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Appendix B - TDEV, MTIE (SDH Standards) (Version 5.0)
MTIE Masks (SDH Equipment)
MTIE SEC Generation
When the Synchronous Equipment Clock is slaved to a wanderless timing source,
the wander at output of the host SDH network element must meet this mask. The
test is to be performed over the temperature range specified for the equeipment.
(See ITU-T Recommendation G.813, section 7.1.)
1000
SEC Generation (ITU-T, Fig. 1/G.813)
MTIE = 40 + 0.5τ
0.1 < τ ≤ 1
MTIE = 40τ0.1 + 0.5τ
1 < τ ≤ 100
MTIE = 25.25τ0.2 + 50
100 < τ ≤ 1000
150
113
40
10
0.1
1
10
100
1000
MTIE SEC Gen Const Temp
When the Synchronous Equipment Clock is slaved to a wanderless timing source,
the wander at output host SDH network element must meet this mask. This test is
to be performed at a constant temperature ±1°K.
(See ITU-T Recommendation G.813, section 7.1.)
1000
SEC Gen Const Temp (ITU-T, Fig.1/G.813)
MTIE = 40
0.1 < τ ≤ 1
MTIE = 40τ0.1
1 < τ ≤ 100
MTIE = 25.25τ0.2
100 < τ ≤ 1000
100
63
40
10
0.1
B-2
1
10
100
1000
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