Download Agilent Technologies 6633A User`s guide
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Programming the DC Source - 7 interval and the number of data points so that an integral number of waveform cycles will end up in the measurement buffer. Voltage and Current Measurements The Agilent 66311B has a number of waveform measurement capabilities. The SCPI language MEASure and FETCh queries are used to return the various measurement parameters of voltage and current waveforms. Average Measurements To measure the average output voltage or current, use: MEASure:VOLTage? MEASure:CURRent? or Average voltage and current is measured by acquiring a number of readings at the selected time interval, applying the Hanning window function to the readings, and averaging the readings. Windowing is a signal conditioning process that reduces the error in average measurements made in the presence of periodic signals such as pulse current waveforms, which are generated when TDMA cellular phones are transmitting. The power-on and *RST sample interval and sweep size settings yield a data acquisition time of 32 milliseconds per measurement. Ripple rejection is a function of the number of cycles of the ripple frequency contained in the acquisition window. More cycles in the acquisition window results in better ripple rejection. If you increase the data acquisition time for each measurement to 45 microseconds for example, this results in 5.53 cycles in the acquisition window at 60 Hz, for a ripple rejection of about 70 dB. RMS Measurements (Agilent Model 66311B Only) To read the rms content of a voltage or current waveform, use: MEASure:VOLTage:ACDC? or MEASure:CURRent:ACDC? This returns the total rms measurement. Making rms or average measurements on ac waveforms for which a non-integral number of cycles of data has been acquired may result in measurement errors due to the last partial cycle of acquired data. The instrument reduces this error by using a Hanning window function when making the measurement. If the measurement readings vary from sample to sample, try increasing the data acquisition time to reduce measurement error. Pulse Measurements (Agilent Model 66311B Only) Use fetch queries to return all measurement data in the shortest time. The fetch functions do not trigger the acquisition of new measurement data, but are used to return different calculations from the data that was retrieved by the acquisition trigger. If you take a voltage measurement you can fetch only voltage data; if you take a current measurement you can fetch only current data, otherwise an error will occur. The dc source has several measurement queries that return key parameters of pulse waveforms as shown in Figure 7-3. 73