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Application Note 1330
Test Points
You can observe the D- and D+ USB signal of the full-speed
channel on an oscilloscope or other test equipment by
connecting a differential probe at JP3.
The board has various test points for ease of connecting
probes to make measurements. The test points available are
described in Table 1.
You can observe the D- and D+ USB signal of the
high-speed channel on an oscilloscope or other test
equipment by connecting a differential probe at JP2.
TABLE 1.
DESIGNATOR
TP1
DESCRIPTION
You can observe the D- and D+ USB signal at the COM side
of the switch on an oscilloscope or other test equipment by
connecting a differential probe at JP1.
VDD test point
TP2, TP4, TP5, Ground Test Point
TP6, TP7, TP8,
TP9
TP3
VBUS Test Point From Computer
JP1
D-/D+ Differential Probe Connection - COM Side of
Switch
JP2
D-/D+ Differential Probe Connection - High-Speed
Device Side of Switch
JP3
D-/D+ Differential Probe Connection - Full-speed
Device Side of Switch
ISL54200EVAL1Z Board Schematic
VDD
GND
IN
EN
J4
J5
C1
J6
J7
TP2
1
1
1
1
10UF
C2
1
1
TP1
0
R2
0
R1
0.1UF
5
MOUNT
7
8
3
HSD+
7
Pack.
6
5
6
JP2
6
1
1
TP4
J2
A
5
MOUNT
1
1
1
VHS
1
2
VFS
TP9
TP8
FULLSPEED
DEVICE
MOUNT
J3
1
2
TO
2
1
1
USB
6
JP3
JP4
4
4
3
FSD+
VBUS
2
3
A
1
1
2
DUSB_ARA42_T11A
A
FSD-
TP3
HIGHSPEED
DEVICE
MOUNT
EP
2
TP5
1
USB
TO
6
2
1
JP1
11
4
TP7
5
8
2
4
COM2
1
4
DFN10
Generic
HSD9
TP6
U1
3
1
3
1
4
J1
9
3
4
MOUNT
A
2
10
2
2
2
USB
4
3
3
897-30-004-90-000
USB
TO
HOST
2
COM1
10
1
MOUNT
1
DUSB_ARA42_T11A
5
1
1
1
A
1
JP5
J8
VBUSHS
J9
VBUSFS
A
Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without notice. Accordingly, the reader is cautioned to
verify that the Application Note or Technical Brief is current before proceeding.
For information regarding Intersil Corporation and its products, see www.intersil.com
5
AN1330.0
June 13, 2007