Download Microcomputer Components C501

C501
VCC -0.5 V
0.2 VCC+0.9
Test Points
0.2 VCC -0.1
0.45 V
MCT00039
AC Inputs during testing are driven at VCC – 0.5 V for a logic ‘1’ and 0.45 V for a logic ‘0’. Timing
measurements are made at VIHmin for a logic ‘1’ and VILmax for a logic ‘0’.
Figure 19
AC Testing: Input, Output Waveforms
VOH -0.1 V
VLoad +0.1 V
Timing Reference
Points
VLoad
VLoad -0.1 V
VOL +0.1 V
MCT00038
For timing purposes a port pin is no longer floating when a 100 mV change from load voltage
occurs and begins to float when a 100 mV change from the loaded VOH / VOL level occurs.
IOL / IOH ≥ ± 20 mA.
Figure 20
AC Testing: Float Waveforms
Crystal Oscillator Mode
Driving from External Source
C
3.5 - 40 MHz
XTAL2
P-LCC-44/Pin 20
P-DIP-40/Pin 18
M-QFP-44/Pin 14
C
XTAL1
P-LCC-44/Pin 21
P-DIP-40/Pin 19
M-QFP-44/Pin 15
N.C.
External Oscillator
Signal
XTAL2
P-LCC-44/Pin 20
P-DIP-40/Pin 18
M-QFP-44/Pin 14
XTAL1
P-LCC-44/Pin 21
P-DIP-40/Pin 19
M-QFP-44/Pin 15
C = 20 pF 10 pF
(incl. stray capacitance)
MCS02452
Note: During programming and verification of the C501-1E OTP memory
a clock signal of 4-6 MHz must be applied to the device.
Figure 21
Recommended Oscillator Circuits
Semiconductor Group
45
1997-04-01