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Working with SPM Certus Standard
4. Working with SPM Certus Standard
In this section work with scanning probe microscope Certus Standard in a
semi-contact atomic force microscope mode is described. For other AFM modes look
the user manual additions. Before reading this section it is recommended to familiarize
with the user's guide the software NSpec. To start work it is necessary to switch SPM
Certus Standard on.
4.1.
The list of base operating modes
It is possible to allocate following basic modes:
Обозначение
Описание
SPM modes
Optical microscopy modes
Superposed modes
The full list of base operating modes:
SPM modes — probe scanning
+
+
-
Optical microscopy modes
-
+
+
* The scanning stage is used only for positioning of samples
4.2.
Basic SPM Certus Standard operations (atomic-force microscope
techniques)
For getting of SPM images it is necessary to adjust an atomic-force microscope.
The general sequence of actions on SPM adjustment:
Adjustment of range and bias of the capacity sensors
«Nano Scan Technologies Ltd.»
User manual
Operation isn't obligatory, there is an automatic and
manual mode of adjustment
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