Download 1. Basic Information about SPM Certus

Operating principles
The main difference between scanning probe microscopy techniques is in selected
for the registration parameters and methods of registration.
2.2.
Probe scanning/positioning
XY (XYZ) scanning process is used to get the image in scanning probe micro­
scopes.
2.2.1. Scanning
The scanning process proceeds as follows. The scanner performs a raster move­
ment of the object (Fig 2.3). System takes signal measurement and digitizes data at
nodes of the raster to receive information about the surface characteristics. The direction
of lines along which scanner moves, is called the fast scan direction. Perpendicular dir­
ection is called slow scan direction.
Fig. 2.3 Scanning process illustration
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“Nano Scan Technologies Ltd”
Certus – Scanning Probe Microscope. User manual
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