Download Deep-Level Transient Spectroscopy

[7] B. G. Svensson et al. Generation of vacancy-type point defects in single collision cascades
during swift-ion bombardment of silicon. Phys. Rev. B, 55(16):10 498, 1997.
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Acknowledgements
These notes were initially written by Matthew Lay in 2004, tweaked by David Hoxley in the
same year, and further modified in 2006 and 2008 by Byron Villis. Diodes were prepared by
Matthew Lay and Byron Villis with much help from Jeff McCallum.
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