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5 - KITE Utilities
Table 29. Standard Event Functions
Event
KDX_START_LOT
KDX_START_WAFER
KDX_START_DEVICE
KDX_DUT_TEST
KDX_END_DEVICE
Description
Parameters
void
void
int site
int devNum
Start of device testing
int x
int y
Description of
Parameters
Start of lot
Start of wafer
Results of test
execution
Results of device
testing
dutTestInfo *dti
void *uData
void *xyData
int site
int devNum
int hBin
int sBin
int ResFlag
int inWafer
int x
int y
void
void
KDX_END_WAFER
KDX_END_LOT
End of wafer
End of lot
KDX_USER_PRINTF
TPEDatalogPrintf() is
called in the test
void
program
KDX_END_SHMOO
Complete shmoo
execution is finished
int site
Site number
Device number
X coordinate
Y coordinate
DUT test information
(refer to
data_engine_if.h)
User data
XY Data
Site number
Device number
Hardware bin
Software bin
Test result (refer to
RESULT enum in
ktypes.h)
1 – in wafer
0 – not in wafer
X coordinate
Y coordinate
Site number
NOTE — Not all of the function events are described in Table 29.
For example:
kdx_return kdx_register_callbacks(void)
{
382
PN: 071-0359-02, October 2005
