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Download Model 4200-SCS Semiconductor Characterization System
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Section 3: Common Device Characterization Tests Model 4200-SCS User’s Manual Figure 3-122 FlashDisturb-NAND project – subsite setup tab Figure 3-123 FlashDisturb-NAND project – device stress properties Explanation of flash UTM parameters 3-142 NumPulseTerminals (int) The number of pulse terminals, or pulse channels, to use for the test. The number of pulse terminals ranges from one to eight. PulseTerminals (char *) A string representation of all the VPU channels being used in the test, matching the number given in NumPulse. For example if the setup is such that VPU1 Channel 1 and VPU2 Return to Section Topics 4200-900-01 Rev. H / February 2013
