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AN10918
NXP Semiconductors
IEC60335 Class B library
Function:
type_testResult IEC60335_RAMtest_BIST
(
UINT32 startAddrs,
UINT32 length
)
Purpose:
This function executes sequentially the nine march tests in BIST-mode. The user can use
this function to execute a RAM test on a defined memory range.
Input variables:
UINT32 startAddrs
Defines the start address of the memory range to be tested. It points to the lowest
address.
UINT32 length
Defines the length of the memory range to be tested
Return value:
IEC60335_testPassed
IEC60335_testFailed
AN10918_1
Application note
All information provided in this document is subject to legal disclaimers.
Rev. 01 — 1 March 2010
© NXP B.V. 2010. All rights reserved.
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