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7-14
Status Structure
Models 2510 and 2510-AT User’s Manual
Measurement event register
The used bits of the Measurement Event Register (shown in Figure 7-6) are described as
follows:
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Bit B0, Over Temperature (OT) — Set bit indicates an over temperature
condition.
Bit B1, Under Temperature (UT) — Set bit indicates an under temperature
condition.
Bit B2, Over Voltage (OV) — Set bit indicates an over voltage condition.
Bit B3, Current Overload (CO) — Set bit indicates a current overload condition.
Bit B4, Over Resistance (OR) — Set bit indicates an over resistance condition.
Bit B5, Under Resistance (UR) — Set bit indicates an under resistance condition.
Bit B6, Reading Available (RAV) — Set bit indicates that a reading was taken and
processed.
Bit B7, Reading Overflow (ROF) — Set bit indicates that the reading exceeds the
selected measurement range of the Model 2510.
Bits B8 through B10 — Not used.
Bit B11, Output Enable (OE) — Set bit indicates that the Digital I/O port output
enable line is asserted.
Bit B12, Setpoint Tolerance (SPT) — Set bit indicates that the setpoint is within
the programmed tolerance for the required number of readings.
Bit B13, Open Lead (OL) — Set bit indicates that the temperature sensor leads are
open.
Bit B14, Shorted Lead (SL) — Set bit indicates that the temperature sensor leads
are shorted.
Bit B15 — Always zero.
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