can be tested by SigmaGT and in further text the
common DUT (abbreviation for Device Under Test) is applied.
1.4
Battery and charging
The instrument uses six C size alkaline or rechargeable Ni-Cd or Ni-MH battery cells.
Battery condition is always displayed in the lower right display part.
8
MI 3310 / MI 3310A SigmaGT
General description
In case the battery is too weak the instrument indicates this as shown in below. This
indication appears for a few seconds and then the instrument turns itself off.
Discharged battery indication
The battery is charged whenever the instrument is connected to mains voltage. The
instrument automatically recognizes the connection to the mains voltage and begins
charging. Internal circuit controls charging and assures maximum battery lifetime.
Indications of battery charging
‰
‰
‰
‰
‰
When connected to an installation, the instruments battery compartment
can contain hazardous voltage inside! Before opening battery compartment
cover, disconnect all accessories connected to the instrument and switch off
the instrument.
Ensure that the battery cells are inserted correctly otherwise the instrument
will not operate and the batteries could be discharged.
If the instrument is not to be used for a long period of time, remove all
batteries from the battery compartment.
Alkaline or rechargeable Ni-Cd or Ni-MH batteries (size C) can be used. Metrel
recommends only using rechargeable batteries with a capacity of 4000 mAh or
higher.
Do not recharge alkaline battery cells!
1.5
New battery cells or cells unused for a longer period
Unpredictable chemical processes can occur during the charging of new battery cells or
cells that have been left unused for a longer period (more than 3 months). Ni-MH and
Ni-Cd cells can be subjected to these chemical effects (sometimes called the memory
effect). As a result the instrument operation time can be significantly reduced during the
initial charging/discharging cycles of the batteries.
In this situation, Metrel recommend the following procedure to improve the battery
lifetime:
Procedure
‰ Completely charge the battery.
Notes
At least 14h with in-built charger.
This can be performed by using the
‰ Completely discharge the battery.
instrument normally, until the instrument is
fully discharged.
‰ Repeat the charge / discharge cycle Four cycles are recommended in order to
at least 2-4 times.
restore the batteries to their normal capacity.
9
MI 3310 / MI 3310A SigmaGT
General description
Note:
‰ The charger in the instrument is a pack cell charger. This means that the battery
cells are connected in series during the charging. The battery cells have to be
equivalent (same charge condition, same type and age).
‰ One different battery cell can cause an improper charging and incorrect discharging
during normal usage of the entire battery pack (it results in heating of the battery
pack, significantly decreased operation time, reversed polarity of defective cell…).
‰ If no improvement is achieved after several charge / discharge cycles, then each
battery cell should be checked (by comparing battery voltages, testing them in a cell
charger, etc). It is very likely that only some of the battery cells are deteriorated.
The effects described above should not be confused with the normal decrease of
battery capacity over time. Battery also loses some capacity when it is repeatedly
charged / discharged. Actual decreasing of capacity, versus number of charging cycles,
depends on battery type. This information is provided in the technical specification from
battery manufacturer.
10
MI 3310 / MI 3310A SigmaGT
Instrument description
2 Instrument description
2.1
Front panel
Front panel
Legend:
1
2
3
4
5
6
7
8
9
10
11
240 × 128 dots graphic matrix display with backlight
Function keys intended for displayed defined options.
ESCAPE key
HELP key
ON / OFF key
To switch off the instrument press and hold ON/OFF key for about 2 seconds.
Cursor keys and ENTER key
SEND key
START / STOP key
Test probe EB/S, used as output for earth bond test and probe input in for class 2
equipment tests (insulation resistance – S, substitute leakage – S, and touch
leakage currents).
Alpha-numeric keyboard
LN and PE sockets for testing the insulation resistance and substitute leakage
current of fixed installed DUTs.
11
MI 3310 / MI 3310A SigmaGT
Instrument description
Warning!
‰ These sockets are intended only for the connection to deenergized
devices.
12 Test socket
Warning!
‰ Dangerous voltage is present on the test socket during the measurement.
Maximum output current is 16 A, test only devices with maximum rated
supply current not higher than 16 A!
Note:
‰ For devices incorporated high reactive loading, e.g. motor with rated power >
1.5 kW, it is recommended to start measurement first and to turn on the tested
device later.
13 IEC appliance connector for testing supply cords
Warning!
‰ The connector input is for test purpose only; do not connect it to the
mains supply!
2.2
Connector panels
Left side connector panel
14
15
16
17
Two T16 A / 250 V fuses for instrument protection
Mains supply connector
Battery compartment cover
Fastening screw for battery compartment cover
Warning!
‰ Disconnect all accessory and tested equipment before opening the
battery cover!
12
MI 3310 / MI 3310A SigmaGT
Instrument description
Right side connector panel
18 Current clamp adapter input sockets
Warnings!
‰ Do not connect any voltage source on this input. It is intended only for
connection of current clamp with current output. Maximum input current
is 30 mA!
‰ Green socket is connected to the functional earth of the system and is
intended for connection with shield of current clamp only.
19 USB connector
20 Barcode reader connector
21 PC / PRINTER connector
2.3
Safety pre-tests
Before performing a measurement, the instrument performs a series of pre-tests to
ensure safety and to prevent any damage. These safety pre-tests are checking for:
-
Any external voltage against earth on mains test socket,
Excessively high leakage current,
Excessively high touch leakage current,
Short circuit or too low resistance between L and N of tested device,
Correct input mains voltage,
Input PE connection.
If pre-tests fail, an appropriate warning message will be displayed.
The warnings and measures are described in chapter 2.4 Warnings, messages and
symbols.
13
MI 3310 / MI 3310A SigmaGT
Instrument description
2.4 Warnings, messages and symbols
Warnings and messages
Mains voltage is not
correct or PE not
connected.
Check mains voltage
and PE connection!
Warning for improper supply voltage condition. Possible
causes:
- No earth connection or other wiring problem on
supply socket.
- Incorrect mains voltage.
Determine and eliminate the problem before proceeding!
Warning:
- The instrument must be earthed properly!
No mains voltage.
Connect PAT to mains
voltage.
Instrument not connected to the mains supply voltage.
For some measurements like differential / touch leakage
tests, PRCD / RCD tests and active polarity, operating the
instrument from mains voltage is required.
Connect the instrument to the mains voltage and start
selected test again.
L – N resistance too
high (>30 kΩ)!
Check fuse and
switch.
Are you sure to
proceed (Y/N)?
An excessively high resistance was measured in the fuse
pre-test. Indication means that tested device has too low
consumption or is:
- Not connected,
- Switched off,
- Contains a fuse that has blown.
Select YES or NO with Y or N key.
Resistance L – N low!
Are you sure to
proceed (Y/N)?
Resistance L – N too
low!
Are you sure to
proceed (Y/N)?
A low resistance of the device under test (DUT) supply input
was measured in the pre-test. This means that it is very
likely that an excessively high current will flow after applying
power to the DUT. If the high current is only of short duration
(caused by a short inrush current) the test can be performed,
otherwise not.
Select YES or NO with Y or N key.
An extremely low resistance of the DUT supply input was
measured in the pre-test. It is likely that fuses will blow after
applying power to the DUT. If the too high current is only of
short duration (caused by a short inrush current) the test can
be performed otherwise it must be stopped.
Select YES or NO with Y or N key.
It is recommended to additionally check the DUT before
proceeding with the test!
14
MI 3310 / MI 3310A SigmaGT
Leakage LN-PE high!
Are you sure to
proceed (Y/N)?
Leakage LN-PE too
high!
Are you sure to
proceed (Y/N)?
Leakage LN-PE or
EB/S too high!
Are you sure to
proceed (Y/N)?
Instrument description
Dangerous leakage current (higher than 3.5 mA) will flow if
power would be connected to DUT.
Select YES or NO with Y or N key.
Proceed with testing only if all safety measures have been
taken. It is recommended to perform a thorough earth bond
test on the PE of the DUT before proceeding with the test.
Dangerous leakage current (higher than 20 mA) will flow if
power would be connected to the DUT.
Determine and eliminate the problem before proceeding!
Dangerous leakage current (higher than 20 mA) would flow if
power were connected to the DUT.
Select YES or NO with Y or N key.
Proceed with testing only if all safety measures have been
taken.
It is recommended to perform a thorough earth bond test on
the PE of the DUT before proceeding with the test.
External voltage on
test socket too high!
DANGER!
- Voltage on mains test socket or LN/PE terminals
is higher than approximately 25 V (AC or DC)!
Disconnect the DUT from the instrument immediately and
determine why external voltage was detected!
External voltage on
EB/S too high!
DANGER!
- Voltage on test probe (EB/S) is higher than
approximately 25 V (AC or DC)!
Disconnect the test probe from the DUT and determine why
external voltage was detected!
Next test was skipped
for safety! Check the
device.
Instrument skipped the required test because of a failed
previous test.
Overheated!
Temperature of internal components of the instrument
reached their top limit. Measurement is prohibited until the
internal temperature has reduced.
15
MI 3310 / MI 3310A SigmaGT
Instrument description
Warning!
More than 80 % of
memory is occupied.
Stored data should be
downloaded to PC.
Instrument memory is almost full. Download stored results to
PC.
Warning!
Calibration has been
expired.
Recalibration of the instrument is required. Contact your
dealer.
Measurement aborted,
contact voltage too
high (> 50V).
A too high contact voltage was detected before an RCD test
being carried out. Check PE connections!
Hardware error.
Return the instrument
to the repair centre.
The instrument detects a serious failure.
16
MI 3310 / MI 3310A SigmaGT
Instrument description
Warning symbols
Remove the EB/S connection, especially if it is connected to
any part that will begin to rotate or move when power is
applied.
Connect the test lead to the EB/S test socket.
Warning!
A high voltage is / will be present on the instrument output!
(Insulation test voltage, or mains voltage).
The DUT should be switched on (to ensure that the complete
circuit is tested).
Connect the lead to be tested to the IEC test terminal.
Connect current clamp adapter in this test.
PASS /FAIL indication
Test passed.
Test failed.
Some tests in the autotest sequence were skipped, but all
performed tests passed.
17
MI 3310 / MI 3310A SigmaGT
Instrument description
Battery and mains supply indication
Battery capacity indication.
Low battery! Battery is too weak to guarantee correct result.
Replace or recharge battery cells.
Instrument connected to the mains supply voltage. When
instrument is in idle mode recharging process is in progress.
Recharging in progress (if instrument is connected to the
mains supply voltage).
Bluetooth indication (MI 3310A only)
Bluetooth communication is enabled. Remote device (printer
or barcode reader) can now be connected with the
instrument.
Remote Bluetooth device (printer or barcode reader) is
connected with the instrument.
Searching for Bluetooth devices or connecting procedure
with the selected Bluetooth device (printer or barcode
reader).
Alpha-numeric entry indication
When using alpha-numeric keyboard, entry type can be selected by using SHIFT key.
1A
Alpha-numeric caps entry (excluding special alphabet
characters)
1Ä
Alpha-numeric caps entry (including special alphabet
characters)
:ä
Special characters and small caps alphabetic entry
(including special alphabet characters)
18
MI 3310 / MI 3310A SigmaGT
Technical specifications
3 Technical specifications
3.1
Earth bond resistance
Test current set to 10 A (MI 3310A only)
Range
Resolution
0.00 Ω ÷ 1.99 Ω
0.01 Ω
2.00 Ω ÷ 19.99 Ω
0.01 Ω
Accuracy
±(5 % of reading + 3 digits)
± 10 %
Test current set to 200 mA
Range
0.00 Ω ÷ 1.99 Ω
2.00 Ω ÷ 9.99 Ω
10.0 Ω ÷ 19.9 Ω
Accuracy
±(5 % of reading + 3 digits)
± 10 %
± 10 %
Resolution
0.01 Ω
0.01 Ω
0.1 Ω
Powered by:.....................battery or mains for 200 mA test
mains for 10 A test
Test currents:...................10 A (± 5 %) into 100 mΩ at mains voltage of 230 V
200 mA into 2.00 Ω
Open circuit voltage: ........<9 V AC
Lead calibration: ..............no
Pass levels [Ω]:................0.10 ÷ 0.90, 1.00 ÷ 9.00
Test duration [s]:..............2, 3, 5, 10, 30
Test method:....................2-wire measurement, floating to earth
Test terminals: .................EB/S test probe – test socket (PE terminal)
EB/S test probe – PE test probe (test current 200 mA only)
3.2
Insulation resistance, Insulation – S resistance
Insulation resistance
Range
0.000 MΩ ÷ 0.500 MΩ
0.501 MΩ ÷ 1.999 MΩ
2.00 MΩ ÷ 19.99 MΩ
20.0 MΩ ÷ 199.9 MΩ
Resolution
0.001 MΩ
0.001 MΩ
0.01 MΩ
0.1 MΩ
Accuracy
±(10 % of reading + 5 digits)
Insulation – S resistance
Range
0.000 MΩ ÷ 0.500 MΩ
0.501 MΩ ÷ 1.999 MΩ
2.00 MΩ ÷ 19.99 MΩ
Resolution
0.001 MΩ
0.001 MΩ
0.01 MΩ
Accuracy
±(10 % of reading + 5 digits)
±(5 % of reading + 3 digits)
±(5 % of reading + 3 digits)
Power by:.........................battery or mains
Nominal voltages: ............250 V DC, 500 V DC (- 0 %, + 10 %)
19
MI 3310 / MI 3310A SigmaGT
Technical specifications
Measuring current:...........min. 1 mA at 250 kΩ (250 V), 500 kΩ (500 V)
Short circuit current:.........max. 2.0 mA
Pass levels [MΩ]:.............0.01, 0.10, 0.25, 0.30, 0.50, 1.00, 2.00, 4.0, 7.0, 10.0, none
Test duration [s]:..............2, 3, 5, 10, 30, 60, 120, 180 s, none
Test terminals: .................Insulation:
Test socket (L+N) – test socket (PE)
LN test probe – PE test probe
LN test probe – EB/S test probe
Insulation – S: Test socket (L+N) – EB/S test probe
LN test probe – EB/S test probe
3.3
Subleakage current, Subleakage – S current
Range
0.00 mA ÷ 19.99 mA
Resolution
0.01 mA
Accuracy
±(5 % of reading + 5 digits)
Powered by:.....................battery or mains
Open circuit voltage: ........< 50 V AC
Short circuit current: ........< 40 mA
Measuring resistor: ..........2 kΩ
Pass levels [mA]: .............0.25, 0.50, 0.75, 1.00, 1.50, 2.25, 2.50, 3.50, 4.0, 4.50, 5.00,
5.50, 6.00, 7.00, 8.00, 9.00, none
Test duration [s]:..............2, 3, 5, 10, 30, 60, 120, 180, none
Displayed current:............calculated to DUT nominal mains supply voltage
230 V x 1.06.
Test terminals: .................Sub leakage:
Test socket (L+N) – test socket (PE)
LN test probe – PE test probe
LN test probe – EB/S test probe
Sub leakage – S:
Test socket (L+N) – EB/S test probe
LN test probe – EB/S test probe
3.4
Differential leakage current
Range
0.00 mA ÷ 9.99 mA
Resolution
0.01 mA
Accuracy
±(5 % of reading + 5 digits)
Powered by:.....................mains
Pass levels [mA]: .............0.25, 0.50, 0.75, 1.00, 1.50, 2.25, 2.50, 3.50, 4.00, 4.50, 5.00,
5.50, 6.00, 7.00, 8.00, 9.00, none
Test duration [s]...............2 s, 3 s, 5 s, 10 s, 30 s, 60 s, 120 s, 180 s, none
Frequency response: .......complies to EN61010-Figure A1
Test terminals: .................mains test socket
3.5
Power / Functional test
Apparent power
Range
0.00 kVA ÷ 4.00 kVA
Resolution
0.01 kVA
20
Accuracy
±(5 % of reading + 3 digits)
MI 3310 / MI 3310A SigmaGT
Technical specifications
Powered by:.....................mains
Test duration [s]:..............2 s, 3 s, 5 s, 10 s, 30 s, 60 s, 120 s, 180 s, none
Test terminals: .................mains test socket
3.6
Touch leakage current
Range
0.00 mA ÷ 3.99 mA
Resolution
0.01 mA
Accuracy
±(10 % of reading + 5 digits)
Powered by:.....................mains
Pass levels [mA]: .............0.25, 0.50, 0.75, 1.00, 1.50, 2.00, 3.50, none
Test duration [s]:..............2, 3, 5, 10, 30, 60, 120, 180, none
Frequency response: .......complies to EN61010-Figure A1
Test terminals: .................mains test socket or external source – EB/S test probe
3.7
Polarity test
Standard test
Powered by:.....................mains, battery
Test voltage .....................<50 V AC
Detects: ...........................Pass, L-open, N-open, PE-open, L-N crossed, L-PE crossed,
N-PE crossed, L-N shorted, L-PE shorted, N-PE shorted,
multiple faults
Test terminals: .................Mains test socket – IEC/PRCD test socket
Active test
Powered by:.....................mains
Test voltage .....................Mains voltage, over-current protection > 150 mA
Detects: ...........................Pass, L-open, N-open, PE-fault, L-N crossed, connection fault
Test terminals: .................Mains test socket – IEC/PRCD test socket
3.8
Clamp current
True RMS current using 1000:1 current clamp
Range
Resolution
0.01 mA
0.00 mA ÷ 9.99 mA
0.1 mA
10.0 mA ÷ 99.9 mA
1 mA
100 mA ÷ 999 mA
0.01 A
1.00 A ÷ 9.99 A
0.1 A
10.0 A ÷ 24.9 A
*It does not consider accuracy of current transformer.
Accuracy*
±(5 % of reading + 10 digits)
±(5 % of reading + 5 digits)
±(5 % of reading + 5 digits)
±(5 % of reading + 5 digits)
±(5 % of reading + 5 digits)
Pass levels [mA]: .............0.25, 0.50, 0.75, 1.00, 1.50, 2.25, 2.50, 3.00, 3.50, 5.00, 9.00,
none
Test duration [s]: ..............2, 3, 5, 10, 30, 60, 120, 180, none
Powered by:.....................battery or mains
Test terminals: .................Clamp inputs
21
MI 3310 / MI 3310A SigmaGT
Technical specifications
Temperature coefficient outside reference temperature limits is 1 % of measured value
per °C.
3.9
3.9.1
PRCD and RCD testing
Portable RCD trip-out time
Range
0 ms ÷ 300 ms(½×IΔN)
0 ms ÷ 300 ms (IΔN)
0 ms ÷ 40 ms (5×IΔN)
Resolution
1 ms
1 ms
1 ms
Accuracy
±3 ms
Powered by:.....................mains
Test currents (IΔN): ...........10 mA, 15 mA, 30 mA
Test current multipliers: ...½×IΔN, IΔN, 5×IΔN
Start angle: ......................0°, 180°, both
Test modes: .....................single, autotest
Test terminals: .................Mains test socket – IEC/PRCD test socket
PASS / FAIL limits: ..........½×IΔN: tΔ > 300 ms
IΔN:
tΔ < 300 ms
5×IΔN: tΔ < 40 ms
3.9.2
General RCD Trip-out time
Complete measurement range corresponds to EN 61557-6 requirements.
Maximum measuring times set according to selected reference for RCD testing.
Range
0 ms ÷ 300 ms (½×IΔN)
0 ms ÷ 300 ms (IΔN)
0 ms ÷ 40 ms (5×IΔN)
Resolution
0.1 ms
0.1 ms
0.1 ms
Powered by:..................... mains via tested RCD
Test current: ....................½×IΔN, IΔN, 5×IΔN
Start angle: ......................0°, 180°, both
Test modes: .....................single, autotest
Specified accuracy is valid for complete operating range.
22
Accuracy
±3 ms
±1 ms
MI 3310 / MI 3310A SigmaGT
Technical specifications
3.10 Calibration unit – checkbox (optional)
Instrument
Function
Earth bond resistance
Insulation resistance
Insulation resistance
S – probe
Substitute leakage current
Substitute leakage current
S – probe
Differential leakage current
Touch leakage current
Reference
0.39 Ω
4.70 Ω
1.200 MΩ
10.00 MΩ
1.200 MΩ
10.00 MΩ
0.45 mA
3.38 mA
0.45 mA
3.38 mA
0.45 mA
3.38 mA
0.45 mA
0.90 mA
Accuracy
±1%
±5%
±1%
±1%
±1%
±1%
±1%
Reference
PASS
Accuracy
-
±1%
±1%
±1%
IEC test cord
Function
Polarity
3.11 General data
Power supply
Power supply voltage................ 9 V DC (6×1.5 V battery or accu., size C)
Rated supply voltage: ............... 230 V AC
Supply voltage tolerance: ......... ±10 %
Frequency of supply voltage: .... 50 Hz, 60 Hz
Max. power consumption:......... 300 VA (without DUT)
Rated DUT:............................... 16 A resistive, 1.5 kW motor
Overvoltage category
Instrument:................................ Cat II / 300 V
Test socket: .............................. Cat II / 300 V
Plug test cable: ......................... 300 V CAT II
Protection classification
Power supply: ........................... Class I, mains supply
Class II, only battery supply
Pollution degree:....................... 2
Degree of protection: ................ IP 50 (closed and locked cover)
23
MI 3310 / MI 3310A SigmaGT
Technical specifications
IP 20 main test socket
Case: ........................................ shock proof plastic / portable
Display:..................................... 240*128 dots graphic matrix display with backlight
Memory:.................................... 6000 memory locations
Communication interface
RS232 interfaces: ..................... 1200 bps ÷ 115200 bps, 1 start bit, 8 data bits, 1 stopbit
RS232 connectors: ................... 9-pin sub miniature type D, female
USB interface: .......................... 1200 bps ÷ 115200 bps
USB connector:......................... type B
Insulation:
Communication ports to PE: ..... 600 kΩ, 5 %
Dimensions (w×h×d):................ 31cm × 13cm × 25cm
Weight
(with standard accessories): ..... 5 kg
Reference conditions
Reference temperature range:.. 15 °C ÷ 35 °C
Reference humidity range:........ 35 % ÷ 65 % RH
Operation conditions
Working temperature range: ..... 0 °C ÷ +40 °C
Maximum relative humidity: ...... 85 % RH (0 °C ÷ 40 °C), non-condensing
Storage conditions
Temperature range: .................. -10 °C ÷ +60 °C
Maximum relative humidity: ...... 90 % RH (-10 °C ÷ +40 °C)
80 % RH (40 °C ÷ 60 °C)
Accuracies apply for 1 year in reference conditions. Temperature coefficient outside
these limits is 0.2 % of measured value per °C plus 1 digit, otherwise noted.
Fuses
Test socket protection:.............. 2 x T16 A / 250 V, 6.3 × 32 mm
24
MI 3310 / MI 3310A SigmaGT
Main menu and test modes
4 Main menu and test modes
The SigmaGT instrument has a user-friendly manipulation. By pressing only a few keys
most of the actions can be done. The menu tree of the instrument has been designed to
be simple to understand and easy to operate.
The instrument can test appliances in four different modes:
Ì
Ì
Single test mode,
Three autotest modes.
After the instrument is switched on, the last menu used will be displayed.
4.1
Help menus
The measurement help menus are available in single and autotest modes. They can be
accessed with the key HELP before the START key is pressed to initiate the
measurement.
Help menus contain schematic diagrams for illustration of proper connection of DUT to
the PAT testing instrument.
Keys in help menu:
PgUp (F1) / PgDown (F2)
ESC
Selects next / previous help screen.
Returns to the last test / measurement menu.
Example of help screens
25
MI 3310 / MI 3310A SigmaGT
4.2
Main menu and test modes
Instrument main menu
From the Main menu all the instrument functions can be selected.
Instrument main menu
Keys in instrument main menu:
Select one of the following menu items:
<AUTOTEST ORGANISATOR>, pre-defined autosequences, covering
requirements of standard;
<AUTOTEST CUSTOM>, custom prepared autosequences;
<PROJECT AUTOTESTS>, project autosequences;
<BARCODE / TAG>, working with barcode and RFID tags;
<SINGLE TEST>, test / measuring functions alone;
<EDIT APPLIANCE DATA>, see chapter 4.2.5;
<RECALL/DELETE/SEND MEMORY>, working with results, see chapter 7;
<DATA UPLOAD/DOWNLOAD>, data transfer possibilities, see chapter 7.5;
<SETUP> the menu for general settings of the instrument, see chapter 4.2.8.
ENTER Confirms selection.
Returns to the Instrument main menu.
ESC
¿/À
Note:
† The ESC key must be pressed more than once to return to Main menu from any
submenu or selected function.
4.2.1
Autotest organizer menu
This menu offers creation and performing autotest sequences compatible with proper
standards. The sequence setup and its parameters are exactly the same as suggested
in the applied standard, VDE 0701-0702 or NEN 3140.
When an autotest sequence has been created in the autotest organizer, it can be run as
an autotest or stored in the Custom Autotest menu.
26
MI 3310 / MI 3310A SigmaGT
Main menu and test modes
Autotest organizer menu
See chapter 6 Autotest sequences for detailed description of this test mode.
4.2.2
Autotest custom menu
The menu contains a list of custom prepared autosequences.
12 pre-programmed often used autotest sequences are added to the list by default.
Up to 50 custom autotest sequences can be pre-programmed in this autotest mode.
Custom autotests can be also downloaded to/ uploaded from the PC SW PATlinkPRO.
Autotest custom menu
See chapter 6 Autotest sequences for detailed description about this test mode.
4.2.3
Project autotests menu
The Project autotest is a tool that simplifies and speeds up periodic testing of DUTs.
The main idea is to re-use known and stored data about the DUT.
Project autotest starting menu example
See chapter 6.3 Project autotests for detailed description about this autotest mode.
27
MI 3310 / MI 3310A SigmaGT
4.2.4
Main menu and test modes
Single test menu
In single test menu individual tests can be performed.
Single test menu
See chapter 5 Single tests for detailed description about the single test mode.
4.2.5
Edit appliance data menu
In this menu lists of user and appliance data default names can be edited. An
alternative is to upload the lists from PC.
Users / appliance data main menu
Keys in user / device data menu:
¿/À
ENTER
ESC
4.2.5.1
Select the field to be changed.
Confirms selection and opens menu of selected item.
Returns to General settings menu.
Users submenu
In this menu user names for up to 15 different users can be entered, edited and
selected.
Users submenu
28
MI 3310 / MI 3310A SigmaGT
Main menu and test modes
Keys in set users menu:
¿/À
ENTER
EDIT (F1)
ESC
4.2.5.1.1
Select the user.
Confirms selection and returns to User / device data menu.
Opens Edit user menu for selected user, see 4.2.5.1.1. Name editing
menu.
Discards modifications and returns to User / device data menu.
Name editing menu
The menu is intended for editing new/existing fields.
Edit item menu – example edit users
Keys in edit item menu:
Alphanumeric keys
SAVE (F1)
UNDO (F2)
ESC
4.2.5.2
Entering user name
Confirms entry and returns back.
Discards modifications and recover original entry.
Discards modifications and returns back.
Device submenu
In this menu, default lists of device names (up to 100) can be edited.
The list can be also downloaded to / uploaded from the PC SW PATLinkPRO.
For more information refer to chapter 7.5 Data upload / download.
Devices submenu
29
MI 3310 / MI 3310A SigmaGT
Main menu and test modes
Keys in device menu:
¿/À
Select the device.
PgUp (F2) / PgDown (F3)
Opens Edit device menu, for selected device, see 4.2.5.1.1. Name
EDIT (F1)
editing menu.
Discards modifications and returns to User / device data menu.
ESC
4.2.5.3
Test sites submenu
In this menu default lists of object names (up to 100) can be edited.
The list can be also downloaded to/ uploaded from the PC SW PATlinkPRO.
For more information refer to chapter 7.5 Data upload / download.
Test sites submenu
Keys in test sites menu:
¿/À
Select the test site.
PgUp (F2) / PgDown (F3)
Opens Edit test site menu for selected test site, see 4.2.5.1.1. Name
EDIT (F1)
editing menu.
Discards modifications and returns to User / device data menu.
ESC
4.2.5.4
Locations submenu
In this menu default lists of location names (up to 100) can be edited.
The list can be also downloaded to or uploaded from the PC SW PATlinkPRO.
For more information refer to chapter 7.5 Data upload / download.
Locations submenu
30
MI 3310 / MI 3310A SigmaGT
Main menu and test modes
Keys in device menu:
¿/À
Select the location.
PgUp (F2) / PgDown (F3)
Opens Edit location menu for selected location, see 4.2.5.1.1. Name
EDIT (F1)
editing menu.
Discards modifications and returns to User / device data menu.
ESC
4.2.6
Recall / delete / send memory menu
Manipulation with stored data is allowed in this menu. Stored results can be recalled
according to DUT name and date, deleted or send to PC or printers.
Recall results menu
See chapters 7.2 Recalling results, 7.3 Deleting results and 7.4 Downloading and
printing results for more information.
4.2.7
Data upload / download menu
In this menu it is possible to upload different data from PC to the instrument:
- Stored test results and data (results, parameters, notes),
- List of default DUT and test site names,
- List of custom autosequences.
Upload of test data menu
See chapter 7.5 Data upload / download for detailed description about uploading /
downloading data from or to a PC.
31
MI 3310 / MI 3310A SigmaGT
4.2.8
Main menu and test modes
Setup menu
In the Setup menu the parameters of the instrument can be viewed or set.
Setup menu
Keys in Setup menu:
ENTER
ESC
Select the setting to adjust or view:
<DATE/TIME>, day and time, see 4.2.8.1;
<LANGUAGE>, instrument language, see 4.2.8.2;
<PRINT HEADER>, printed header options, see 4.2.8.3;
<INSTRUMENT DATA>, data related to the SigmaGT, see 4.2.8.4;
<CONTRAST>, LCD contrast, see 4.2.8.5;
<INSTRUMENT SETTINGS>, various instrument settings, see 4.2.8.6;
<ORIGINAL SETTINGS>, reset the instrument to factory settings, see
4.2.8.7;
<SET COMMUNICATION>, communication parameters, see 4.2.8.8 and
4.2.8.9;
<PASSWORD>, to access restricted options, see 4.2.8.10.
Confirms selection.
Returns to the Instrument main menu.
4.2.8.1
Setting date and time
¿/À
Selecting this option will allow the user to set the date and time of the unit. The following
menu will be displayed:
Date and time menu
Keys in date/time menu:
½/¾
¿/À
SAVE (F1)
UNDO (F2)
ESC
Select the field to be changed.
Modify selected field.
Confirms selection and returns to Setup menu.
Discards modifications and recover original entry.
Discards modifications and returns to Setup menu.
32
MI 3310 / MI 3310A SigmaGT
Main menu and test modes
Notes:
† Date is attached to each PAT autotest measurement results!
† Date format is DD-MM-YYYY (day–month–year).
† Date entry is checked for regularity and is not accepted in case of irregular date!
4.2.8.2
Language selection
Selecting this option will allow the user to select the language in the instrument. The
following menu will be displayed:
Language menu
Keys in Language menu:
¿/À
ENTER
ESC
4.2.8.3
Select the language.
Confirms selection and returns to Setup menu.
Discards modifications and returns to Setup menu.
Print header
Selecting this option will allow the user to set text of printing header. The print header is
appended to printout form when test results are printed using a serial printer.
Print header menu
Editing print header
Keys in print header menu:
EDIT (F1)
ESC
Enters edit menu for entering print header.
Returns to Setup menu.
Keys in print header edit menu:
Alphanumeric keys
SAVE (F1)
UNDO (F2)
ESC
Entering header text
Confirms selection and returns to Setup menu.
Discards modifications and recover original entry.
Discards modifications and returns to Setup menu.
33
MI 3310 / MI 3310A SigmaGT
4.2.8.4
Main menu and test modes
Viewing of instrument data
In this menu the following instrument data are shown:
- Producer name,
- Instrument name,
- Serial number,
- Firmware version,
- Calibration date.
Instrument data menu
Key in instrument data menu:
Returns to Setup menu.
ESC
Note:
† Operator cannot change any instrument data!
4.2.8.5
Display contrast adjustment
Selecting this option will allow the user to set LCD contrast. The following menu will be
displayed:
Contrast menu
Keys in contrast menu:
¿/À
SAVE (F1)
UNDO (F2)
ESC
Modify contrast.
Confirms selection and returns to Setup menu.
Discards modifications and recover original entry.
Discards modifications and returns to Setup menu.
34
MI 3310 / MI 3310A SigmaGT
4.2.8.6
Main menu and test modes
Instrument settings
When an autotest is completed, different data about DUT and other associated data can
be added to the autotest results before saving them. In the Instrument settings
submenu, the various data and data types can be customized.
The following data can be controlled between tests:
-
DUT number,
Test site,
Location,
User,
DUT name,
Retest period,
Repairing code,
Comments,
Barcode system.
From the Main menu, select Setup and then select Instrument settings by using ¿
and À cursor keys and press ENTER key to confirm. The Instrument settings
submenu will be displayed.
Instrument settings menu
Keys:
À/¿
EDIT (F1)
ENTER
ESC
Select the item whose parameter will be changed.
Highlight the parameter that can be changed.
Returns to main settings menu.
Changing the instrument parameter
The selected parameter is highlighted.
Modification of selected setting
35
MI 3310 / MI 3310A SigmaGT
Keys:
À/¿
SAVE (F1)
UNDO (F2)
ESC
Main menu and test modes
Modify highlighted parameter.
Saves setting of selected item,
Recovers currently modified setting.
Returns to main settings menu.
Notes:
† If blank is selected for a particular item, then the appropriate field will initially appear
blank in the Save results menu.
† If replicate option is selected for a particular item, the last entered data will initially
appear in an appropriate field when new autotest sequence is finished.
† The increment option can also be set in the device number field. In this case, the
DUT number will be automatically incremented when new autotest sequence is
finished.
† Special character »$« between autotest shortcut code and DUT name (ID number)
is used to distinguish shortcut code from DUT name.
nd
† Only DUT ID is printed out on the 2 DUT label (power supply cord label).
† Refer to Appendix B for more information about barcode systems.
4.2.8.7
Reset instrument settings
In this menu the following parameters can be set to their initial values:
- All measurement parameters in single test mode,
- User defined tests are cleared,
- Custom autotest sequences are replaced by factory pre-programmed ones,
- PC baud rate is set to 115200 bps,
- Printer protocol is set to hardware handshaking – flow control (DTR).
The following menu is displayed:
Original settings menu
Keys in instrument settings menu:
Y
N
Confirms reset to default values and returns to Setup menu.
Returns to Setup menu without reset.
36
MI 3310 / MI 3310A SigmaGT
4.2.8.8
Main menu and test modes
Communication settings
In this menu, the communication port for communication with PC, serial (barcode)
printer and barcode reader can be set. Also baud rate for communication with PC can
be set. Following menu will be displayed:
Communication menu
Keys in set communications menu:
¿/À
ENTER
ESC
Select the field to be changed. (EDIT BLUETOOTH DEVICES option is
available only when instrument supports Bluetooth technology).
Confirms selection and opens menu of selected option.
Returns to Setup menu.
Communication settings
Keys in baud rate menu:
¿/À
F1 (SAVE)
ESC
Select the proper option.
Confirms selection and returns to Set communications menu.
Returns to Set communications menu without changes.
Keys in communication type selection menu:
Select the proper option.
¿/À
Communication type selection permitted.
EDIT /
ENTER
Confirms selection and returns back to menu.
SAVE
Returns back to menu without changes.
UNDO
Returns back to menu or to Set communications menu without
ESC
changes.
Note:
† Only one port can be active at one time.
† Baud rates for communication with serial (barcode) printer and barcode reader are
set to 9600 bps and cannot be changed.
37
MI 3310 / MI 3310A SigmaGT
Main menu and test modes
† Serial (barcode) printer and barcode reader can communicate with the instrument
also using wireless Bluetooth technology.
4.2.8.9
Wireless (Bluetooth) communication setup (MI 3310A only)
Wireless communication can be set in Set communication type and Edit bluetooth
devices sub-menus entered in Set communication main menu.
First select Edit Bluetooth devices in Set communication menu by using ¿ and À
keys and press ENTER key to confirm. The following menu is displayed.
Edit Bluetooth device menu
F2 (SEARCH)
Search for Bluetooth devices in near.
Once Bluetooth devices in near were found, instrument displays their names and
Bluetooth addresses. Up to 6 Bluetooth devices can be displayed.
Bluetooth devices in near
Set selected Bluetooth device as printer or
barcode reader
Search again for Bluetooth devices in near.
F2 (SEARCH)
Select Bluetooth device
¿/À
F3 (SAVE AS), ¿ / Selected Bluetooth device can be set as printer or barcode
À
reader.
Confirm selected option in SAVE AS sub-menu.
ENTER
Returns back to Edit Bluetooth device or Set Communication
ESC
menu.
When Bluetooth devices were set, they can communicate with the instrument using
Bluetooth techology if communication type for printer and/or barcode reader is set to
Bluetooth (Refer to paragraph 4.2.8.8 Communication settings).
38
MI 3310 / MI 3310A SigmaGT
Main menu and test modes
Note:
† Using Bluetooth communication the following devices are supported: printer O’Neil
MF2te Bluetooth and barcode reader Socket mobile CHS 7E2.
4.2.8.10 Password
In password protected actions, it is necessary to enter the password before deleting or
editing the protected data. The instrument requires a password and it will not allow
changes unless the correct password has been entered.
Password menu
Keys in password menu:
Alphanumeric keys
ENTER
ESC
Entering password.
Accepts the password* and returns to Setup menu.
Discards modifications and returns to Setup menu.
Please take a note of this password and keep it in a safe place.
*Notes:
† If there is no password protection, the instrument will request that you enter a new
password twice, once to confirm.
† If the instrument is already password protected, then the instrument will request the
old password before entering the new one twice, once to confirm.
† To disable the password protection, instead of entering a new password just press
the ENTER key when asked for a new password and confirmation and the password
will be disabled.
Contact your dealer if password is forgotten.
Password protected actions:
-
Entering Edit user menu,
Editing measurement parameters in single / autotest custom test mode,
Deleting stored results,
Entering Original settings menu.
39
MI 3310 / MI 3310A SigmaGT
Main menu and test modes
4.2.8.11 Calibration unit – checkbox (optional)
The in-built Checkbox provides a simple and effective means of checking the calibration
of the SigmaGT instrument and accessories. According to the Code of Practice the
ongoing accuracy of the PAT tester should be verified at regular intervals and recorded.
This is of special importance if the PAT tester is used on a daily basis. The SigmaGT
includes an in-built calibration unit (‘Checkbox’) that is independent from the other
instrument’s electronic circuitry. During the calibration with the in-built Checkbox all
main instrument functions and accessories can be verified. The calibration results are
automatically stored into the instrument’s memory and can be viewed with the PATLink
PRO PC software.
Note:
Ì
The Checkbox feature should be used to ensure that the meter is reading
correctly between calibrations but should not be regarded as a substitute for a
full manufacturers calibration on the unit.
The Checkbox starting screen is displayed first. In the REFERENCE column the
Checkbox reference values are displayed.
Checkbox starting screen
Keys:
START
¿/À
ESC
Starts instrument calibration procedure.
Switches between Checkbox screens.
Returns back to Setup menu without changes.
Carrying out the instrument calibration
The checkbox instrument calibration starting screen is displayed first. Before conducting
calibaration, connect accessories as displayed.
Instrument calibration starting screen
40
MI 3310 / MI 3310A SigmaGT
Main menu and test modes
Keys:
START
ESC
Starts instrument calibration procedure.
Skips calibration procedure.
Checking the IEC test cord
The connection for checking the IEC test cord is displayed. Before conducting the
check, connect the IEC test cord.
IEC test cord check starting screen
Keys:
START
ESC
Starts IEC test cord checking procedure.
Skips IEC test cord check.
After all steps were carried out the measured values together with an overall indication
are displayed.
Example of Checkbox result screen
Meaning of indications:
9
Accuracy of result is inside the given accuracy limits.
8
Warning:
The accuracy of the instrument lies out of specified limits!
Keys:
¿/À
START
ESC
Displays all calibration results.
Starts new calibration procedure.
Returns to Setup menu.
41
MI 3310 / MI 3310A SigmaGT
Single tests
5 Single tests
In the single test mode individual tests can be performed. This is especially helpful for
troubleshooting.
Note:
† Single test results cannot be saved.
5.1
Performing measurements in single test mode
Select Single test in main menu by using ¿ and À keys and press ENTER key to
confirm. The Single test menu is displayed.
Single test menu
In Single test menu select single test by using ¿ and À keys and press ENTER key to
confirm.
Editing test parameters
Test measurement parameters of the selected single test are displayed in the top right
corner of the display.
They can be edited by pressing the EDIT (F1) button and selected with by ¿ and À
keys. The selected parameter is highlighted. Its value can be set by using ½ and ¾
keys.
Note:
† To keep new settings, press the SAVE (F1) key.
42
MI 3310 / MI 3310A SigmaGT
5.2
Measurements
Measurements
5.2.1
Earth bond resistance
This test ensures that the connections between the protective conductor terminal in the
mains plug of the DUT and earthed accessible conductive parts of the DUT (metal
housing) are satisfactory and of sufficiently low resistance. This test has to be
performed on Class 1 (earthed) DUT.
The instrument measures the resistance between mains test socket‘s PE terminal and
EB/S terminal.
Earth bond menu
Test parameters for earth bond resistance measurement
OUTPUT
LIMIT
TIME
Test current [200 mA, 10 A]
Maximum resistance [0.1 Ω ÷ 0.9 Ω, 1 Ω ÷ 9 Ω]
Measuring time [2 s, 3 s, 5 s, 10 s, 30 s]
Test circuit for earth bond resistance measurement
Measurement of earth bond resistance of class I DUT
Earth bond resistance measurement procedure
Select the EARTH BOND function.
Set test parameters.
Connect device under test to the instrument.
Connect test lead to S/C1 output on the instrument.
Connect EB/S lead to accessible metal parts of the device under test (see figure
above).
† Press the START key for measurement.
†
†
†
†
†
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MI 3310 / MI 3310A SigmaGT
Measurements
Examples of earth bond resistance measurement results
Displayed results:
Main result ............. earth bond resistance
Note:
† Consider displayed warnings before starting measurement!
5.2.2
Insulation resistance
The insulation resistance test checks the resistance between live conductors and
accessible conductive parts of the DUT connected to PE or isolated. This test can
disclose faults caused by pollution, moisture, deterioration of insulation material etc.
The instrument measures the insulation resistance between:
- Mains test socket (L+N, +) and PE / (EB/S, -) test terminals, and
- LN and PE / (EB/S) test outputs.
This function is primarily intended for testing Class I DUTs.
Insulation menu
Test parameters for insulation resistance measurement
OUTPUT
LIMIT
TIME
Test voltage [250 V, 500 V]
Minimum resistance [0.01 MΩ, 0.10 MΩ, 0.25 MΩ, 0.30 MΩ, 0.50 MΩ,
1.00 MΩ, 2.00 MΩ, 4.0 MΩ, 7.0 MΩ, 10.0 MΩ, none]
Measuring time [2 s, 3 s, 5 s, 10 s, 30 s, 60 s, 120 s, 180 s, none]
44
MI 3310 / MI 3310A SigmaGT
Measurements
Test circuits for insulation resistance measurement
Measurement of insulation resistance of Class I DUT
Measurement of insulation resistance of fixed installed DUTs of Class I
† Insulation resistance measurement procedure
Select the Insulation function.
Set test parameters.
Connect device under test to the instrument (see figures above).
For fixed equipment:
† Disconnect mains supply of the fixed equipment;
† Connect LN test socket of the instrument to L/N terminals of the fixed equipment;
† Connect PE test socket of the instrument to metallic enclosure of the fixed
equipment.
† Press the START key for measurement.
†
†
†
†
Examples of insulation resistance measurement results
Displayed results:
Main result ............. Insulation resistance
45
MI 3310 / MI 3310A SigmaGT
Measurements
Notes:
† Leakage currents into the EB/S and PE test inputs will influence insulation
resistance measurement.
† When EB/S or PE probes are connected during the test then the current through
them is also considered.
† The DUT should be de-energized before the measurement!
† Consider any warning on the display before starting the measurement!
† Do not touch or disconnect the DUT during the measurement or before it is fully
discharged! The message »Discharging…« will be displayed while the voltage on
the DUT is higher than 20 V!
5.2.3
Insulation resistance – S probe
The insulation resistance test checks the resistance between live conductors and
isolated accessible metal parts of DUT. This test can disclose faults caused by pollution,
moisture, deterioration of insulation material etc.
The instrument measures the insulation resistance between:
- Main test socket (L+N, +) and EB/S (-) test terminals, and
- LN (+) and EB/S (-) test sockets.
This function is primarily intended for testing Class II DUTs and Class II parts of Class I
DUTs.
Insulation – S probe menu
Test parameters for insulation resistance measurement
OUTPUT
LIMIT
TIME
Test voltage [250 V, 500 V]
Minimum resistance [0.01 MΩ, 0.10 MΩ, 0.25 MΩ, 0.30 MΩ, 0.50 MΩ,
1.00 MΩ, 2.00 MΩ, 4.0 MΩ, 7.0 MΩ, 10.0 MΩ, none]
Measuring time [2 s, 3 s, 5 s, 10 s, 30 s, 60 s, 120 s, 180 s, none]
46
MI 3310 / MI 3310A SigmaGT
Measurements
Test circuits for Insulation - S resistance measurement
Measurement of insulation resistance of class II DUT
Measurement of insulation resistance of accessible isolated conductive parts of fixed
installed DUTs
Insulation resistance – S probe measurement procedure
Select the Insulation resistance-S probe function.
Set test parameters.
Connect device under test to the instrument (see figures above).
Connect EB/S probe to accessible conductive parts of the DUT.
For fixed equipment:
† Disconnect mains supply of the fixed equipment;
† Connect LN test socket of the instrument to L/N terminals of the fixed equipment;
† Connect EB/S probe to accessible conductive parts of the fixed installed DUT
† Press the START key for measurement.
†
†
†
†
†
47
MI 3310 / MI 3310A SigmaGT
Measurements
Example of insulation-S probe resistance measurement results
Displayed results:
Main result ............. Insulation resistance (LN – S)
Notes:
† If a Class I device is connected to the mains test socket the currents flowing through
the PE terminal will not be considered.
† The DUT should be de-energized before the measurement!
† Consider any warning on the display before starting the measurement!
† Do not touch / disconnect the DUT during the measurement or before it is fully
discharged! The message »Discharging…« will be displayed while the voltage on
the DUT is higher than 20 V!
5.2.4
Substitute leakage current
Leakage currents between live conductors and accessible metal parts (housing, screws,
handles etc.) are checked with this test. Capacitive leakage paths are included in the
result too. The test measures the current flowing at a test voltage of 40 V AC and the
result is scaled to the value of a nominal mains supply voltage of 230 V AC.
The instrument measures the insulation resistance between:
- Main test socket (L+N) and PE / (EB/S) test terminals, and
- LN and PE / (EB/S) test sockets.
This function is primarily intended for testing Class I DUTs.
Sub leakage menu
Test parameters for substitute leakage current measurement
OUTPUT
LIMIT
TIME
Test voltage [40 V]
Maximum current [0.25 mA, 0.50 mA, 0.75 mA, 1.00 mA, 1.50 mA,
2.25 mA, 2.50 mA, 3.50 mA, 4.00 mA, 4.50 mA, 5.00 mA, 5.50 mA,
6.00 mA, 7.00 mA, 8.00 mA, 9.00 mA, none]
Measuring time [2 s, 3 s, 5 s, 10 s, 30 s, 60 s, 120 s, 180 s, none]
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MI 3310 / MI 3310A SigmaGT
Measurements
Measurement of substitute leakage current of class I DUT
Measurement of substitute leakage current of fixed installed DUTs of class I
Substitute leakage measurement procedure
Select the Substitute leakage function.
Set test parameters.
Connect device under test to the instrument (see figures above).
For fixed equipment:
† Disconnect mains supply of the fixed equipment;
† Connect LN test socket of the instrument to L/N terminals of the fixed equipment;
† Connect PE test socket of the instrument to metallic enclosure of the fixed
equipment.
† Press the START key for measurement.
†
†
†
†
Example of substitute leakage current measurement results
49
MI 3310 / MI 3310A SigmaGT
Measurements
Displayed results:
Main result ............. substitute leakage current
Notes:
† Consider any displayed warning before starting measurement!
† Leakage currents into the EB/S and PE test inputs will influence substitute leakage
current measurement.
† When EB/S or PE probes are connected during the test then the current through
them is also considered.
† Substitute leakage current may differ substantially from that of conventional leakage
current test because of the way the test is performed. For example, the difference in
both leakage measurements will be affected by the presence of neutral to earth
noise suppression capacitors.
5.2.5
Substitute leakage – S probe
Leakage currents between live conductors and isolated accessible metal parts (screws,
handles etc.) are checked with this test. Capacitive leakage paths are included in the
result too. The test measures the current flowing at a test voltage of 40 V AC and the
result is scaled to the value of a nominal mains supply voltage of 230 V AC.
The instrument measures the insulation resistance between:
- Main test socket (L+N) and EB/S test terminals, and
- LN and EB/S test sockets.
This function is primarily intended for testing Class II DUTs and Class II parts of Class I
DUTs.
Sub leakage – S probe menu
Test parameters for substitute leakage – S probe current measurement
OUTPUT
LIMIT
TIME
Test voltage [40 V]
Maximum current [0.25 mA, 0.50 mA, 0.75 mA, 1.00 mA, 1.50 mA,
2.25 mA, 2.50 mA, 3.50 mA, 4.0 mA, 4.50 mA, 5.00 mA, 5.50 mA, 6.00
mA, 7.00 mA, 8.00 mA, 9.00 mA, none]
Measuring time [2 s, 3 s, 5 s, 10 s, 30 s, 60 s, 120 s, 180 s, none]
50
MI 3310 / MI 3310A SigmaGT
Measurements
Test circuits for substitute leakage –S probe measurement
Measurement of substitute leakage current of class II DUT
Measurement of substitute leakage of accessible isolated conductive parts of fixed
installed DUTs
Substitute leakage – S probe measurement procedure
Select the Substitute leakage-S probe function.
Set test parameters.
Connect device under test to the instrument (see figures above).
Connect EB/S probe to accessible conductive parts of the DUT.
For fixed equipment:
† Disconnect mains supply of the fixed equipment;
† Connect LN test socket of the instrument to L/N terminals of the fixed equipment;
† Connect EB/S probe to accessible conductive parts of the fixed installed DUT
† Press the START key for measurement.
†
†
†
†
†
Example of substitute leakage S current measurement results
51
MI 3310 / MI 3310A SigmaGT
Measurements
Displayed results:
Main result ............. substitute leakage current LN-S
Notes:
† Consider any displayed warning before starting measurement!
† If a Class I device is connected to the mains test socket the currents flowing through
the PE terminal will not be considered.
5.2.6
Differential leakage current
The purpose of this test is to determine the sum of all leakages flowing from the live
conductor to the earth. Because the differential method for determining leakage current
is used the full and true DUT leakage current is always measured, even when parallel
current paths to ground exist in the DUT.
Differential leakage current menu
Test parameters for differential leakage current measurement
OUTPUT
LIMIT
TIME
Test voltage [230 V]
Maximum current [0.25 mA, 0.50 mA, 0.75 mA, 1.00 mA, 1.50 mA,
2.25 mA, 2.50 mA, 3.50 mA, 4.00 mA, 4.50 mA, 5.00 mA, 5.50 mA, 6.00
mA, 7.00 mA, 8.00 mA, 9.00 mA, none]
Measuring time [2 s, 3 s, 5 s, 10 s, 30 s, 60 s, 120 s, 180 s, none]
Test circuit for differential current measurement
Measuring of differential current
Differential current measurement procedure
†
†
†
†
Select the Leakage function.
Set test parameters.
Connect device under test to the instrument (see figure above).
Press the START key for measurement.
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MI 3310 / MI 3310A SigmaGT
Measurements
Examples of differential current measurement result
Displayed results:
Main result ............. differential leakage current
Notes:
† During the test, a mains voltage is connected to the DUT. If DUT contains moving
parts, make sure that it is safely mounted or protected to prevent possible danger to
the operator or damage to the DUT or surrounding environment!
† Consider any displayed warning before starting measurement!
† The instrument automatically changes L and N polarity of connected DUT during the
test.
5.2.7
Touch leakage current
This test determines the current that would flow if a person touches accessible
conductive parts of the DUT.
The instrument measures the leakage current flowing through the EB/S probe into
earth.
The DUT can be powered from the mains test socket or directly from the installation
(fixed installed equipment).
Touch leakage menu
Test parameters for touch leakage current measurement
OUTPUT
LIMIT
TIME
System voltage [230 V]
Maximum current [0.25 mA, 0.50 mA, 0.75 mA, 1.00 mA, 1.50 mA,
2.00 mA, 3.5 mA, none]
Measuring time [2 s, 3 s, 5 s, 10 s, 30 s, 60 s, 120 s, 180 s, none]
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MI 3310 / MI 3310A SigmaGT
Measurements
Test circuits for touch leakage current measurement
Measurement of touch leakage current
Measurement of touch leakage current on a fixed installed DUT
Touch leakage current measurement procedure
Select the Touch leakage function.
Set test parameters.
Connect EB/S probe to accessible conductive parts of the DUT (see figures above).
For Portable appliance/device:
† Connect device under test to the instrument.
† For fixed equipment:
† Power on the fixed equipment;
† Press the START key for measurement.
†
†
†
†
Examples of touch leakage current measurement results
Displayed results:
Main result ............. touch leakage current
54
MI 3310 / MI 3310A SigmaGT
Measurements
Notes:
† During the test, a mains voltage is connected to the DUT. If DUT contains moving
parts, make sure that it is safely mounted or protected to prevent possible danger to
the operator or damage to the DUT or surrounding environment!
† Consider any displayed warning before starting measurement!
† The instrument automatically changes L and N polarity of connected DUT during the
test.
5.2.8
Polarity test
In this test the polarity of supply cords/ leads is checked.
In the Normal mode the test is performed with internal low voltage sources.
The Active mode is intended to test cords/ leads with integrated RCD protection. Mains
voltage is applied to the tested cord in order to operate the RCD during the test.
Shorted, crossed and open wires are detected in this test.
Polarity test menu
Test parameters for polarity test
TEST
Type of polarity test [normal, active]
Test circuits for polarity test
Polarity test – normal for IEC cord
Polarity test – active for RCD protected
cord
55
MI 3310 / MI 3310A SigmaGT
Measurements
Polarity - Standard test procedure
† Select the Polarity test function.
† Select the normal test subfunction.
† Connect tested IEC cord to the instrument (see figure above).
† Press the START key for measurement.
Polarity - Active test procedure
† Select the Polarity test function.
† Select the active test subfunction.
† Connect tested IEC cord to the instrument (see figure above).
† Press the START key for measurement.
† Switch ON the appliance (RCD) within 5 seconds and follow the instructions on the
display.
† Switch ON the RCD again if necessary.
Examples of polarity test result
Displayed results:
Main result ............. PASS/ FAIL, description of fault
Notes:
† Consider any displayed warning before starting test!
† Active polarity test is intended for testing RCD equipped cords where RCD must be
supplied for proper operation.
† In the active polarity test a switchover between phase and neutral at the mains test
socket is performed during the test. Although the switchover time is short it could
happen that the RCD switches off during the switchover. In this case the warning
‘SWITCH ON THE APPLIANCE’ is displayed again and the RCD must be reswitched ON.
5.2.9
Clamp current test
This function enables the measurement of AC currents in a wide range from 0.1 mA up
to 25 A with current clamps. Typical applications are:
-
Measuring PE leakage currents through PE conductor in permanently installed
DUTs,
Measuring load currents in permanently installed DUTs,
Measuring differential leakage currents in permanently installed DUTs.
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MI 3310 / MI 3310A SigmaGT
Measurements
Clamp current menu
Test parameters for clamp current measurement
LIMIT
Maximum current [0.25 mA, 0.50 mA, 0.75 mA, 1.00 mA, 1.50 mA,
2.25 mA, 2.50 mA, 3.00 mA, 3.50 mA, 5.00 mA, 9.00 mA, none]
TIME
Measuring time [2 s, 3 s, 5 s, 10 s, 30 s, 60 s, 120 s, 180 s, none]
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MI 3310 / MI 3310A SigmaGT
Measurements
Test circuit for clamp current measurement
Connecting current clamp to the instrument
Clamp current measurement procedure
†
†
†
†
†
Select the Clamp current function.
Set test parameters
Connect the current clamp to the instrument (see figure above).
Embrace wire(s) that has to be measured with current clamp
Press the START key for measurement.
Examples of clamp current measurement result
Displayed results:
Main result ............. clamp current
Notes:
† When measuring leakage currents, the neighbour magnetic fields and capacitive
coupling (especially from the L and N conductors) can disturb the results. It is
recommended that the clamp is as close as possible to the grounded surface and
away from wires and other objects under voltage or carrying current.
† METREL offers high quality current clamps for this application.
† Green socket is intended for current clamp shield terminal, if exists. This will improve
measurement of leakage current. The socket is connected to internal grounding
system and through this to PE.
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MI 3310 / MI 3310A SigmaGT
Measurements
5.2.10 RCD/PRCD test
The purpose of this test is to ensure the proper operation of the following residual
current devices:
- Installed in electrical installation and
- Portable residual current devices (PRCD).
Trip-out measurements verify the sensitivity of a RCD at selected residual currents.
RCD test - single test menu
PRCD test - autotest menu
Test parameters for RCD/PRCD test
Test
Type of residual current device [RCD, PRCD]*
Rated residual current [10 mA, 15 mA, 30 mA]
IΔN
MODE
Type of RCD test [single, auto]
* In following text RCD is applied as common word for both RCD and PRCD type
devices. Both are mentioned only where difference exists.
If Single mode is selected.
Multi
Actual test current IΔN [x ½, x 1, x 5]
Phase
Starting angle [0°, 180°, (0°,180°)]
RCD test current starting polarities
Trip-out time limits
Trip-out times according to EN 61540:
½×IΔN*)
IΔN
General RCDs (non-delayed)
tΔ > 300 ms
tΔ < 300 ms
*)
Minimum test period for current of ½×IΔN, RCD shall not trip-out.
5×IΔN
tΔ < 40 ms
Maximum test times related to selected test current for general (non-delayed) RCD
Standard
½×IΔN
IΔN
5×IΔN
EN 61540
400 ms
400 ms
40 ms
PRCD
1999 ms
200 ms
40 ms
RCD
300 ms
300 ms
40 ms
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MI 3310 / MI 3310A SigmaGT
Measurements
Circuits for testing RCD
Testing of standard RCD
Testing of portable RCD (PRCD)
5.2.10.1 RCD single test
Trip-out time measurement procedure
†
†
†
†
†
†
†
†
Select the RCD test function.
Select Single test mode.
Set test parameters.
PRCD: Connect tested PRCD between test socket on the SigmaGT and IEC
appliance connector (see figure above). Depending on the type of PRCD, it may be
necessary to manually switch it on.
RCD: Connect the SigmaGT main entry to socket protected by tested RCD (see
figure above).
Press the START key to perform measurement.
If both current polarities are selected:
Reactivate tested RCD.
Examples of RCD test result
Displayed results:
Main result ............. last measured results
Subresults.............. all results are displayed as subresults
5.2.10.2 Automatic RCD test
RCD autotest function is intended to perform a complete RCD analysis (trip-out times at
different residual currents and current phases).
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MI 3310 / MI 3310A SigmaGT
Measurements
RCD autotest procedure
RCD Autotest steps
† Select the RCD test function.
† Set Auto test mode.
† Select test parameters.
† PRCD: Connect tested PRCD between test socket on
the SigmaGT and IEC appliance connector (see figure
above). Depending on the type of PRCD, it may be
necessary to manually switch it on.
† RCD: Connect the SigmaGT main entry to socket
protected by tested RCD (see figure above).
† Press the START key.
† Test with IΔN, 0° (step 1).
† Re-activate RCD.
† Test with IΔN, 180° (step 2).
† Re-activate PRCD.
† Test with 5×IΔN, 0° (step 3).
† Re-activate RCD.
† Test with 5×IΔN, 180° (step 4).
† Re-activate RCD.
† Test with ½×IΔN, 0° (step 5).
† Test with ½×IΔN, 180° (step 6).
Step 1
Step 2
Step 3
Step 4
61
Notes
Start of test
RCD should trip-out
RCD should trip-out
RCD should trip-out
RCD should trip-out
RCD should not trip-out
RCD should not trip-out
End of test.
MI 3310 / MI 3310A SigmaGT
Step 5 and
Measurements
Step 6
Individual steps in RCD autotest
The test passes if tested RCD:
- Does not trip out at ½×IΔN tests, and
- Trips inside predefined time limits at IΔN, and 5×IΔN tests.
Displayed results:
Main result ............. last measured results
Sub-results ............ all results are displayed as sub-results
Ul-pe ...................... voltage UL-PE
Notes:
† Consider any displayed warning before starting measurement!
† For DUTs with integrated RCD the housing must be opened to access the RCD’s L
output terminal (this should only be performed by a competent engineer).
† Mains voltage is applied to the RCD under test. Do not touch the equipment under
test or the test leads during the test!
5.2.11 Functional test
The DUT’s power consumption is measured in this test. The apparent power is useful
indication for proper operation of the DUT.
Power / functional test menu
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MI 3310 / MI 3310A SigmaGT
Measurements
Test parameters for the Functional test
OUTPUT
TIME
System voltage [230 V]
Measuring time [2 s, 3 s, 5 s, 10 s, 30 s, 60 s, 120 s, 180 s, none]
Circuit for the functional test
Functional test
Functional test procedure
†
†
†
†
Select the Functional test function.
Set measuring time.
Connect tested DUT to the instrument (see figure above).
Press the START key for measurement.
Example of apparent power measurement result
Displayed result:
Main result ............. apparent power
Notes:
† During the test, a mains voltage is connected to the DUT. If DUT contains moving
parts, make sure that it is safely mounted or protected to prevent possible danger to
the operator or damage to the DUT or surrounding environment!
† Consider any displayed warning before starting measurement!
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MI 3310 / MI 3310A SigmaGT
Autotest sequences
6 Autotest sequences
Autotest is the fastest and easiest way to test DUTs. During the autotest
preprogrammed measurements runs automatically in a sequential way. The complete
autotest results can be stored together with their associated DUT name and all related
information.
6.1 Autotest organisator – general menu
Autotest organizer is a configuration tool for preparing and performing autotest
sequence for devices covered by requirements of VDE 0701- 0702 and/or NEN 3140
standards*.
The instrument selects the appropriate test sequence and parameters on base of
entered DUT data (class, accessible conductive parts, nominal power etc).
The test sequence is built up according to the flowchart below.
* Option on request.
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MI 3310 / MI 3310A SigmaGT
Autotest sequences
ACP: accessible conductive part, not earthed
With the autotest organisator any test sequence compatible with applied standard can
be created. The sequences cover virtually any maintenance or periodic test, regardless
of DUT type, safety class, supply cord length, fuse type, etc.
All limits and tests comply with the currently valid standards and regulations. In case of
any changes, a firmware upgrade will be available.
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MI 3310 / MI 3310A SigmaGT
6.1.1
Autotest sequences
Autotest organisator operation
Select Autotest Organisator in main menu.
Examples of Autotest organisator screen
Keys:
¿/À
½/¾
ESC
VIEW (F1)
START
Select organizer item.
Set parameter in selected (highlighted) item.
Returns to previous menu.
Enters View (test sequence) menu.
Starts automatic sequence as currently set in autotest organizer.
Refer to chapter 7.5 Performing autotest sequences for more information.
Autotest organisator view menu
In the View menu the parameters of the selected measurement can be viewed.
Keys in View menu:
¿/À
START
SAVE AS (F3)
BACK (F1)
ESC
Select test to be viewed.
Starts automatic sequence as currently set in autotest organizer.
Refer to chapter 7.5 Performing autotest sequences for more
information.
Opens dialog for saving currently set sequence as a custom autotest.
Returns to mains autotest organizer menu.
Returns to previous menu.
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MI 3310 / MI 3310A SigmaGT
6.1.2
Autotest sequences
Example of creating a test sequence with autotest organisator
A periodic test of an iron will be performed.
Type: flatiron ABC
Un: 230V, 50Hz, 1000 VA
The iron can be classified as followed:
- For a periodic testing, e.g. the VDE0701-0702 test is relevant.
- The iron can be classified as a Class I DUT with isolated metal part and short
supply cord.
Example of test sequence configuration:
Displayed item
1
2
3
4
5
6
7
8
9
10
11
Activity
Information that a test acc. to VDE 0701Standard: VDE 0701-0702
0702 (see note) will be set.
Note: Option on request.
Selection of DUT safety class:
DUT class: 1
- Select Class I.
Information that visual test will be included
Visual test
in the VDE / Class I procedure.
Question if there is an isolated conductive
Accessible conductive parts? YES
part on the DUT:
- Confirm with yes.
Selection of Earth bond limit value on base
Cord length (Earth bond)
of known supply cable length:
L: < 0.3 Ω/<=5 m
- Select appropriate length.
Question if insulation test is applicable:
- Confirm with yes.
Insulation
and
substitute
leakage
Insulation test applicable? YES
measurements will be included in the test
sequence with this confirmation.
Insulation test
Classification of DUT:
Heating elements L: >0.3 MΩ
- Classify the iron as a standard DUT.
Information that insulation resistance
Insulation test
measurement of Class 2 parts will be
included in the (VDE / Class I / with isolated
Accessible cond. Parts L: >2.0 MΩ
accessible conductive parts) test procedure.
Leakage test method:
Selection of leakage current test method:
Leakage
- Select substitute leakage measurement.
Limit / Device type
Classify the iron as an standard DUT with
General device L < 3.5 mA
power <3.5 kW.
Information that substitute leakage current
Touch leakage method: Substitute
measurement class 2 parts will be included
leakage
in the (VDE / Class I / with isolated
Limit < 0.5 mA
accessible conductive parts) test procedure.
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Autotest sequences
The following parameters can be viewed in general for all measurements / tests:
Ì
Ì
Ì
Ì
Measurement mode,
Output test voltage or current (except in visual test and TRMS current
measurement),
Pass level (except in visual test),
Measurement duration (except in visual test).
6.2
Custom autotests
In autotest custom menu setting and editing user-defined autotest procedures is
allowed. Up to 50 custom autotest sequences can be pre-programmed in this autotest
mode.
12 pre-programmed autotest sequences are added to the list by default.
The sequences can be also uploaded from the PC software PATLink PRO. Refer to
chapter 7.5 Upload test data for more information.
The pre-programmed sequences can be restored to default settings by selecting
Original settings in Setup menu.
Select Custom Autotest in PAT testing main menu.
Custom autotest menu
Keys:
À/¿
VIEW (F1)
DELETE (F3)
START
ESC
Select the custom autotest.
Opens View menu for viewing details of selected test sequence
Removes selected test, see chapter 6.2.2 Deleting an existing
custom test sequence.
Starts the selected autotest. See chapter 6.5 Performing autotest
sequences.
Returns to Main menu.
Note:
† If more than 50 autotests are saved, »Out of memory« message is displayed.
6.2.1
Viewing, modifying and saving an custom autotest
An existing custom autotest sequence can be viewed, modified and saved. These
functionalities are available in the Custom autotest view menu.
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Autotest sequences
View setup of selected custom autotest
Keys in custom autotest sequence view mode:
¿/À
SAVE (F2)
SAVE AS (F3)
EDIT (F4)
START
BACK (F1)
ESC
6.2.1.1
Select test function in the sequence.
Stores autotest sequence under the same name. See chapter
6.2.1.2 Saving autotest sequences.
Stores autotest sequence under a new name. See chapter 6.2.1.2
Saving autotest sequences.
Opens menu for modifying parameters of selected test function. See
chapter 6.2.1.1 Modification of an autotest sequence.
Starts running the selected autotest. See chapter 6.5 Performing
autotest sequences.
Returns back to custom autotest menu.
Modification of an autotest sequence
Each test function has at least one parameter to set / reset or adjust.
Common parameters
Defines appearance of selected function, see table below.
MODE
If MODE not disabled
Amplitude of measuring quantity, see particular test functions.
OUTPUT
Limit value of measured item, intended for PASS/FAIL decision.
LIMIT
Required test period.
TIME
Measurement mode options
Mode
Option
Note
The selected measurement is skipped.
Disable
One measurement will be performed
Single
during the autosequence.
Continuous Up to 10 repetitive measurements can
be performed.
Test can be performed.
Only visual test and polarity test
Enable
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Modification parameters of selected test function
Keys:
À/¿
½/¾
CONFIRM (F1)
ESC
6.2.1.2
Select the parameter.
Change the value of selected parameter (highlighted).
Accepts modified function and returns to the view of selected test
sequence.
Returns to the view of selected test sequence without changes.
Saving autotest sequences
There are two saving possibilities; they are defined in view menus of particular autotest
option.
SAVE
SAVE AS
Stores autotest sequence in the place of selected autotest sequence,
name can be modified.
Stores as new autotest sequence next to the last one, existing-base
autotest sequence keeps unchanged.
Save option
Save as option
Autotest custom Save menus
Keys:
½/¾
Alphanumeric
SHIFT+ Alphanumeric
Å
SAVE (F1)
UNDO (F2)
ESC
Select character in line.
Enters character.
Enters small letter or special character.
Deletes character left to cursor.
Confirms saving custom autotest sequence under entered
name.
Discards modifications and recover original entry.
Returns back to custom autotest menu.
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6.2.2
Autotest sequences
Deleting an existing custom test sequence
Delete selected custom autotest sequence
Keys:
Y/ N
Any other key
Confirms or rejects deleting of selected custom autotest sequence.
Return back to custom autotest menu without changes.
Note:
† First custom autotest from the list cannot be deleted!
6.3
Project autotests
The Project autotests is an unique tool that dramatically simplifies and speeds up
repeated (periodic) testing of DUTs.
The main idea is to re-use known stored data (either in instrument or on a PC) of the
tested DUT. The following data can be recalled from the instrument’s memory and reused:
Test sequence
If the sequence has not changed (this is usually the situation) the user does not need to
care about setting the right test sequence and parameters.
DUT data
ID number, names, descriptions, addresses, comments are not needed to be re-entered
again. Old data are offered by default.
Old test results
New Project Autotest test results can be compared with previous results. The
instrument automatically calculates the trends for each measurement.
Note:
† If the test results are close to the limit they should be compared with old test results.
If the trends are deteriorating, the safety of the DUT and the time between test
should be reassessed. If the results stay stable the DUT can generally be treated as
safe.
Old test results can be uploaded from a PC back to the instrument. This brings further
advantages:
- Old test results are not occupying the instrument’s memory and can be
temporarily uploaded only for the purpose of re-testing,
- Test results and DUT data can be moved / shared among different test
instruments,
- DUT data can be pre-entered on the computer and then sent to the instrument.
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6.3.1
Autotest sequences
Selecting a project autotest
The first step when performing project autotests is to recall the appropriate stored DUT
data from the instruments memory. The procedure is similar as if test results are to be
recalled from the instrument’s memory.
Project autotests main menu
When searching for stored autotest results the following filters can be used to narrow
the hits:
- Device number,
- User
- Test site,
- Location
- Date from and date to.
Keys:
Select filter line.
À/¿
½ / ¾, Alphanumeric
Edit selected filter.
FIND (F1)
Starts search after filters are setup correctly.
UNDO (F2)
Undo latest change.
TYPE (F3)
Selects parameter line type.
Returns to Main menu.
ESC
Notes:
† To change the selected parameter line type, press the TYPE (F3) key and the
»parameter type« will become highlighted (e.g. DUT). The keys ½ and ¾ can then
be used to change the parameter type and by pressing ENTER key the choice can
be confirmed. Once the parameter types have been set up, the data required to filter
the files can be inserted. Filter information can be inserted via the alphanumeric
keypad or, in some filter fields such as user, can also be selected from a predefined
list by pressing the LIST (F4) key. The DUT number field can also be read using a
barcode reader.
† By placing a »*« (shift + “2”) in a particular field, tells the instrument not to search the
associated filter field. When searching, the instrument will therefore ignore data in
this parameter and go on to find all the DUTs that conform to data placed in the
other filter fields.
† To find all stored results, enter »*« in the all fields (excluding DATE where the
correct from and to dates must be entered).
If the search filters are set up correctly and the DUTs exist in the units memory, the
Project autotests result menu will be displayed.
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Autotest sequences
While recalling stored results, the instrument shows a bar graph and a ratio of files
found compared to files stored in memory (e.g. 7/11 implies 7 results have been found
to meet the filter criteria out of a potential 11 results stored in the flash memory).
Project autotest result menu
Keys:
À/¿
PgUp (F1)
PgDown (F2)
ENTER
START
ESC
Select the DUT that should be retested.
Recalls autotest project results for selected DUT.
Starts running new autotest for selected DUT, see 6.3.2 Starting a
project autotest
Returns to Main menu.
Note:
† Barcode reader can also be applied for selecting the DUT, see chapter 6.4 Working
with barcode reader.
DUT tickers
Each DUT is marked with a ticker. The ticker appears at the right of the DUT number
and helps to speed up finding DUTs to be retested.
The meaning of the tickers is as follows:
PC
PC9
I
I9
The stored DUT data was uploaded from PC
The stored DUT data was uploaded from PC and has been retested
The stored DUT data was performed with the instrument and stored.
The stored DUT data was performed with the instrument and stored and has
been retested.
Recalling autotest project results for selected DUT
View results menu examples
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Autotest sequences
Keys:
À/¿
PgUp (F1)
PgDown (F2)
ESC
6.3.2
Scroll over stored results of particular functions for selected custom
autotest sequence.
Returns to Main menu.
Starting a project autotest
Starting the project autotest will apply the sequence as is defined for selected device.
Each test function that is not disabled is executed in prescribed order, see 6.5
Performing autotest sequences. After the prescribed testing is finished, the instrument
offers some saving options.
Saving options after retesting
Keys:
SAVE (F1)
VIEW (F3)
UNDO (F2)
ESC
Saves results, see 7.1 Saving autotest results.
Opens menu for viewing and evaluating test results. See chapter 6.3.3
Comparison of results.
Returns to Project Autotest menu.
Exactly the same DUT data (except time and user) will be offered to store in the
selected Project autotest.
When a new autotest is saved, it will get an »I« ticker. The original autotest will get a
»I9« or »PC9« ticker when the DUT is retested through the project autotest.
6.3.3
Comparison of results (evaluation of result trends)
Viewing results of retested DUT offers not only to check results as they are but also an
additional option TREND is offered. Trend enables evaluation of critical safety
parameters of the DUT.
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Autotest sequences
View Project autotest results menu
Keys:
À/¿
PgUp (F1)
PgDown (F2)
TREND (F4)
ESC
Scroll over test results of particular functions.
Trend comparison of current results with stored.
Returns to Project autotest menu.
Evaluation of test results
Compare results menu example
Meaning of trend symbols:
Ç
New result of particular test is better than last result.
Examples: New insulation resistance result is higher than old result.
New earth bond result is lower than old one.
{
Difference between old and new result of particular test is so small that can be
treated as the same.
Example: New insulation resistance result stays at the same level as old result.
È
New result of particular test is worse than last result.
Examples: New insulation resistance result is lower than old result.
New earth bond result is higher than old one.
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Autotest sequences
Keys:
À/¿
PgUp (F1)
PgDown (F2)
ESC
Scroll over comparison results of particular functions.
Returns to Project autotest menu.
Note:
† Trend operates only before saving the new results of autotest procedure and with
existing old results of the same autotest procedure in the instrument memory.
6.4
Working with barcode / RFID tag
The instrument enables application of barcode, RFID tags for testing automation and
speedup.
It supports the following functions:
- Reading pre-defined autotest shortcut codes,
- Reading DUT numbers.
This enables running predefined autotest sequence or select tested device.
For this purpose the barcode reader and/or RFID tag reader shall be connected to
BARCODE connector of the instrument, see the figures below.
Two barcode systems are supported. Refer to Appendix B for detailed information.
Connecting the barcode reader to the SigmaGT instrument
Connecting the RFID tag reader/writer to the SigmaGT instrument
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Autotest sequences
Entering to barcode / RFID tag the following menu appears:
Barcode / RFID tag autotest menu
Keys:
À/¿
ENTER
ESC
Select the reader device.
Opens menu for selected device.
Returns to Main menu.
6.4.1 Working with RFID tags
With the bottom screen, the SigmaGT instrument is ready to accept RFID tag data.
Waiting for RFID tag data
Key:
ESC
Returns to Barcode/tag menu.
Once the data from RFID tag have been successfully received, the following menu is
displayed:
RFID tag menu
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Autotest sequences
Keys:
À/¿
ENTER
ESC
Select the option.
Opens menu for selected option.
Returns to Barcode/tag menu.
If no test results were stored in RFID tag, the View results option won’t be displayed.
The following actions can be performed:
- New reading from RFID tag,
- View autotest sequence,
- View autotest results,
- Start autotest sequence.
Viewing autotest sequence from RFID tag
Select View autotest in TAG menu and press ENTER key to confirm. Refer to chapter
6.2.1 Viewing/modifying and saving of existing custom autotest.
Starting autotest sequence from RFID tag
Select Start new autotest in TAG menu and press ENTER key. Refer to chapter 6.5
Performing autotest sequences.
Viewing autotest results from RFID tag
Select View results in TAG menu and press ENTER key to confirm. Refer to chapter
7.2 Recalling results.
Sending an autotest sequence to RFID tag
From the Autotest custom menu press the SEND key. Selected autotest sequence is
loaded to the RFID tag using RFID reader/writer.
See RFID reader/writer user manual for more information.
Sending an autotest sequence/results to RFID tag
Autotest sequence/results can be sent to RFID TAG from the Save results or Recall
memory menu. Press the SEND key. When sending data from Recall results menu
select TAG reader/writer option first and press ENTER key to confirm. Selected data
from the instrument are loaded to the RFID tag using RFID reader/writer.
See RFID reader/writer user manual for more information.
Note:
† Because of limited memory space of RFID tags, the following data are not stored in
RFID tags:
- DUT name,
- Repairing code,
- Comments.
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Autotest sequences
6.4.2 Reading barcode for autotest
The instrument automatically enables barcode reading in Autotest shortcut menu and
Project autotest menu instead manual entry of shortcut code and/or device number.
Shortcut code
Device number
Barcode reading possibilities
A successful receive of the barcode/tag data is confirmed by two short confirmation
beeps.
6.4.3 Reading barcode for working with results
For working with stored results, the barcode reader can also applied for DUT number
entry. A successful receive of the barcode is confirmed by two short confirmation beeps.
Adding DUT number in save results / search results menu
6.5
Performing autotest sequences
An autotest can be started from any of the Autotest menus by following simple
procedures:
- In Autotest shortcut menu, select the test sequence to be executed by code
(see 6.1.1 Selecting the autotest shortcut sequence).
- In Autotest custom menu, select the test sequence to be executed (see 6.2
Autotest custom).
- In Project autotest menu, select the test sequence to be executed by device
number (see 6.3.1 Selecting a project autotest).
Press the START key to start the autotest sequence.
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Autotest sequences
Note that autotest procedure can be concluded or with skipped particular functions in
case that any of previous preceded function is skipped or get bad result. Reason is
safety for operator and DUT.
6.5.1
Visual inspection
A thorough visual check must be carried out before each electrical safety test.
Following items should be checked:
- Inspection of DUT for sign of damage.
- Inspection of flexible supply cable for damage.
- Any signs of pollution, moisture, dirt that can jeopardize safety. Especially
openings, air filters, protection covers and barriers must be checked!
- Are there signs of corrosion?
- Are there signs of overheating?
- Inscriptions and marking related to safety must be clearly readable.
- Installation of the DUT must be performed according to the user manuals.
- During visual inspection the measuring points for the electrical testing have to be
determined too.
If the visual test passes, the instrument automatically proceeds with the next test in the
sequence.
If the visual test fails the user must evaluate if it is safe to proceed with the
measurements.
Visual test menu
Keys
PASSall (F1)
PASS (F2)
FAIL (F3)
SKIP (F4)
6.5.2
Confirms that the complete visual inspection passed.
Confirms that the visual inspection passed.
Ends the autotest sequence.
Skips visual test.
Earth bond resistance measurement
Measurement is described in chapter 5.2.1 Earth bond resistance.
If the earth bond test fails or was skipped other tests will not be carried out because of
safety.
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Autotest sequences
Earth bond menu
Keys
START
Starts the earth bond resistance measurement.
ENTER
REPEAT (F3)
SKIP (F4)
Proceeds with the next earth bond resistance measurement
(in continuous mode).
Proceeds to the next autotest sequence measurement (in single
measurement mode only).
Proceeds to the next autotest sequence measurement (in continuous
measurement mode only).
Repeats the earth bond resistance measurement.
Skips earth bond resistance measurement.
Note:
Ì When polarity test in enabled in autotest sequence then earth bond resistance is
performed between IEC test connector (PE terminal) and test socket (PE
terminal). If polarity test is disabled in autotest sequence, earth bond test is
perfomed between EB/S test probe and test socket (PE terminal).
6.5.3
Insulation resistance measurement
Measurement is described in chapter 5.2.2 Insulation resistance.
If the insulation test fails or was skipped other tests will not be carried out because of
safety.
Insulation resistance menu
Keys
START
Starts the insulation resistance measurement.
Proceeds with the next insulation resistance measurement
(in continuous mode).
Proceeds to the next autotest sequence measurement (in single
measurement mode only).
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ENTER
REPEAT (F3)
SKIP (F4)
6.5.4
Autotest sequences
Proceeds to the next autotest sequence measurement (in continuous
measurement mode only).
Repeats the insulation resistance measurement.
Skips insulation resistance measurement.
Insulation resistance – S probe measurement
Measurement is described in chapter 5.2.3 Insulation resistance – S probe.
If this insulation test fails or was skipped other tests will not be carried out because of
safety.
Insulation resistance – S probe menu
Keys
START
Starts the Insulation resistance – S probe measurement.
ENTER
REPEAT (F3)
SKIP (F4)
6.5.5
Proceeds with the next insulation resistance measurement
(in continuous mode).
Proceeds to the next autotest sequence measurement (in single
measurement mode only).
Proceeds to the next autotest sequence measurement (in continuous
measurement mode only).
Repeats the insulation resistance – S probe measurement.
Skips insulation resistance – S probe measurement.
Substitute leakage current measurement
Measurement is described in chapter 5.2.4 Substitute leakage current.
If the substitute leakage test fails or was skipped other tests will not be carried out
skipped because of safety.
Substitute leakage test menu
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Autotest sequences
Keys:
Starts the substitute leakage current measurement.
START
ENTER
REPEAT (F3)
SKIP (F4)
6.5.6
Proceeds with the next substitute leakage current measurement (in
continuous measurement mode only).
Proceeds to the next autotest sequence measurement (in single
measurement mode only).
Proceeds to the next autotest sequence measurement (in continuous
measurement mode only).
Repeats the substitute leakage current measurement.
Skip substitute leakage current measurement.
Substitute leakage – S probe measurement
Measurement is described in chapter 5.2.5 Substitute leakage – S probe.
If the substitute leakage test fails or was skipped other tests will not be carried out
skipped because of safety.
Substitute leakage - S test menu
Keys:
START
Starts the Substitute leakage current – S probe measurement.
ENTER
REPEAT (F3)
SKIP (F4)
6.5.7
Proceeds with the next substitute leakage current –S probe
measurement (in continuous measurement mode only).
Proceed to the next autotest sequence measurement (in single
measurement mode only).
Proceeds to the next autotest sequence measurement (in continuous
measurement mode only).
Repeats the substitute leakage current – S probe measurement.
Skips substitute leakage current – S probe measurement.
Differential leakage current
Measurement is described in chapter 5.2.6 Differential leakage current.
If the differential leakage test fails or was skipped other tests will not be carried out
because of safety.
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Autotest sequences
Leakage current test menu
Keys:
START
Starts the leakage current measurement.
ENTER
REPEAT (F3)
SKIP (F4)
6.5.8
Proceeds with the next leakage current measurement (in continuous
measurement mode only).
Proceed to the next autotest sequence measurement (in single
measurement mode only).
Proceeds to the next autotest sequence measurement (in continuous
measurement mode only).
Repeats the leakage current measurement.
Skips leakage current measurement.
Touch leakage current measurement
Measurement is described in chapter 5.2.7 Touch leakage current.
If the touch leakage test fails or was skipped other tests will not be carried out because
of safety.
Touch leakage test menu
Keys:
START
ENTER
REPEAT (F3)
SKIP (F4)
Starts the touch leakage current measurement.
Proceeds with the next touch leakage current measurement (in
continuous measurement mode only).
Proceed to the next autotest sequence measurement (in single
measurement mode only).
Proceeds to the next autotest sequence measurement (in continuous
measurement mode only).
Repeats the touch leakage current measurement.
Skips touch leakage current measurement.
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6.5.9
Autotest sequences
Polarity test
Measurement is described in chapter 5.2.8 Polarity test.
If the polarity test fails or was skipped other tests will not be carried out because of
safety.
Polarity test menu
Keys:
START
REPEAT (F3)
SKIP (F4)
Starts the polarity test.
Proceed to the next autotest sequence measurement.
Repeats the polarity test.
Skips polarity test.
6.5.10 TRMS current measurement using clamp current adapter
Measurement is described in chapter 5.2.9 Clamp current measurement.
If the current clamp test fails or was skipped other tests will not be carried out because
of safety.
Clamp current menu
Keys:
START
ENTER
REPEAT (F3)
SKIP (F4)
Starts the TRMS current measurement.
Proceeds with the next TRMS current measurement (in continuous
measurement mode only).
Proceeds to the next autotest sequence measurement (in single
measurement mode only).
Proceeds to the next autotest sequence measurement (in continuous
measurement mode only).
Repeats the TRMS current measurement.
Skips TRMS current measurement.
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Autotest sequences
6.5.11 RCD/PRCD test
Measurement is described in chapter 5.2.10 RCD/PRCD test.
If the RCD test fails or was skipped other tests will not be carried out because of safety.
RCD test menu
Keys:
START
REPEAT (F3)
Starts the RCD test.
Proceeds to the next autotest sequence measurement.
Repeats the RCD test.
SKIP (F4)
Skips the RCD test.
6.5.12 Power/ Functional test
The main objective of this test is to verify correct operation of the DUT.
Especially items relevant for safety should be checked:
- All main operating modes. Testing power during this check is useful.
- Mechanical operation (motors, rotating parts)
- Safety relevant functions (alarms, switches etc)
A PASS/ FAIL ticker can be committed manually.
The power measurement can be carried out optionally and is stored too. The Power
measurement is described in chapter 5.2.11 Power / Functional test.
Power / Functional test
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Autotest sequences
Keys:
PASS (F1)
Starts the POWER test (optional).
Proceeds to the next autotest sequence measurement.
Commits a manual ticker and ends autotest.
FAIL (F2)
Commits a manual ticker and ends the autotest sequence.
REPEAT (F3)
Repeats the functional / power test.
SKIP(F4)
Skips the Power/ Functional test.
START
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Working with results
7 Working with autotest results
After the autotest sequence is completed, measurement results can be:
- Saved to the flash memory of the instrument. Before that they can be viewed and
edited. Refer to chapter 7.1 Saving autotest results for more information.
- Send to PC or a test report can be printed out to serial printer. Refer to chapter
7.4 Downloading and printing results for more information.
- DUT label can be printed out. Refer to chapter 7.4 Downloading and printing
results for more information.
7.1
Saving autotest results
After the autotest sequence is completed, Save results menu is displayed.
Following data can be added to the test results for saving:
- Device number and its name
- Test site and location,
- Retest period,
- Repairing code,
- Comments.
Save results menus
Keys:
À/¿
½ / ¾, alphanumeric
SAVE (F1)
UNDO (F2)
VIEW (F3)
LIST(F4)
ESC
Select the item.
Edit data
Saves test results and returns to last autotest menu.
Undo changes.
Views test results, see 6.3.3 Comparison of results
Offers predefined names for selected field.
Returns to Main menu.
Entry fields for tested device data:
Field
Length* Note
12ASN Numeric code of device. It can also be entered via
DEVICE No.
barcode reader scanning, see chapter 6.4 Working with
barcode reader.
15ASN Name of test site. Can also be selected from the list of
Test site
100 predefined names. 4.2.5.3 Test sites submenu.
15ASN Name of location. Can also be selected from the list of
Location
100 predefined names. 4.2.5.4 Locations submenu.
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DEVICE NAME
Retest period
Repairing code
Comments
Working with results
15ASN Name of tested device. Can also be selected from the list
of 100 predefined names, see 4.2.5.2 Devices submenu.
2N Period to retest in months
20ASN
25ASN
* Length is defined as:
N
ASN
numerals (numeric characters),
alpha-numeric or special characters.
All parameters added to the autotest results have, in general, a possibility to be
replicated or default set to blank when saving new autotest results. Device number can
also be automatically incremented when new autotest sequence is finished.
For detailed description refer to chapter 4.2.8.6 Instrument settings.
Notes:
† The date and time are automatically attached to the saved results.
† The autotest results cannot be stored if the Device no. field is empty.
† User field cannot be edited (this must be selected from the User/ Device data menu
of the instrument).
7.2
Recalling results
Select Recall/delete/send memory in Main menu by using ¿ and À keys and press
ENTER key to confirm. Search results menu is displayed.
Search results menus
When searching for stored results the following filters can be used to narrow the hits:
-
DUT number
Test site,
Location,
Date from and date to,
User.
By using ¿ and À cursor keys select the filter you want to edit.
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Keys:
À/¿
½ / ¾, Alphanumeric
FIND (F1)
UNDO (F2)
TYPE (F3)
ESC
Working with results
Select parameter line.
Edit parameter line.
Starts search after filters are setup correctly.
Undo latest change.
Selects parameter line type.
Returns to Main menu.
Notes
† To change the selected parameter line type, press the F3 function key and the
»parameter type« will become highlited (e.g. DEVICE). The cursor keys ½ and ¾
can then be used to change the parameter type and by pressing ENTER key the
choice can be confirmed. Once the parameter types have been set up, the data
required to filter the results can be inserted. Filter information can be inserted via the
alphanumeric keypad or, in some filter fields such as user, can also be selected from
a predefined list by pressing the F4 function key. The device number field can also
be read using a barcode reader, see chapter 6.4 Working with barcode reader.
† By placing a »*« (shift + “2”) in a particular field, tells the instrument not to search the
associated filter field. When searching, the instrument will therefore ignore data in
this parameter and go on to find all the DUTs that conform to data placed in the
other filter fields.
† To find all stored results, enter »*« in the all fields (excluding DATE where the
correct from and to dates must be entered).
When the search filters have been correctly set up, a search can be performed by
pressing the F1 function key. If the search filters are set up correctly and the DUTs exist
in the units memory, the Recall results menu will be displayed.
While recalling stored results, the instrument shows a bargraph and a ratio of files found
compared to files stored in memory (e.g. 7/11 implies 7 results have been found to meet
the filter criteria out of a potential 11 results stored in the flash memory).
Recall memory menu
Once the DUTs have been found, the ¿ and À cursor keys and F1 and F2 function
keys can be used to scroll through the list of DUTs.
More information relating to a DUT can be viewed by pressing the ENTER key on the
appropriate DUT. The information can be scrolled using the F1 and F2 function keys.
90
MI 3310 / MI 3310A SigmaGT
Working with results
View results menu
Use the ESC key to return to Recall memory or Search memory menus.
From the Recall memory menu stored data can be downloaded to a PC, printed out to
a serial printer or deleted from the memory. Refer to chapters 7.4 Downloading and
printing results and 7.3 Deleting results, respectively.
7.3
Deleting results
Stored autotest results can also be deleted from the memory.
Enter Recall/delete/send memory menu. Recall the result(s) you want to delete (Refer
to chapter 7.2 Recalling results for detailed information on recalling results).
In the Recall memory menu, press the F3 function key. Delete menu will be displayed.
In this menu the following functions can be performed.
DELETE:
DELETE
SELECTED:
DELETE ALL:
Deletes the single file last highlighted when the F3 function key was
pressed,
Deletes all the files found from searching the memory of the
instrument,
Clears all stored test data from the instrument.
Delete results menu
Keys:
À/¿
DELETE (F3)
ESC
Select deleting option.
Deletes selected results.
Returns to memory recall menu.
Confirm the delete activity by using F3 key. After performing the selected option,
instrument returns to Recall memory menu accepting the new memory state. If you
don't want to delete the results, press the ESC key in Delete menu. Instrument returns
to Recall memory menu without any changes.
91
MI 3310 / MI 3310A SigmaGT
7.4
Working with results
Downloading and printing results
The instrument offers the following possibilities to send selected result or selection to:
- PC (to store and later operations on stored results),
- Serial printer for fast report printing,
- Label printer, and
- RFID tag (only one result).
It is possible to send data to selected output after:
- Autotest sequence is completed, or
- Recalling stored results from the instrument memory.
By pressing the SEND function key in the Save results or Recall memory menus,
Send results menu is available.
Send to PC
Send to serial printer
Send to barcode printer
Send results menus
Keys:
À/¿
ESC
SEND (F3)
SENDall (F4)
Send to PC
BAUD (F1)
Select activity.
Returns to memory recall menu.
Sends only selected result to the selected device.
Sends filtered results (see 7.2 Recalling results) to the selected device.
Opens menu for selection of Baud Rate, see 4.2.8.8 Communication
settings.
COMM (F2)
Opens menu for interface selection (RS232, USB or Bluetooth), see
4.2.8.8 Communication settings.
Send to serial printer
SET (F2)
Selects serial printer data transfer handshake control.
Send to barcode printer
TAG1 (F2) or Generates one or two printed labels per stored result, e.g. for appliance
only (TAG1) or for appliance plus its power supply cord (TAG2).
TAG2 (F2)
92
MI 3310 / MI 3310A SigmaGT
Working with results
Send to serial printer
Serial printer data transfer handshake control.
Keys:
À/¿
SAVE (F1)
ESC
Select the option.
Accepts selected option.
Returns to Send results menu.
..............................
METREL
Testing laboratory
Horjul, Slovenia
..............................
DEVICE 11072010
TEST SITE METREL
LOCATION OFFICE 1
TIME/DATE 09:31 11-JUL-2008
USER TOMAZ
RESULT: PASS
---------------------------------------VISUAL PASS
EARTH BOND It: 10A~ Rlim: 0.10 Ohm
1. R = 0.03 Ohm PASS
INSULATION Ut: 500V Rlim: 1.00 MOhm
1. R = 178.9 MOhm PASS
LEAKAGE Ut: 230V~ Ilim: 0.75 mA
1. I = 0.23 mA PASS
POWER
1. P = 2.01KVA PASS
DEVICE NAME: APP 1
RETEST PERIOD : 11/07/2009
REPAIRING CODE: 021268505
COMMENTS: ========================================
END OF DATA
An example of data sent to serial printer
Notes:
† When working with serial printers, the baud rate is set by default to 9600 bps.
† Software transfer control uses XON (CTRL-Q) and XOFF (CTRL-S) characters.
† Hardware transfer control uses DTR line.
93
MI 3310 / MI 3310A SigmaGT
7.4.1
Working with results
Send to barcode printer
Refer to chapter 4.2.8.6 Instrument settings and Appendix B for detailed information
about barcode systems used when printing barcode labels.
1 tag, barcode system: 2 tags, barcode system: 2 tags, barcode system:
single (top label)
double
single
1 tag, barcode system:
double (bottom label)
Examples of DUT labels
94
MI 3310 / MI 3310A SigmaGT
7.5
Working with results
Data upload / download
Autotests and results from PC software can be uploaded to the instrument from the
Data upload / download menu. Also the following items can be downloaded and edited
or created with PC software and then uploaded onto the instrument:
-
Users,
DUTs,
Test sites,
Locations.
Downloading / uploading test data menu
During the data transfer from the PC to the instrument, the transfer status will be
displayed.
Pressing ESC key instrument returns to Main menu.
For detailed information on data uploading / downloading refer to help menus of PC
software PATLink PRO.
95
MI 3310 / MI 3310A SigmaGT
Maintenance
8 Maintenance
8.1
Periodic calibration
It is essential that all measuring instruments are regularly calibrated in order for the
technical specification listed in this manual to be guaranteed. We recommend an annual
calibration. The calibration should be done by an authorized technical person only.
8.2
Fuses
There are two fuses available from left side connector panel:
F1 = F2 = T 16 A / 250 V (32 × 6.3 mm): intended for instrument protection.
If the instrument does not respond after connection to mains supply, disconnect the
mains supply and accessories and then check these fuses. For position of fuses refer to
chapter 2.2 Connector panel.
Warning!
† Switch off the instrument and disconnect all test accessories and mains cord
before replacing the fuses or opening the instrument.
† Replace blown fuse with the same type.
8.3
Service
For repairs under or out of warranty time please contact your distributor for further
information.
Unauthorized person is not allowed to open the SigmaGT instrument. There are no user
replaceable parts inside the instrument.
8.4
Cleaning
Use a soft, slightly moistened cloth with soap water or alcohol to clean the surface of
SigmaGT instrument. Leave the instrument to dry totally before using it.
Notes:
† Do not use liquids based on petrol or hydrocarbons!
† Do not spill cleaning liquid over the instrument!
96
MI 3310 / MI 3310A SigmaGT
Instrument set and accessories
9 Instrument set and accessories
Standard set of the instrument MI 3310 SigmaGT
Ì
Ì
Ì
Ì
Ì
Ì
Ì
Ì
Ì
Ì
Ì
Ì
Ì
Instrument MI 3310 SigmaGT
Small soft carrying bag
Mains cable 16 A
Test lead (black)
Test tip (black)
Alligator clip (black)
IEC test cable, 2 m
PC software PATLink PRO with RS232 and USB cables
Instruction manual
Short instruction manual
Declaration of conformity
Production verification data
6 Ni-MH rechargeable accus, size C
Optional accessories
See the attached sheet for a list of optional accessories that are available on request
from your distributor.
Standard set of the instrument MI 3310A SigmaGT
Ì
Ì
Ì
Ì
Ì
Ì
Ì
Ì
Ì
Ì
Ì
Ì
Ì
Instrument MI 3310A SigmaGT (with Bluetooth)
Small soft carrying bag
Mains cable 16 A
3 test leads (brown, green, black)
3 test tips (brown, green, black)
3 alligator clips (brown, green, black)
IEC test cable, 2 m
PC software PATLink PRO with RS232 and USB cables
Instruction manual
Short instruction manual
Declaration of conformity
Production verification data
6 Ni-MH rechargeable accus, size C
Optional accessories
See the attached sheet for a list of optional accessories that are available on request
from your distributor.
97
MI 3310 / MI 3310A SigmaGT
Appendix A – Preprogrammed autotests
A Appendix A – Preprogrammed autotests
Pre-programmed autotest sequences
No.
Name
1 Cl_1_Iso
2 Cl1_Iso_BLT
3 Cl_1_Ia
4 Cl_1_Ia_BLT
5 Cl_2_Iso
6 Cl_2_Ibs
7 Cl_1_IsoIa
8 Cl1_IsoIaBLT
9 Cl_2_IsoIbs
10 Cl_2
11 Cl_3_Iso
12 Cl_3
Description
Testing according to VDE 0701-0702.
Class I device.
Insulation resistance and substitute leakage current measurements are
selected.
Testing according to VDE 0701-0702.
Class I device with isolated accessible conductive parts.
Insulation resistance and substitute leakage current measurements are
selected.
Testing according to VDE 0701-0702.
Class I device.
Differential leakage current measurement is selected.
Testing according to VDE 0701-0702.
Class I device with isolated accessible conductive parts.
Differential leakage current and touch leakage current measurements
are selected.
Testing according to VDE 0701-0702.
Class II device with isolated accessible conductive parts.
Insulation resistance and substitute leakage current measurements are
selected.
Testing according to VDE 0701-0702.
Class II device.
Touch leakage current measurement is selected.
Testing according to VDE 0701-0702.
Class I device.
Insulation resistance and differential leakage current measurements
are selected.
Testing according to VDE 0701-0702.
Class I device with isolated accessible conductive parts.
Insulation resistance, differential leakage current and touche leakage
current measurements are selected.
Testing according to VDE 0701-0702.
Class II device with isolated accessible conductive parts.
Insulation resistance and touch leakage current measurements are
selected.
Testing according to VDE 0701-0702.
Class II device without any isolated accessible conductive parts.
Testing according to VDE 0701-0702.
Class II device with isolated accessible conductive parts.
Testing according to VDE 0701-0702.
Class II device without any isolated accessible conductive parts.
98
MI 3310 / MI 3310A SigmaGT
Appendix A – Preprogrammed autotests
Pre-programmed autotest sequences table
Autotest shortcut
code
Visual test
Output
Limit
Time
Output
Insulation
Limit
Time
Output
Insulation
Limit
(probe)
Time
Output
Sub leakage Limit
Time
Output
Sub leakage
Limit
(probe)
Time
Output
Differential
Limit
leakage
Time
Output
Touch
Limit
leakage
Time
Output
Power
Limit
Time
Output
TRMS clamp
Limit
current
Time
Polarity test
Earth bond
01
02
03
04
Cl_1_Iso
Cl1_Iso_BLT
Cl_1_Ia
Cl_1_Ia_BLT
;
200 mA
0.30 Ω
5s
500 V
1.00 MΩ
5s
:
:
:
40 V
3.50 mA
5s
:
:
:
:
:
:
:
:
:
230 V
:
180 s
:
:
:
:
;
200 mA
0.30 Ω
5s
500 V
1.00 MΩ
5s
500 V
2.00 MΩ
5s
40 V
3.50 mA
5s
40 V
0.50 mA
5s
:
:
:
:
:
:
230 V
:
180 s
:
:
:
:
;
200 mA
0.30 Ω
5s
:
:
:
:
:
:
:
:
:
:
:
:
230 V
3.50 mA
180 s
:
:
:
230 V
:
180 s
:
:
:
:
;
200 mA
0.30 Ω
5s
:
:
:
:
:
:
:
:
:
:
:
:
230 V
3.50 mA
180 s
230 V
0.50 mA
180 s
230 V
:
180 s
:
:
:
:
99
MI 3310 / MI 3310A SigmaGT
Appendix A – Preprogrammed autotests
Pre-programmed autotest sequences table (cont’d)
Autotest shortcut
code
Visual test
Output
Earth bond Limit
Time
Output
Insulation Limit
Time
Output
Insulation
Limit
(probe)
Time
Output
Sub leakage Limit
Time
Output
Sub leakage
Limit
(probe)
Time
Output
Differential
Limit
leakage
Time
Output
Touch
Limit
leakage
Time
Output
Power
Limit
Time
Output
TRMS
clamp
Limit
current
Time
Polarity test
05
06
07
Cl_2_Iso
Cl_2_Ibs
Cl_1_IsoIa
Cl1_IsoIaBLT
;
:
:
:
:
:
:
500 V
2.00 MΩ
5s
:
:
:
40 V
0.50 mA
5s
:
:
:
:
:
:
230 V
:
180 s
:
:
:
:
;
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
230 V
0.50 mA
180 s
230 V
:
180 s
:
:
:
:
;
200 mA
0.30 Ω
5s
500 V
1.00 MΩ
5s
:
:
:
:
:
:
:
:
:
230 V
3.50 mA
180 s
:
:
:
230 V
:
180 s
:
:
:
:
;
200 mA
0.30 Ω
5s
500 V
1.00 MΩ
5s
500 V
2.00 MΩ
5s
:
:
:
:
:
:
230 V
3.50 mA
180 s
230 V
0.50 mA
180 s
230 V
:
180 s
:
:
:
:
100
08
MI 3310 / MI 3310A SigmaGT
Appendix A – Preprogrammed autotests
Pre-programmed autotest sequences table (cont’d)
Autotest shortcut code
Visual test
Output
Limit
Time
Output
Insulation
Limit
Time
Output
Insulation
Limit
(probe)
Time
Output
Sub leakage
Limit
Time
Output
Sub
leakage
Limit
(probe)
Time
Output
Differential
Limit
leakage
Time
Output
Touch leakage Limit
Time
Output
Power
Limit
Time
Output
TRMS
clamp
Limit
current
Time
Polarity test
Earth bond
09
Cl_2_IsoIbs
;
:
:
:
:
:
:
500 V
2.00 MΩ
5s
:
:
:
:
:
:
:
:
:
230 V
0.50 mA
180 s
230 V
:
180 s
:
:
:
:
10
Cl_2
;
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
230 V
:
180 s
:
:
:
:
101
11
Cl_3_Iso
;
:
:
:
:
:
:
500 V
0.250 MΩ
5s
:
:
:
:
:
:
:
:
:
:
:
:
--:
180 s
:
:
:
:
12
Cl_3
;
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
--:
180 s
:
:
:
:
MI 3310 / MI 3310A SigmaGT
Appendix A – Preprogrammed autotests
METREL GmbH VDE tester test type card
Code
Autotest sequence name and descriptions
01 Kl_1_Iso
02 Kl1_Iso_BLT
03 Kl_1_Ia
04 Kl_1_Ia_BLT
05 Kl_2_Iso
06 Kl_2_Ibs
Testing according to VDE.
Earth bond: 0.30 Ω
Class 1 device.
Insulation resistance and substitute Insulation: 1.00 MΩ
leakage current measurements are Sub leakage: 3.50mA
applicable.
Testing according to VDE.
Class 1 device with isolated accessible
inductive parts.
Insulation resistance and substitute
leakage current measurements are
applicable.
Testing according to VDE.
Class 1 device.
Prüfung
für
Differenzstrom
eingestellt.
08 Kl1_IsoIaBLT
09 Kl_2_IsoIbs
Earth bond: 0.30 Ω
Insulation: 1.00 MΩ
Insulation - S: 2.00 MΩ
Sub leakage: 3.50 mA
Sub leakage - S: 0.50 mA
Class 1 device.
Prüfungen
für
Isolation
Differenzstrom werden eingestellt.
A0 1
A0 2
A0 3
Testing according to VDE.
Class 2 device with isolated accessible
conductive parts.
Insulation - S: 2.00 MΩ
Insulation resistance and substitute Sub leakage - S: 0.50 mA
leakage current measurements are
applicable.
Testing according to VDE.
Class 2 device.
Prüfung für Berührungsstrom
eingestellt.
Barcode
Earth bond: 0.30 Ω
wird Leakage: 3.50 mA
Testing according to VDE.
Class 1 device with isolated accessible Earth bond: 0.30 Ω
conductive parts.
Leakage: 3.50 mA
Prüfungen
für
Differenzund Touch leakage: 0.50 mA
Berührungsstrom werden eingestellt.
Testing according to VDE.
07 Kl_1_IsoIa
Limits
wird
A0 4
A0 5
Touch leakage: 0.50 mA
A0 6
Earth bond: 0.30 Ω
Insulation: 1.00 MΩ
und
Leakage: 3.50 mA
A0 7
Earth bond: 0.30 Ω
Insulation: 1.00 MΩ
Insulation - S: 2.00 MΩ
Leakage: 3.50 mA
Touch leakage: 0.50 mA
A0 8
Testing according to VDE.
Class 2 device with isolated accessible
Insulation - S: 2.00 MΩ
conductive parts.
Touch leakage: 0.50 mA
Prüfungen
für
Isolation
und
Berührungsstrom werden eingestellt.
A0 9
Testing according to VDE.
Class 1 device with isolated accessible
conductive parts.
Prüfungen für Isolation, Differenz- und
Berührungsstrom werden eingestellt.
102
MI 3310 / MI 3310A SigmaGT
Appendix A – Preprogrammed autotests
METREL GmbH VDE tester test type card (cont'd)
10 Kl_2
11 Kl_3_Iso
12 Kl_3
Testing according to VDE.
Class 2 device without any isolated
accessible conductive parts.
Testing according to VDE.
Insulation - S: 0.25 MΩ
Class 3 device with isolated accessible
conductive parts.
Testing according to VDE.
Class 3 device without any isolated
accessible conductive parts.
A1 0
A1 1
A1 2
Note:
Ì When polarity test in enabled in autotest sequence then earth bond resistance is
performed between IEC test connector (PE terminal) and test socket (PE
terminal). If polarity test is disabled in autotest sequence, earth bond test is
perfomed between EB/S test probe and test socket (PE terminal).
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MI 3310 / MI 3310A SigmaGT
Appendix B – Autotest shortcut codes
B Appendix B – Autotest shortcut codes
The instrument SigmaGT supports two barcode formats when printing device labels.
Autotest shortcut code and DUT number
Autotest shortcut codes are represented as a two digit code. These autotest codes can
also be represented by the barcode.
Using the barcode reader, the instruments can accept autotest shortcut code from
barcode label.
01
Autotest shortcut code
Also DUT number can be read from barcode label.
Single / double barcode system
If single barcode system is selected in the instrument, only DUT name is printed out as
a barcode on device barcode label.
When double barcode system is selected in the instrument, both autotest shortcut code
and DUT name are printed out as a barcode on DUT barcode label.
1 tag, barcode system:
single (top label)
1 tag, barcode system:
double (bottom label)
2 tags, barcode system:
double
Examples of DUT labels
104
2 tags, barcode system:
single
MI 3310 / MI 3310A SigmaGT
01
$
4455821981
Appendix B – Autotest shortcut codes
Autotest shortcut code
Separator
DUT number
Refer to chapter 4.2.8.6 Instrument settings for barcode system selection.
Notes:
† Special character »$« between autotest shortcut code and DUT name (ID number)
is used to distinguish shortcut code from DUT name.
nd
† Only DUT ID is printed out on the 2 DUT label (power supply cord label).
105
MI 3310 / MI 3310A SigmaGT
Appendix B – Autotest shortcut codes
C Appendix C – Country notes
This appendix C contains collection of minor modifications related to particular country
version. Some of the modifications mean modified characteristics of listed function
related to main chapters and others are additional functions. Some minor modifications
are also related to different requirements of the same market that are covered by
various suppliers.
C.1 List of country modifications
The following table contains current list of applied modifications.
Country Related chapters
NL
4.2.1, 6.1.1, 6.1.2, F.2
Modification type
Appended
Note
6.1.2. replaced with F.2.2
F.2 Modification issues - NL
F.2.1 Autotest organizer
Modified screen examples:
Chapter 4.2.1
Autotest organizer menu
Chapter 6.1.1
Examples of Autotest organizer screen
106
MI 3310 / MI 3310A SigmaGT
Appendix B – Autotest shortcut codes
Autotest organizer view menu
F.2.2
Example of creating a test sequence with autotest organizer
A periodic test of an iron will be performed.
Type: flatiron ABC
Un: 230V, 50Hz, 1000 VA
The iron can be classified as followed:
- For a periodic testing, e.g. the NEN 3140 test is relevant.
- The iron can be classified as a Class I DUT with isolated metal part and short
supply cord.
Example of test sequence configuration:
Displayed item
1 Standard: NEN 3140
2 DUT class: 1
3 Visual test
4 Accessible conductive parts? YES
5
Cord length (Earth bond)
L: < 0.3 Ω/<=5 m
6 Insulation test applicable? YES
7 Insulation test
Activity
Information that a test acc. to NEN 3140
(see note) will be set.
Note:
† Option on request.
Selection of DUT safety class:
- Select Class I.
Information that visual test will be included
in the VDE / Class I procedure.
Question if there is an isolated conductive
part on the DUT:
- Confirm with yes.
Selection of Earth bond limit value on base
of known supply cable length:
- Select appropriate length.
Question if insulation test is applicable:
- Confirm with yes.
Insulation
and
substitute
leakage
measurements will be included in the test
sequence with this confirmation.
Classification of DUT:
107
MI 3310 / MI 3310A SigmaGT
Appendix B – Autotest shortcut codes
Heating elements L: >0.5 MΩ
- Classify the iron as a standard DUT.
Information that insulation resistance
Insulation test
measurement of Class 2 parts will be
included in the (NEN / Class I / with isolated
Accessible cond. Parts L: >2.0 MΩ
accessible conductive parts) test procedure.
Leakage test method:
Selection of leakage current test method:
Leakage
- Select substitute leakage measurement.
Limit / Device type
Classify the iron as an standard DUT with
General device I < 1 mA
power <3.5 kW.
Information that substitute leakage current
Touch leakage method: Substitute
measurement class 2 parts will be included
leakage
in the (NEN / Class I / with isolated
Limit < 0.5 mA
accessible conductive parts) test procedure.
8
9
10
11
The following parameters can be viewed in general for all measurements / tests:
Ì
Ì
Ì
Ì
Measurement mode,
Output test voltage or current (except in visual test and TRMS current
measurement),
Pass level (except in visual test),
Measurement duration (except in visual test).
F.2.3 Autotest codes
Pre-programmed autotest sequences table (NL)
Autotest shortcut code
Description
Visual test
Output
Earth bond
Limit
Time
Output
Insulation
Limit
Time
Output
Insulation (probe)
Limit
Time
Output
Sub leakage
Limit
Time
Output
Sub leakage (probe) Limit
Time
Output
Differential leakage Limit
Time
Output
Touch leakage
Limit
Time
01
KL 1 ALG
02
KL 2 ALG
03
KL1 HEATERS
04
KL 1 PC
05
KL3 ALG
;
200 mA
0.30 Ω
5s
500 V
1.00 MΩ
5s
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
;
:
:
:
:
:
:
500 V
2.00 MΩ
5s
:
:
:
:
:
:
:
:
:
:
:
:
;
200 mA
0.30 Ω
5s
500 V
0.50 MΩ
5s
:
:
:
40 V
7 mA
5s
:
:
:
:
:
:
:
:
:
;
200 mA
0.30 Ω
5s
:
:
:
:
:
:
:
:
:
:
:
:
230 V
0.5 mA
120 s
:
:
:
;
:
:
:
:
:
:
500 V
0.50 MΩ
5s
:
:
:
:
:
:
:
:
:
:
:
:
108
MI 3310 / MI 3310A SigmaGT
Power
TRMS clamp
current
Output
Limit
Time
Output
Limit
Time
Polarity test
Appendix B – Autotest shortcut codes
230 V
:
10 s
:
:
:
:
230 V
:
10 s
:
:
:
:
:
:
:
:
:
:
:
230 V
:
10 s
:
:
:
:
:
:
:
:
:
:
:
Pre-programmed autotest sequences table (cont’d)
Autotest shortcut
code
Description
Visual test
Output
Earth bond Limit
Time
Output
Insulation
Limit
Time
Output
Insulation
Limit
(probe)
Time
Output
Sub
Limit
leakage
Time
Output
Sub
leakage
Limit
(probe)
Time
Output
Differential
Limit
leakage
Time
Output
Touch
Limit
leakage
Time
Output
Power
Limit
Time
Output
TRMS
clamp
Limit
current
Time
Polarity test
01
02
03
04
05
KL1 AGMD
KABEL 5 M
2.5 MM
KABEL 15 M
2.5 MM
KABEL 25 M
2.5 MM
KABEL 50 M
2.5 MM
;
200 mA
0.30 Ω
5s
500 V
1.00 MΩ
5s
500 V
2.00 MΩ
5s
:
:
:
:
:
:
230 V
1 mA
5s
230 V
0.5 mA
5s
:
:
:
:
:
:
:
;
200 mA
0.30 Ω
5s
500 V
1.00 MΩ
5s
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
; normal
;
200 mA
0.50 Ω
5s
500 V
1.00 MΩ
5s
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
; normal
;
200 mA
0.70 Ω
5s
500 V
1.00 MΩ
5s
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
; normal
;
200 mA
1.00 Ω
5s
500 V
1.00 MΩ
5s
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
:
; normal
Note:
Ì When polarity test in enabled in autotest sequence then earth bond resistance is
performed between IEC test connector (PE terminal) and test socket (PE
terminal). If polarity test is disabled in autotest sequence, earth bond test is
perfomed between EB/S test probe and test socket (PE terminal).
109