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Download Agilent 8504B Precision Re ectometer
Transcript
Specications and Regulatory Information Characteristics Measurement Noise Floor The instrument measurement noise oor is nearly independent of mirror position when using the 1300 nm source. Noise oor with 1300 nm source. For the 1550 nm source with dispersion correction enabled, the measurement noise oor depends on the mirror position. The noise oor at a mirror position of 400 mm is approximately 5 dB higher than at a mirror position of 0 mm. The noise oor for all mirror positions can be substantially lowered by narrowing the measurement span. Noise oor with 1550 nm source. 6-15 FINAL TRIM SIZE : 7.5 in x 9.0 in
