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Chapter 11. Testing and Troubleshooting
Table 11-4. DTE With Test Pattern Commands
Front
Panel
AT
Command
Description
1=2047 PATTERN
_T0&T8
Standard 2047 random data pattern.
2=511 PATTERN
_T1&T8
Standard 511 random data pattern.
3=STRESS PTRN #1
_T2&T8
Stress pattern with alternating high
and low ones densities. Repeated
pattern of 100 octets: 1111 1111;
followed by 100 octets: 0000 0000.
4=STRESS PTRN #2
_T3&T8
Stress pattern with alternating
medium and low ones densities.
Repeated pattern of 100 octets:
0111 1110; followed by 100 octets:
0000 0000.
5=STRESS PTRN #3
_T4&T8
Stress pattern with medium ones
density. Continuous series of
octets: 0011 0010.
6=STRESS PTRN #4
_T5&T8
Stress pattern with low ones density.
Continuous series of octets: 0100
0000.
DTE & Loop (LL)
Test Description
The DTE & LOOP test splits the DSU III ARdc into two separate DTE and
loop interface sections and then loops the receive data of each interface
back to its respective transmit data. The DTE & Loop test provides a bidirectional loopback at the DSU/CSU. Figure 11-5 on page 11-11 illustrates
the loopback points and the signal paths for this test.
11-10
DSU III ARdc User Manual
61200270L1-20