Download NIT No.20 for LAB. EQUIPMENTS FOR DIR

i) The optics should be capable of being operational in standard focusing/BraggBrentano geometry as well as parallel beam geometry. The changeover
between these geometries to fulfill various applications should be very easy
without the need for any user realignment, preferably not requiring any
manual intervention.
ii) One flat sample stage with automatic sample changer which should take at
least 12 samples (or more) at a time.
iii) Special sample holders and accessories should be provided for carrying out
measurements of Nano size samples for mineral phase analysis and particle
size distribution.
4. DETECTOR:
Xenon proportional with latest Fast Solid State Array Detector or equivalent
detector with following minimum specifications:
i) The detector should operate in 0D, 1D and 2D mode. In 2D (Area detector)
mode should have the capability to give data in form of Debye Scherer rings
and convert the same to normal diffractograms.
ii) Count rate linearity over whole detector without saturation  1X10^8 cps or
more.
iii) Detector should be useful for following applications –
- Fast high resolution powder diffraction & Structure Refinement
iv) If the detector technology requires any re-gassing (refilling of gas) /
refurbishing then the same should be clearly brought out in the quotation. Any
such costs of re-gassing (refilling) / refurbishing and associated costs for a
period of 10 years will be to the vendor’s account.
v) Detector should not require any constant recalibrations.
5. ELECTRONICS: The system electronics should have an integrated shutter control
and be capable of monitoring and controlling all diffractometer functions such as
angles, counts, slits, generator safety, etc.
6. Remote diagnostic facility should be provided. All standards for calibration &K
beta filter should be provided.
7. COMPUTER CONTROL UNIT: A latest branded PC compatible with the instrument
having latest configurations and 17” TFT Colour monitor and colour laser jet
printer should be quoted.
8. SOFTWARE:
i) General - The software should be capable of simultaneous diffractometer
control, data collection and analysis, peak search, search-match, profile fitting
and elaborate pattern treatment such as data smoothening, background
subtraction, k2 stripping, etc.