Download Model 4200-SCS Semiconductor Characterization System
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Section 3: Common Device Characterization Tests Model 4200-SCS User’s Manual Figure 3-121 FlashEndurance-Switch project Running a FlashEndurance or FlashDisturb project This section explains how to use the following Flash projects: • • • • • • FlashEndurance-NAND FlashEndurance-NOR FlashEndurance-Switch FlashDisturb-NAND FlashDisturb-NOR FlashDisturb-Switch These Flash projects use a small number of tests and methods. This section will explain the tests and how to set parameter values for Endurance testing or Disturb testing. Before using any of these projects, determine the appropriate pulse voltages and widths by first using the appropriate project, using the procedures in Running the Flash-NAND, Flash-NOR or Flash-Switch Project. The Endurance and Disturb projects include everything from the corresponding Flash-NAND, Flash-NOR, or Flash-Switch projects. To use an Endurance or Disturb test, ensure that each test in the project navigator is functioning properly by following the procedures below. After setting up all of the tests, the information below will continue to explain the setup for the stress / measure looping that is the core of any endurance or disturb test. 1. 2. 3. 3-138 If system connections have not been made, follow the instruction in Running any Flash Project for the first time. If KITE is not running, start KITE by double-clicking the KITE icon on the Model 4200-SCS desktop. Open the appropriate KITE Flash project. a. Within KITE, click FILE > Open Project. If the dialog window is not displaying the _Memory folder, move up one or two levels to the display the Projects directory. Doubleclick the _Memory folder, then double-click the desired Flash test folder (see list above Return to Section Topics 4200-900-01 Rev. H / February 2013