Download Dokument 1 - Dokumentenserverhosting der SUB
Transcript
LITERATURVERZEICHNIS 131 [HWMAD03] H ILAL, N. ; WAHAB M OHAMMAD, A. ; ATKIN, B. ; DARWISH, N. A.: Using atomic force microscopy towards improvement in nanofiltration membranes properties for desalination pre-treatment: a review. In: Desalination 157 (2003), S. 137–144 [HY04] H E, X. C. ; Y UNG, N. H. C.: Curvature Scale Space Corner Detector with Adaptive Threshold and Dynamic Region of Support. In: Proceedings of the 17th International Conference on Pattern Recognition (ICPR’04) Bd. 2, 2004, S. 791–794 [Inm01] I NMAN, D. J.: Engineering Vibration. Prentice Hall, 2001 [Int] I NTEGRATED DYNAMICS E NGINEERING G MB H (Hrsg.): Bedienungsanleitung und Installationsbeschreibung für Schwingungsisolationstische der Baureihen TLC, TGU und TG. Karl-Liebknecht-Str. 30 65479 Raunheim: Integrated Dynamics Engineering GmbH [Isr92] I SRAELACHVILI, J N.: Intermolecular and Surface Forces. Academic Press, 1992 [JG09] J UAN, L. ; G WON, O.: A Comparison of SIFT, PCA-SIFT and SURF. In: International Journal of Image Processing 3 (2009), Nr. 4, S. 143–152 [JKR71] J OHNSON, K. L. ; K ENDALL, K. ; ROBERTS, A. D.: Surface energy and the contact of elastic solids. In: Proc. R. Soc. Lond. A 324 (1971), S. 301–313 [JMHS02] JÄGER, G. ; M ANSKE, E. ; H AUSOTTE, T. ; S CHOTT, W.: Operation and analysis of a nanopositioning and nanomeasuring machine. In: Proceedings of the 17th Annual Meeting, The American Society for Precision Engineering, 2002 [JTB+ 06] JÄGER, G. ; T., Hausotte ; B ÜCHNER, H.-J. ; M ANSKE, E. ; S CHMIDT, I. ; M ASTYLO , R.: Long-range Nanopositioning and Nanomeasuring Machine for Application to Mico- and nanotechnology. In: Metrology, Inspection, and Process Control for Microlithography XX, Proceedings of SPIE Vol. 6152, 2006, S. 758–766 [KD03] KOOPS, K. R. ; D IRSCHERL, K.: Alternativ Measuring Modes for Scanning Probe Instrumentation. In: Proceedings of the EUSPEN International Topical Conference, Aachen, Germany, May 19th/20th, 2003, 2003 [Kel91] K ELLER, D.: Reconstruction of STM and AFM images distorted by finite-size tips. In: Surface Science 253 (1991), Nr. 1-3, S. 353 – 364 [KMT07] K ÜNG, A. ; M ELI, F. ; T HALMANN, R.: Ultraprecision micro-CMM using a low force 3D touch probe. In: Measurement Science and Technology 18 (2007), S. 319–327 [Kra05] K RAMAR, J. A.: Nanometre resolution metrology with the Molecular Measuring Machine. In: Meas. Sci. Technol. 16 (2005), S. 2121–2128