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Press Monitoring System
Sciemetric’s SigPOD™ Press Monitoring System provides the easiest to use,
most comprehensive and highest reliability press monitoring available. With the
most consistent test results and less false failures, the SigPOD™ Press
will help you achieve your yield and quality objectives.
Off-The-Shelf Solution
Sciemetric’s SigPOD™ Press Monitoring System is a proven
off-the-shelf test system that can be quickly setup by the user
and automatically configured for your specific requirements.
Easy Configurable Setup
The system can be setup without an external computer by using
the optional touch screen monitor or with the optional mouse and
keyboard. The setup is menu driven by a wizard that guides the
user through the setup process. This has the benefits of allowing
for fast implementation and low start-up costs. Best of all, the wizard
configures the SigPOD™ Press for your specific press monitoring
needs in a matter of minutes unlike other press monitoring
solutions that require costly on-site installation by a 3rd party.
The best practices used by the SigPOD™ Press include Sciemetric’s
advanced signature analysis methodology. Algorithms find specific
features on a press waveform and conduct advanced analysis on
those key features (e.g. initial contact point, point of bottom out,
point of absolute maximum force, etc). The analysis does not rely
on the waveform’s position on the result grid as the features are
identified dynamically and the full feature characteristics
are evaluated. This technique yields increased accuracy and better
repeatability than conventional methods. Conventional press
monitoring systems use basic ‘postage stamp’, ‘box function’,
‘fitting window’ or ‘peak detection’ to determine quality. These
older approaches collect a limited sample of data and verify that
the waveform correctly enters and exits static windows on the
waveform. These approaches yield unreliable results as they fail
to fully analyze each waveform feature.
Press Monitoring Best Practices
The SigPOD™ Press comes out of the box with advanced
algorithms designed for the simplest to the most complex press
monitoring requirements. Sciemetric has embedded press
monitoring “best practices” into the system based on decades of
experience with press applications. During setup, the SigPOD™
Press gathers information from the wizard and automatically
makes modifications to the software to fit the specific customer
implementation requirements. The wizard provides the best of
both worlds; the deployment simplicity of an off-the-shelf
solution coupled with the benefits of a custom solution tailored to
your exact press monitoring requirements.
The SigPOD™ Press uses Sciemetric’s advanced signature analysis
technology to eliminate false accepts and find more defects than other
press monitoring systems.
Press Monitoring System
Advanced Limit Management
Auto-Learn
Any manufacturing test system is only as good as the limits that
have been set. If limits are set too wide then a manufacturer
runs the risk of shipping faulty product. If limits are too stringent
then yield is compromised and manufacturing personnel loose
confidence in the system. Therefore, SigPOD™ Press includes
Sciemetric’s proprietary Advanced Limit Management System
which consists of both auto-learn and maintain functions.
The auto-learn function “suggests” optimal statistically derived
limits for the press monitoring system. Known failure rates are
estimated BEFORE deployment on the factory floor. As manufacturing processes experience normal process variation, the limits
of any press monitoring system will require maintenance to avoid
creeping in to a “false fail” or “false pass” scenario. Sciemetric’s
proprietary maintain function is designed to help in this process
by using production statistics to continuously calculate optimal
test limits and propose new limits that the user has the option of
accepting.
dimensions, sub-components or fixtures. To maximize productivity
it is imperative that a test system be capable of identifying and
addressing normal process variability, while alerting operators of
abnormal or harmful variability. The SigPOD™ Press uses Process
Variability Compensation™ to accommodate for inevitable process
variability and minimize false rejects.
Most press monitoring systems are triggered by an absolute
start. The starting point could be a PLC trigger or when the press
starts. The SigPOD™ Press analyses test results based on the
initial point of contact between the ram and the part. Over time
the amount of displacement required to press a part will vary.
This variability would confuse other press monitoring systems into
believing that less or more displacement was required depending
on the pallet dimensions. Press monitoring systems that rely on
an absolute start require constant calibration. These conventional
press monitoring systems tend to generate numerous false
failures and manufacturing personnel loose confidence in them.
The auto-learn and maintain functions have a very significant
impact on the integrity of the monitoring system and on its’ total
cost of ownership.
Process Variability Compensation™
All production facilities are subject to normal variations in operation.
These variances may be the result of slight differences in pallet
Scaleable and Flexible
The SigPOD™ Press system is flexible and able to scale
according to your specific requirements.
Multi-RAM Monitoring Capability*
The advanced limit management capability of the SigPOD™ Press allows
for easier limit management and optimal limits to be set.
The system scales to support from one to four rams on a
single test system, providing flexibility based on your production
requirements. Many competitive press monitoring systems can
only monitor one or two rams. For multi-ram monitoring
and analysis for up to 4 rams. This leads to improved cycle time.
Immediately after the press operation is complete for a given ram,
the data is analyzed and the pass/fail result is transmitted without
having to wait for all rams to complete their cycle.
* Available on select models only. Please consult specifications.
Production Ready
The SigPOD™ Press is ideally suited for continuous operation in
production. To ensure maximum reliability and up-time the
controller is designed to NEMA 12 (IP52) standards to withstand
the demands of the harshest manufacturing environments.
requirements you would need to buy multiple test systems from
the competition whereas you can accomplish this with one
SigPOD™ Press, resulting in a lower initial capital expenditure
and lower deployment costs.
Asynchronous Testing*
The SigPOD™ test systems can be seamlessly integrated into
your manufacturing process. The system supports numerous
communication and network options including direct Ethernet
and most major fieldbus interfaces such as Interbus, Profibus
and DeviceNet.
The SigPOD™ Press Monitoring System has advanced data
collection capabilities and supports completely independent
collection of analog data from multiple rams. The system
supports independent triggering and asynchronous collection
Increase
First Time Yield
The QualityWorX® Test System Manager collects
all test data including waveform results from a
SigPOD™ Press test system and permanently
stores them on the QualityWorX server. Advanced
analysis tools are used to analyze and automatically
sort through enormous amounts of test data and
transform the raw data into actionable information.
The QualityWorX® TSM provides insight into the
test data, enabling an accurate understanding of
defect and quality issues. Corrective action can
then be taken to eliminate the root cause of quality
problems leading to increased first time yield.
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QualityWorX® features such as trend reports,
What If™ analysis and Pareto charts provide
an accurate understanding of quality and defect
issues. Corrective action can then be taken
to eliminate the root cause of quality problems
leading to increased first time yield.
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For each test operation the following data is
stored and automatically sorted:
• complete waveforms
• discrete feature data (e.g. leak rate,
insertion force)
• operation status results
Specifications and Ordering Information
System
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Analog Inputs
Intel® Celeron Processor 650 MHz
Microsoft® Windows® XPe® operating system
Optional 10.4” touch screen
Solid state disk technology for operating system and data
Optional HD for high capacity data storage
DIN rail, Desk, Machine, Panel and Arm mount
Online User’s Manual
Processor
Processor
Optional Hard Disk for Data
Operating System Memory
Data Memory
Ethernet
USB
RS232 Serial Port
External Monitor
Intel®*
40 GB*
512 MB RAM*
512 MB
10/100 Base-TX
2 Ports
1
SVGA Connector
General
Chassis Dimensions
SigPOD only
SigPOD w Screen
Up to 4 depending on model
±10 V, ±2 V, ±100 mV, ±33 mV
0.01 % of full scale
16 bit A/D, ±32,768 counts
250 kHz
10 MΩ
Input filter
Input Bandwidth
Internal Calibration
Overload Protection
Shunt Calibration
20 kHz 6 pole and 1 kHz 4 pole selectable
20 kHz maximum 3 dB down
Auto-zero
28 V without damage
Relay contacts per channel
Excitation Voltage
Maximum Current
Line and load regulation
Noise
Short Circuit Protection
Excitation remote sense
10 VDC
150 mA per channel
0.01 %
100 µV max
Continuous
Separate input per channel
Encoder Input
7 x 7.74 x 4 in
(178 x 197 x 101 mm), H x W x D
8.3 x 11.5 x 5.8 in
(211 x 292 x 147 mm), H x W x D
Chassis Weight
SigPOD only
SigPOD w Screen
SigPOD Desk Mount
5 lbs (2.3 kg)
11 lbs (5 kg)
17 lbs (7.7 kg)
Operating Humidity
Operating Temperature
Environmental
Warm Up Time
Paint Finish
8 to 90% relative, non-condensing
5 to 45 °C
NEMA 12 (IP52) with NEMA Hood
60 minutes for stated accuracy
Black baked powder
Power
Supply Voltage
Power Consumption
Number of Channels
Input Ranges
Input Accuracy
Resolution
Maximum A/D Sample Rate
Input Impedance
18 to 36 VDC
48 W maximum, 30 W typical
Number of Channels
Sensors
Signal Type
Index input
Frequency
Counter
Input Protection
Sensor Power
Up to 4 depending on model
Rotary encoders and linear scales
Quadrature input or single phase pulses
Can optionally zero the counter
5 MHz maximum pulse rate TTL
50 kHz maximum pulse rate open collector
(internal pull-up)
32-bit (±2 x 109 counts)
±28 V without damage
+5V DC @ 250 mA, current limited
Digital Inputs
Number of Channels
Polarity
Isolation Voltage
Input Current
Input for low state
Input for high state
8 with common return line
Bidirectional
240 VAC or DC (Optically isolated)
2.5 mA maximum
8 VDC maximum
16 VDC minimum
Digital Outputs
*
The exact processor type and speed, memory supplied, hard disk capacity
and other technical specifications are subject to change.
** Depends on system configuration.
Number of Channels
Polarity
Isolation Voltage
Switching Capability
Contact Resistance
8 with common return line
Bidirectional
240 VAC or DC (Optically isolated)
±1 A @ ±60 VAC peak or DC
>100 MΩ off; <0.15 Ω, on
Solutions for Manufacturing. Defect Detection. Analysis. Traceability.
TECHNICAL SUPPORT
1- 877-581- 0112
For more information contact
your local Sciemetric Representative.
Sciemetric Instruments Inc.
Tel: (613) 254-7054
www.sciemetric.com
e-mail: [email protected]
©2005 Sciemetric Instruments Inc. All brand and product names are trademarks or registered trademarks or their respective companies. Printed in Canada. Rev1.0 March 2005