Download LabVIEW Statistical Process Control Toolkit Reference Manual
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aBook Page 30 Wednesday, April 22, 1998 8:21 AM Control Chart VIs Chapter 2 c: # defects/ sample. The number of non-conformities or defects per sample inspected. std error multiplier. The multiplier to use for the upper and lower control limits. Normally you leave std error multiplier unwired, and the VI sets the control chart limits to +/- 3.0 standard errors. The default is 3.0. index spec. Use this cluster to choose a range of samples in c to use for the control limit calculation. start index. Index of the first element of c to include in the control limit calculation.The default is zero, which is the index of the first sample in samples X array. end index. Index of the last element of c to include in the control limit calculation. The default is zero, which selects the last sample in c array. If you do not wire this cluster, the VI includes all elements in c input array in the control limit calculation. indices to ignore. Indices of c to exclude from the control limit calculation. This is useful for eliminating out-of-control points from the control limit calculation. By default, this is an empty array. # samples in calc. The number of samples used in the control limits calculation. c: # non-conformities/inspection unit. The number of non-conformities or defects found per sample unit. This is identical to the input array c. These are the points plotted on the c control chart. c chart lines. This cluster contains the limits for one c chart. UCLc. The upper control limit for the c chart. If std error multiplier is three, this will be c-bar + 3 standard errors. LabVIEW SPC Toolkit Reference Manual 2-30 © National Instruments Corporation