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User Manual
November 1999
DK86060-3
Version 3.2
16-bit Interpolating DAC Evaluation Board
Fujitsu’s DK86060-3 16-bit Interpolating DAC Evaluation
Board provides a simple and effective means of evaluating the
MB86060 16-bit Interpolating DAC. This enables faster device
evaluation without incurring the time and cost penalties of inhouse PCB design and manufacture.
FME/MS/SFDAC1/UM_1/4190
EVALUATION BOARD
The board provides a complete evaluation environment for the
DAC device. A selectable single-ended or transformer-coupled
differential analog output interface is provided on-board to
simplify integration into target application and development
environments. The clock can be sourced from either the
internal crystal oscillator, or from a transformer-coupled RF
source. 16-bit data is input via a 40way IDC header, or optional
SMA/SMB connectors.
The MB86060 device is a single 16-bit DAC enclosed in a 80
pin LQFP package with a 0.5mm pin pitch.
Features
• 16-bit data input via a choice of connectors
• Transformer-coupled differential output via BNC & SMA/SMB
• Internal oscillator with optional on-board crystal
• Transformer-coupled RF clock input via BNC & SMA/SMB
• Requires DC power supply of +3.3V
Copyright © 1999 Fujitsu Microelectronics Europe GmbH
Page 1 of 28
November 1999 Version 3.2
FME/MS/SFDAC1/UM_1/4190
DK86060-3 16-bit Interpolating DAC Evaluation Board
CAUTION
ELECTROSTATIC DISCHARGE SENSITIVE DEVICE
High electrostatic charges can accumulate in the human body
and discharge without detection. Ensure proper ESD
procedures are followed when handling this device.
Copyright © 1999 Fujitsu Limited
Tokyo, Japan, Fujitsu
Microelectronics Europe GmbH,
and Fujitsu Microelectronics Inc.
USA. All Rights Reserved.
The information contained in this
document has been carefully
checked and is believed to be
entirely reliable. However,
Fujitsu and its subsidiaries
assume no responsibility for
inaccuracies.
Fujitsu Limited and its
subsidiaries reserve the right to
change products or
specifications without notice.
No part of this publication may be
copied or reproduced in any form
or by any means or transferred to
any third party without the prior
consent of Fujitsu.
The information contained in this
document does not convey any
license under the copyrights,
patent rights or trademarks
claimed and owned by Fujitsu.
Page 2 of 28
Copyright © 1999 Fujitsu Microelectronics Europe GmbH
November 1999 Version 3.2
FME/MS/SFDAC1/UM_1/4190
DK86060-3 16-bit Interpolating DAC Evaluation Board
1
Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5
2
Evaluation Board . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6
2.1 Power Supply . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6
2.2 Board And Interface Controls . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7
2.2.1 Switches. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8
2.2.2 Jumper Links . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .11
3
Getting Started . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13
4
Testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .14
Appendix A Evaluation Board Circuit Diagrams . . . . . . . . . . . . . . . . . . . . .15
A.1
Components Not Fitted to the PCB . . . . . . . . . . . . . . . . .18
A.2
Changes to the PCB Schematics. . . . . . . . . . . . . . . . . . .19
Appendix B Component Overlays. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .20
Appendix C Connector Pin Functions . . . . . . . . . . . . . . . . . . . . . . . . . . . . .22
Appendix D Prototype Area . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .25
Copyright © 1999 Fujitsu Microelectronics Europe GmbH
Page 3 of 28
November 1999 Version 3.2
FME/MS/SFDAC1/UM_1/4190
DK86060-3 16-bit Interpolating DAC Evaluation Board
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Copyright © 1999 Fujitsu Microelectronics Europe GmbH
November 1999 Version 3.2
FME/MS/SFDAC1/UM_1/4190
DK86060-3 16-bit Interpolating DAC Evaluation Board
1
Overview
The DK86060-3 evaluation board allows users to evaluate and demonstrate the different operational
modes of the MB86060 16-bit Interpolating DAC. The evaluation board consists of a MB86060 device with
support circuitry for single-ended or differential analog output interfaces, a clock input interface, and a
clock output interface. This will enable simple connection of measurement equipment. For convenience,
customer evaluation boards have been configured using soldered zero-ohm links for transformer-coupled
differential output only.
The CMOS input data interface has a 40 way IDC header for connection via a flat ribbon cable. Separate
SMA/SMB connectors for individual data bit connections are also available, but not normally fitted (SMA
not recommended due to insufficient space to rotate the connectors body). The setup of the device is
controlled by on-board DIP switches, but these controls can be accessed and overridden via two 25 way
male D type connectors if remote control is required.
The evaluation board has been designed to address requirements of both automatic and conventional
bench testing. Standard evaluation boards feature a simplified build state where certain components or
connectors are omitted. These omissions are documented in Appendix A with the evaluation board
schematics.
This User Manual is intended to document the DK86060-3 Development Kit PCB titled 'MB86060 DAC
TEST CARD - ISSUE 3' only.
Copyright © 1999 Fujitsu Microelectronics Europe GmbH
Page 5 of 28
November 1999 Version 3.2
FME/MS/SFDAC1/UM_1/4190
DK86060-3 16-bit Interpolating DAC Evaluation Board
2
Evaluation Board
2.1
Power Supply
The DK86060-3 evaluation board requires a +3.3V supply, and a number of other low voltage DC supplies
depending upon build configuration (marked †). A cable mounting socket suitable for mating with the PCB
mounted power plug is supplied with the development board. Additional sockets, type Weidmuller BL3.6/
16 may be obtained from RS Components (http://rswww.com), Stock no. 216-2683. The power should be
connected to the board via this connector, as shown in Figure 2.1. Flexible cable of 16 - 28 AWG, 0.5 1.5mm 2 should be used.
The format of the power connector is common across Fujitsu’s DAC Development Kit range. The result is
that there are some un-necessary supplies (marked ‡). These supply pins are connected to test points for
convenience if the user requires extra supplies for the prototype area
Cable Mounting
Socket
PCB mounted
power header
Standard
Requirement
-5.2V †
Data -2V Sense ‡
Data -2V Force ‡
Data GND
Data +3.3V Force
Data +3.3V Sense
Opt. +3.3V Sense †
Opt. +3.3V Force †
+3.3V Sense
+3.3V Force
GND
-2V Force †
-2V Sense †
+5V †
+12V †
Relay †
Pin 16
Figure 2.1: Power Connections
Page 6 of 28
Copyright © 1999 Fujitsu Microelectronics Europe GmbH
November 1999 Version 3.2
FME/MS/SFDAC1/UM_1/4190
DK86060-3 16-bit Interpolating DAC Evaluation Board
2.2
Board And Interface Controls
SW1
SW3
PL1
PL3
SW4
SW2
SW5
PL2
Clock Out
Clock In
Power
Differential Out
Figure 2.2: Evaluation Board Component Side Layout
Copyright © 1999 Fujitsu Microelectronics Europe GmbH
Page 7 of 28
November 1999 Version 3.2
FME/MS/SFDAC1/UM_1/4190
DK86060-3 16-bit Interpolating DAC Evaluation Board
2.2.1
Switches
There are several control switches on the evaluation board, as shown in Figure 2.2. Switch idents are
marked on the board silkscreen.
Table 1: Switch 1 Settings
Switch
Mode / Function
Setting
SW1[1:3]
(DITH0, DITH1,
DITH2)
Dither disabled
VSS, VSS, VSS
-27.0 dBFS pk Dither amplitude
VDD, VSS, VSS
-21.0 dBFS pk Dither amplitude
VSS, VDD, VSS
-15.0 dBFS pk Dither amplitude
VDD, VDD, VSS
-9.0 dBFS pk Dither amplitude
VSS, VSS, VDD
-3.0 dBFs pk Dither amplitude
VDD, VSS, VDD
Factory use only
VSS, VDD, VDD
Factory use only
VDD, VDD, VDD
Disabled
VSS, VSS
x2 Slow
VDD, VSS
x2 Fast
VSS, VDD
x4
VDD, VDD
Segment Shuffling disabled
VSS, VSS
Random - every 4 cycles
VDD, VSS
Random - every 8 cycles
VSS, VDD
Random - every 16 cycles
VDD, VDD
Factory use only
VSS
SW1[4:5]
(FILTS, FILTF)
SW1[6:7]
(SHUF0, SHUF1)
SW1[8]
(TEST)
Page 8 of 28
Copyright © 1999 Fujitsu Microelectronics Europe GmbH
November 1999 Version 3.2
FME/MS/SFDAC1/UM_1/4190
DK86060-3 16-bit Interpolating DAC Evaluation Board
Table 2: Switch 2 Settings
Switch
Mode / Function
Setting
SW2[1:2]
(OSC0, OSC1)
Multiplier fastest mode
VSS, VSS
VDD, VSS
VSS, VDD
Multiplier slowest mode
VDD, VDD
Table 3: Switch 3 Settings
Switch
Mode / Function
Setting
SW3[1]
(TWOC)
Offset binary input data
VSS
2’s Compliment input data
VDD
Clock multiplier bypass
VSS, VSS, VSS
Clock multiplier x1 mode
VDD, VSS, VSS
Clock multiplier x2 mode
VSS, VDD, VSS
Clock multiplier x3 mode
VDD, VDD, VSS
Clock multiplier x4 mode
VSS, VSS, VDD
Clock multiplier x5 mode
VDD, VSS, VDD
Clock multiplier x6 mode
VSS, VDD, VDD
Clock multiplier x8 mode
VDD, VDD, VDD
SW3[5]
(NSHAPE)
Noise shaping disabled
VSS
Noise shaping enabled
VDD
SW3[6]†
(CKSEL)
On-board crystal
VSS
External clock source
VDD
SW3[2:4]
(MUL0, MUL1,
MUL2)
†
Standard Evaluation Kits are not configured with an on-board crystal.
Copyright © 1999 Fujitsu Microelectronics Europe GmbH
Page 9 of 28
November 1999 Version 3.2
FME/MS/SFDAC1/UM_1/4190
DK86060-3 16-bit Interpolating DAC Evaluation Board
Table 4: Switch 4 Settings
†
‡
Switch
Mode / Function
Setting
SW3[1] & SW4
Part Reset†
SW3[1] VSS
Push to Reset
Full Reset‡
SW3[1] VDD
Push to Reset
With SW3[1] set to Offset binary, a 'Reset' will not reset the Clock Multiplier or the Reference circuits.
With SW3[1] set to 2’s compliment, a 'Reset' will reset the entire device.
Table 5: Switch 5 Settings
Switch
Mode / Function
Setting
SW5
Device in forced RESET mode
B
Device in normal operating mode
A
Note: SW1, 2 & 3 may appear to malfunction if pressure is placed on the slider when in either the left or
right position. In this case the DAC control pin will be floating.
Page 10 of 28
Copyright © 1999 Fujitsu Microelectronics Europe GmbH
November 1999 Version 3.2
FME/MS/SFDAC1/UM_1/4190
DK86060-3 16-bit Interpolating DAC Evaluation Board
2.2.2
Jumper Links
Table 6: Jumper Links
Link Name
Mode / Function
Setting
LK1A†
(VDD)
Optional supply used for VDD
1 to 2 linked
Common supply used for VDD
2 to 3 linked
Optional supply used for CVDD
1 to 2 linked
Common supply used for CVDD
2 to 3 linked
Optional supply used for RVDD
1 to 2 linked
Common supply used for RVDD
2 to 3 linked
Optional supply used for AVDD
1 to 2 linked
Common supply used for AVDD
2 to 3 linked
LK2‡
(SEOUT)
Select single-ended output
Linked
Select differential output
Not linked
LK3
(CMRR)
Centre tap of T1 (Pin 5) linked to AVSS
Linked
Centre tap of T1 (Pin 5) decoupled to AVSS
Not linked
DIFF OUT Ground linked to AVSS
Linked
DIFF OUT Ground floating
Not Linked
CLK OUT Ground linked to VSS
Linked
CLK OUT Ground floating
Not Linked
CLK IN Ground linked to CVSS
Linked
CLK IN Ground floating
Not Linked
LK7†
(PSRR)
Power supply ripple rejection disabled
Linked
Power supply ripple rejection enabled
Not Linked
LK8
CLK OUT biasing enabled
Linked
CLK OUT biasing disabled
Not Linked
LK1B†
(CVDD)
LK1C†
(RVDD)
LK1D†
(AVDD)
LK4
LK5
LK6
Note: Bold type indicates default jumper settings.
†
Standard Evaluation Kits are not configured to use the optional supply. LK1 and LK7 are not used.
‡
Standard Evaluation Kits are configured for Differential output. LK2 is not used.
Copyright © 1999 Fujitsu Microelectronics Europe GmbH
Page 11 of 28
November 1999 Version 3.2
FME/MS/SFDAC1/UM_1/4190
DK86060-3 16-bit Interpolating DAC Evaluation Board
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Copyright © 1999 Fujitsu Microelectronics Europe GmbH
November 1999 Version 3.2
FME/MS/SFDAC1/UM_1/4190
DK86060-3 16-bit Interpolating DAC Evaluation Board
3
Getting Started
This Chapter documents the basic steps to powering up and starting to use the DK86060-3 Evaluation
Board. Component references may be cross-referenced with the component overlay in Appendix B.
Step 1. Configure the board
The data input format must be configured to either Offset binary or 2’s Compliment. Use configuration
switch SW3[1] to select.
The device control signals should be set to the default conditions shown in Section 2.2. Use configuration
switches SW1, SW2 and SW3 to select.
Jumper links LK3 to LK6 inclusive, and LK8, should be 'Not linked'. Switch SW5 should be set to position
'A'.
Step 2. Connect data input & analog output connectors to the board
The input data should be connected via the 40 way IDC header PL2, or if fitted the SMA/SMB connectors
J19 to J34 inclusive. See Table C1: for the pin description of the IDC header.
The output is provided as a transformer-coupled differential signal, via a BNC connector.
• Differential Output signal (J7). (50Ω source resistance)
The DAC is coupled to a single output connector using a transmission line and 1:1 balun
transformer. Signal swing is ±0.5V with a high impedance load, or ±0.25V with an external 50Ω
load. For sinusoidal signals, this corresponds to approximately -2dBm into a 50Ω external load.
Step 3. Connect clock
The clock input is provided to the device through a transmission line transformer, via a BNC connector.
• RF clock (J17). (50Ω input impedance)
The DAC is coupled to a single input connector using a transmission line transformer. Sine wave or
square wave input signals between -10dBm and +10dBm are acceptable, depending on clock
frequency and required output jitter / phase noise.
Step 4. Connect power header to power supplies
Ensure that the power supply is connected according to Figure 2.1. Connect the power header to the board
and turn the power supply on.
Step 5. Press Reset
Press the Reset button to ensure that the device is in the correct operating condition. Press Reset every
time a configuration change is made.
Copyright © 1999 Fujitsu Microelectronics Europe GmbH
Page 13 of 28
November 1999 Version 3.2
FME/MS/SFDAC1/UM_1/4190
DK86060-3 16-bit Interpolating DAC Evaluation Board
4
Testing
This section provides a brief introduction to testing with the DK86060-3 16-bit Interpolating DAC Evaluation
Board.
MB86060 incorporates a 12-bit, 400MSa/s digital to analog converter core with a 16-bit interpolation
filtering front end, designed to give excellent SFDR performance. The use of novel techniques for the
converter architecture have allowed high speed operation consistent with BiCMOS or bipolar devices, but
with the low power consistent with CMOS.
In certain applications it is now possible to consider using the MB86060’s DAC core at a full 400MSa/s DAC
conversion rate, even though the generated signal band may only be, for example, up to 40MHz or less.
Although, in theory, a 100MSa/s converter would be sufficient to reproduce this desired signal band,
according to Nyquist, converter performance will tend to limit due to step-size and sinx/x roll-off as a result
of the converters sample & hold output stage. 400MSa/s operation significantly reduces effects due to both
of these - sinx/x roll-off is reduced from -4dB to -0.22dB, and the increased oversampling [DAC conversion
rate / signal rate] reduces step sizes to give a direct improvement in spurious performance.
These issues should be considered when testing the MB86060 and measurements should be obtained at
different conversion rates to establish the most appropriate operating conditions for the target application.
For convenience the board has been configured using soldered zero-ohm links as a transformer coupled
differential output. To enable single-ended outputs changes to the soldered zero-ohm links would be
required. For rise/fall time tests the transformer-coupled output should not be used since the transformer
response will limit the dV/dt. The DAC current switches are designed to give the best possible differential
performance, at the expense of some single ended performance, so there is a noticeable difference
between the two configurations. The revised analog output circuit uses an additional transmission line
transformer to improve rejection of common-mode distortion at the DAC output.
If a spectrum analyser is used to measure the output spectrum, it should have a very good noise and
distortion, for example HP8562E or R&S FSEA30. In addition, the input attenuator setting should be
chosen such that input mixer distortion does not limit the measurements (e.g. 30dB RF attenuation). This
implies that narrow resolution bandwidths and/or averaging are required to obtain low enough
measurement noise floor.
Page 14 of 28
Copyright © 1999 Fujitsu Microelectronics Europe GmbH
November 1999 Version 3.2
FME/MS/SFDAC1/UM_1/4190
DK86060-3 16-bit Interpolating DAC Evaluation Board
Appendix A Evaluation Board Circuit Diagrams
Appendix A shows the circuit diagrams of the DK86060-3 evaluation board. Note that these diagrams are
for reference only and that some components fitted to the board may be of a different value to the
schematics or not fitted at all. Fujitsu has undertaken to document these changes where possible. The
schematic is divided over two pages for clarity.
• Sheet 1 - DAC support circuitry, including analog output interfaces [covers 2 pages]
Copyright © 1999 Fujitsu Microelectronics Europe GmbH
Page 15 of 28
November 1999 Version 3.2
FME/MS/SFDAC1/UM_1/4190
DK86060-3 16-bit Interpolating DAC Evaluation Board
1
TP1
ST1
2
C1
1
150u
4
3
ST4
2
6
ST6
5
2
4
P5
J6
AVSS
R102
51R
1
T1
A1
6
C14
1
P10
R14
0R
R15
0R
R104
AVDD
51R
LK3
2
AVSS
+12V
C13
C27
AVSS
1
R16
0R
R17
0R
2
SGND
100n
100n
R106
R105
C11
100n
AVDD
LK2
51R
51R
CVSS
J35
C20
CVSS
22p
R57
1M
1
6
0R
0R
R97
R99
0R
0R
CVSS
T3
R61
51R
VSS
J16
R108
10K
R52
10K
CVSS
100n
T2
3
1
2
VDD
1
VR1
100R
R
E
S
E
T
B
C
K
S
E
L
N
S
H
A
P
E
C
S
U
B
L
O
C
K
2
6
R58
75R
4
R59
75R
D V V N T V V D D D
S D S / WD S I I I
U D S C O D S T T T
B
/ C
H H H
S
2 1 0
O
U
T
C
K
D
O
S V V U
U D S T
B D S B
C
K
M
O V V U
U D S L
T D S 2
M
U
L
1
C17
100n
100n
R50
0R
R51
0R
1
SW5
1PCO
SW4
2
3
R53
200R
R56
R54
200R
R55
200R
10K
SPDT
VSS
1
1
1
1
1
1
2
2
2 1 2 1 2 1 2 1
1 4 2 5 3 6 4 7 5 8 6 9 7 0 8 1 9 2 0 3 1 4 2 5 3
ADT4-1WT
C22
3
CLKOUT_GND
APP.GND
Page 16 of 28
100n
LK5
1
2
TP5
VSS
M
U
L
0
VDD
5
LK8
1
J13
C
C C
V C V V
S L S D
S K S D
O
V
E
R
VSS
1
2
VSS
J12
BNC
C
L
K
B
A
S
U
B
C18
3
10K
ADTL1-12
CLKIN_GND
APP.GND
F
I
L
T
S
100n
J14
R107
100n
C24
F
I
L
T
F
R94
10K
C28
J18
S
H
U
F
0
CVDD
C29
100n
4
S
H
U
F
1
C19
X2
R62
10K
CVSS
R
V
S
S
/
T
E
S
T
2 2 2 2 2 2 2 2 2 3 3 3 3 3 3 3 3 3 3
1 2 3 4 5 6 7 8 9 0 1 2 3 4 5 6 7 8 9
R98
J36
100n
R60
51R
B
G
A
P
RVSS
RVDD
OSC0
OSC1
AVDD
AVSS
IOUTB
IOUTB
AVSS
AVDD
AVDD
AVSS
IOUT
IOUT
AVSS
AVDD
XIN
XOUT
CVDD
CVSS
CVDD
J15
V
R
E
F
CVSS
1
2
R
R
E
F
X1
X1
22p
C23
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
C12
100n
R96
C21
CVSS
1K
CVDD
50R
CVSS
CVSS
3
C9
100n
AVDD
RCON
CVSS
J17
BNC
200R
200R
AVSS
C10
100n
J11
1
AVSS
C8
100n
AVSS
R11
R12
AVDD
R103
AVSS
10K
C7
100n
OSC0
OSC1
R109
4
8
A2
R9
RVSS
AVSS
RF103-12
AVSS
0R
RVSS
AVSS
C32
RL1
AVSS
R18
0R
A4
RVDD
P11
50R
7
2
R8
R10
P12
6
AVSS
100n
C30
A4
J9
BNC
C6
RVSS
8 7 7 7 7 7 7 7 7 7 7 6 6 6 6 6 6 6 6
0 9 8 7 6 5 4 3 2 1 0 9 8 7 6 5 4 3 2
AVSS
1
1
J3
RVSS
P3
P4
2
5
R100
6
R7
51R
2
3
4
VSS
AVSS
CVSS
A3
A2
5
3
TC04BCZM
D1
3
4
5
5
3
R101
R13
100R
R19
J8
1K
J4
+5V
AVSS
R6
RVDD
100n
P1
P2
-5.2V
P9
A3
0R
-2V
-2V
P8
AVSS
A1
AVSS
P7
R
R
R
2
AVDD
P6
0R
RVDD
ST8
4
3
R4
RVSS
4
2
0R
R5
100n
2
5
4
3
6
ST9
1
0R
R3
C31
1
TP4
J7
BNC
LK7
2
R
R
R
R
R
CVDD
C4
6
C5
150u
0R
AVDD
3
J2
1
150u
+5V
R2
2
C3
1
2
RVDD
3
AVDD
5
4
3
3
ST7
2
CVDD
VDD
0R
ST5
0R
R38
3
1
TP3
LK6
2
3
150u
1
LK1D
1
4
DVDD
R1
LK1C
1
VDD
5
C2
+12V
J10
1
3
2
SGND
LK4
LK1B
1
2
ST3
RCON
ANALOGUE
APP.GND
LK1A
1
DVSS
3
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
J5
BNC
TP2
1
ST2
J1
-5.2V
D-2VS
D-2VF
DGND
D+3.3VF
D+3.3VS
OPTS
OPTF
+3.3VS
+3.3VF
SGND
-2VF
-2VS
+5V
+12V
RELAY
R39
3
2
-5.2V
TP6
TP7
TP8
PL3
DB25
Copyright © 1999 Fujitsu Microelectronics Europe GmbH
R
November 1999 Version 3.2
FME/MS/SFDAC1/UM_1/4190
DK86060-3 16-bit Interpolating DAC Evaluation Board
PL1
R39
LK1C
VSS
LK1D
0R
R38
1
2
VSS
R20
10K
RVDD
OSC0
R21
2
AVDD
1
2
4
5
10K
OSC1
0R
3
R30
R31
R32
R33
R34
3
OSC1
VDD
6
SW2
2PCO
OSC0
(TEST)
200R
200R
200R
200R
200R
SHUF1
SHUF0
FILTF
R35
R36
R37
D
D
R6
200R
200R
200R
1K
FILTS
OVER
VSS
R22
10K
VDD
1
2
4
5
7
8
10
11
13
14
16
17
19
20
22
23
RVDD
R23
C15
100n
TC04BCZM
R24
RVSS
10K
VSS
D1
R7
51R
C6
R8
100n
R9
0R
VSS
10K
R10
R25
10K
R26
10K
R27
10K
VDD
C16
100n
R40
200R
R28
10K
R29
10K
V
R
E
F
B
G
A
P
RVSS
RVDD
OSC0
OSC1
AVDD
AVSS
IOUTB
IOUTB
AVSS
AVDD
AVDD
AVSS
IOUT
IOUT
AVSS
AVDD
XIN
XOUT
CVDD
CVSS
C
L
K
B
R
V
S
S
/
T
E
S
T
S
H
U
F
1
C
C C
V C V V
S L S D
S K S D
S
H
U
F
0
R
E
S
E
T
B
F
I
L
T
F
C
K
S
E
L
F
I
L
T
S
N
S
H
A
P
E
A
S
U
B
C
S
U
B
O
V
E
R
L
O
C
K
D V V N T V V D D D
S D S / WD S I I I
U D S C O D S T T T
B
/ C
H H H
S
2 1 0
O
U
T
C
K
D
O
S V V U
U D S T
B D S B
C
M
K
O V V U
U D S L
T D S 2
M
U
L
1
100n
D0
D1
DVSS
D2
D3
D4
D5
DVDD
D6
D7
D8
D9
DVSS
D10
D11
D12
D13
DVDD
D14
D15
R63
R64
R65
R66
R67
R68
R69
R70
R71
R72
R73
R74
R75
R76
R77
R78
CVSS
C19
X2
CVDD
60
59
58
57
56
55
54
53
52
51
50
49
48
47
46
45
44
43
42
41
2
R79
R80
R81
R82
R83
R84
R85
R86
R87
R88
R89
R90
R91
R92
R93
R95
U1
MB86060
200R
200R
200R
VSS
C17
VDD
VSS
R55
200R
R48
10K
R49
10K
J20
J21
PL2
IDC40
J22
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
16
15
14
13
12
11
10
9
8
7
6
5
4
3
2
1
X2
X1
J25
J24
J23
160R
160R
160R
160R
160R
160R
160R
160R
160R
160R
160R
160R
160R
160R
160R
160R
J27
J28
J29
J30
J34
J33
J32
J31
TWOC
R47
10K
R54
200R
J19
DVDD
R46
10K
R45
10K
10K
PDT
VDD
DVSS
100n
VDD
R53
200R
R56
24
SW1
8PCO
J26
100n
SW4
VSS
21
160R
160R
160R
160R
160R
160R
160R
160R
160R
160R
160R
160R
160R
160R
160R
160R
DVSS
100n
100n
C18
0R
DB25
18
C26
M
U
L
0
R41
R42
R43
CVSS
R51
DITH0
DVSS
C25
2 2 2 2 2 2 2 2 2 3 3 3 3 3 3 3 3 3 3 4
1 2 3 4 5 6 7 8 9 0 1 2 3 4 5 6 7 8 9 0
X1
0R
DITH1
12
DVSS
R
R
E
F
R50
DITH2
9
1K
DVDD
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
(SOUT)
6
15
TWOC
8 7 7 7 7 7 7 7 7 7 7 6 6 6 6 6 6 6 6 6
0 9 8 7 6 5 4 3 2 1 0 9 8 7 6 5 4 3 2 1
200R
200R
10K
3
13
25
12
24
11
23
10
22
9
21
8
20
7
19
6
18
5
17
4
16
3
15
2
14
1
DVSS
R44
10K
VSS
FUJITSU MICROELECTRONICS EUROPE
1 1 1 1 1 1
7 6 4 3 1 0 8 7 5 4 2 1
NETWORK HOUSE
NORREYS DRIVE
MAIDENHEAD
BERKSHIRE, SL6 4FT
VSS
1
1
1
1
1
1
2
2
2 1 2 1 2 1 2 1
1 4 2 5 3 6 4 7 5 8 6 9 7 0 8 1 9 2 0 3 1 4 2 5 3
SW3
6PCO
P8
PL3
DB25
Title
MB86060 DAC TEST CARD
1
8
VDD
Copyright © 1999 Fujitsu Microelectronics Europe GmbH
1
5
1
2
Size
9
6
3
Document Number
B
Date:
REV
CAD DATA C9905
September 14, 1999
3
Sheet
1
of
1
Page 17 of 28
November 1999 Version 3.2
FME/MS/SFDAC1/UM_1/4190
DK86060-3 16-bit Interpolating DAC Evaluation Board
A.1
Components Not Fitted to the PCB
Table A1: Components Not Fitted
Reference
Value
LK1a, b, c, d
-
Power supply selection jumper links
LK2
-
Single-ended output selection jumper link
LK7
-
PSRR jumper link
J2 to J6, J8, J10, J11, J13
to J16, J18 to J36
-
SMA/SMB connectors
J5, J9
-
BNC connectors
D1
TC04BCZM
Reference diode
RL1
RF103-12
X1
-
C2
150uF
C14, C32
-
C20, C21
22pF
R1
0R
Optional power supply PSRR series resistor
R6
1K
Reference current limit resistor
R7
51R
Reference series resistor
R14, R16
0R
Single-ended output relay bypass resistors
R18
0R
CMRR jumper link bypass resistor
R19, R109
-
R57
1M
Crystal shunt resistor
R63, R65, R67, R69, R71,
R73, R75, R77, R79, R81,
R83, R85, R87, R89, R91,
R93
0R
Data input series resistors (for SMA/SMB connectors)
R102, R104
51R
Analog output termination resistors
T4
-
Page 18 of 28
Description
Output selection relay
Crystal
Optional power supply decoupling capacitor
Analog output RC network capacitors
Crystal capacitors
Analog output RC network resistors
Optional analog output circuit transformer
Copyright © 1999 Fujitsu Microelectronics Europe GmbH
November 1999 Version 3.2
FME/MS/SFDAC1/UM_1/4190
DK86060-3 16-bit Interpolating DAC Evaluation Board
A.2
Changes to the PCB Schematics
Table A2: Schematic Changes
Reference
R100
C30
T1(a)
T1(b)
Old
Value
New Value
-
51R
22pF
ADTT1-1
ADTL1-12
Description
Analog output RC network resistor
Analog output RC network capacitor
Mini-Circuits 1:1 analog output transformer
Mini-Circuits transmission line transformer
1
6
To DAC
To Output
T1b
3
4
T1a
5
Figure A1 Replacement Schematic For T1 (Pin Numbers Refer To T1)
Copyright © 1999 Fujitsu Microelectronics Europe GmbH
Page 19 of 28
November 1999 Version 3.2
FME/MS/SFDAC1/UM_1/4190
DK86060-3 16-bit Interpolating DAC Evaluation Board
Appendix B Component Overlays
Figure B1 Component Overlay For Layer 1, (Component Side)
Page 20 of 28
Copyright © 1999 Fujitsu Microelectronics Europe GmbH
November 1999 Version 3.2
FME/MS/SFDAC1/UM_1/4190
DK86060-3 16-bit Interpolating DAC Evaluation Board
Figure B2 Component Overlay For Layer 4 (Solder Side)
Copyright © 1999 Fujitsu Microelectronics Europe GmbH
Page 21 of 28
November 1999 Version 3.2
FME/MS/SFDAC1/UM_1/4190
DK86060-3 16-bit Interpolating DAC Evaluation Board
Appendix C Connector Pin Functions
Table C1: Data Connector PL2 Pin Functions
1
39
Page 22 of 28
2
40
Pin
Function
1
Data Bit 15 (MSB)
3
Data Bit 14
5
Data Bit 13
7
Data Bit 12
9
Data Bit 11
11
Data Bit 10
13
Data Bit 9
15
Data Bit 8
17
Data Bit 7
19
Data Bit 6
21
Data Bit 5
23
Data Bit 4
25
Data Bit 3
27
Data Bit 2
29
Data Bit 1
31
Data Bit 0 (LSB)
33
XIN
35
XOUT
37
Not Used
39
Not Used
2 to 40 (Even numbers only)
Data Ground (DVSS)
Copyright © 1999 Fujitsu Microelectronics Europe GmbH
November 1999 Version 3.2
FME/MS/SFDAC1/UM_1/4190
DK86060-3 16-bit Interpolating DAC Evaluation Board
Table C2: Control Connector PL1 Pin Functions
†
Pin
Function
1 to 13
Digital Ground (VSS)
14
DITH0
15
DITH1
16
DITH2
17†
SOUT (O/P)
18
OVER (O/P)
19
FILTS
20
FILTF
21
SHUF0
22
SHUF1
23†
TEST
24
OSC0
25
OSC1
These pins are for factory test purposes only.
Copyright © 1999 Fujitsu Microelectronics Europe GmbH
Page 23 of 28
November 1999 Version 3.2
FME/MS/SFDAC1/UM_1/4190
DK86060-3 16-bit Interpolating DAC Evaluation Board
Table C3: Control Connector PL3 Pin Functions
Pin
Function
1 to 13
Digital Ground (VSS)
14†
Test Point 8
15†
Test Point 7
16†
Test Point 6
17†
Test Point 5
18
RESETB
19
CKSEL
20
NSHAPE
21
LOCK (O/P)
22
MUL2
23
MUL1
24
MUL0
25
TWOC
†
These pins are connected to test points so that connections to the prototype area can be made via
the control connector.
Page 24 of 28
Copyright © 1999 Fujitsu Microelectronics Europe GmbH
November 1999 Version 3.2
FME/MS/SFDAC1/UM_1/4190
DK86060-3 16-bit Interpolating DAC Evaluation Board
Appendix D Prototype Area
A prototype area has been introduced into the DK86060-3 development kit PCB. This area takes the form
of a matrix of pads with plated through holes on a 2.54mm pitch. The pads are made square to allow for
0805 format surface mount devices to be fitted between adjacent pads. The matrix area has four rows
individually linked together to act as power rails. These rows are arranged as two pairs, with connections
to the internal planes (layers 2 and 3) made to each of the rows. The internal plane regions only occupy
the prototype area, and are not linked to any other area of the PCB. The prototype area layout is shown in
Figure D1.
Layer 2 would typically be used as the ground plane, and layer 3 as the power plane, with signals routed
on layer 1. However the choice in the prototype area is free as the planes are entirely separate to the rest
of the PCB.
Layer 2
Layer 3
Layer 2
Layer 3
Figure D1 Prototype Area Layout
Copyright © 1999 Fujitsu Microelectronics Europe GmbH
Page 25 of 28
November 1999 Version 3.2
FME/MS/SFDAC1/UM_1/4190
DK86060-3 16-bit Interpolating DAC Evaluation Board
This page left intentionally blank
Page 26 of 28
Copyright © 1999 Fujitsu Microelectronics Europe GmbH
November 1999 Version 3.2
FME/MS/SFDAC1/UM_1/4190
DK86060-3 16-bit Interpolating DAC Evaluation Board
Notes:
Copyright © 1999 Fujitsu Microelectronics Europe GmbH
Page 27 of 28
November 1999 Version 3.2
FME/MS/SFDAC1/UM_1/4190
DK86060-3 16-bit Interpolating DAC Evaluation Board
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The contents of this document are subject to change without notice. Customers are advised to consult with FUJITSU sales
representatives before ordering.
The information and circuit diagrams in this document presented as examples of semiconductor device applications, and are not intended
to be incorporated in devices for actual use. Also, FUJITSU is unable to assume responsibility for infringement of any patent rights or
other rights of third parties arising from the use of this information or circuit diagrams.
FUJITSU semiconductor devices are intended for use in standard applications (computers, office automation and other office equipment,
industrial, communications, and measurement equipment, personal or household devices, etc.). CAUTION: Customers considering the
use of our products in special applications where failure or abnormal operation may directly affect human lives or cause physical injury
or property damage, or where extremely high levels of reliability are demanded (such as aerospace systems, atomic energy controls, sea
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representatives before such use. The company will not be responsible for damages arising from such use without prior approval.
Any semiconductor devices have inherently a certain rate of failure. You must protect against injury, damage or loss from such failures
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FME/MS/SFDAC1/UM_1/4190 - 3.2
Page 28 of 28
Copyright © 1999 Fujitsu Microelectronics Europe GmbH