Download datasheet FH

Perform High-precision Machine Operation
The High-precision Object Detection Required for Positioning
Low-error Position Detection Even with Blurry Images
Over the years, OMRON has perfected techniques to search for and match templates at high speed. From these techniques Shape Search Ⅲ provides
advanced robustness, which is critical on FA sites. When measuring lamination of glass or other processes where the distance to the workpiece from the
Camera varies, size differences and focal shifts can occur. Even in cases like this, the new Shape Search Ⅲ algorithm detects positions with limited error.
0.60
Camera
Error (pixels)
0.50
Previous search
processing items
0.40
0.30
Shape Search III
0.20
Error
0.10
0.00
-5
Glass 1
-4
-3
-2
-1
0
1
2
3
4
Z-axis travel amount [mm]
Close
Glass 2
5
Far
Stable Searching with Limited Error Even under Adverse Conditions
Stable searching is possible even under the following adverse conditions, which occur far too often in actual measurement applications.
Shape Search Ⅲ
Previous Search
1
0.9
0.8
0.7
Error (pixels)
8
0.6
Focal shift
Contrast
Chips
Hidden
Overlapping
Thinning and
thickening
0.5
0.4
0.3
0.2
0.1
0
Focal shift
Contrast
Chips
Hidden
Overlapping
Thinning and
thickening
Visualization of Comparisons Enables Easy Setup of High-precision Searching
Patent Pending
Advanced searching is accompanied by many parameters that must be tuned to match the application. However, it is difficult for the person making the
settings to see the internal process. Extensive time is required to make the most of tool performance. With Shape Search Ⅲ, you can visualize
comparisons between the model data and a part of the measurement object to easily see when comparisons are not matched well for the inspection.
Visualization of the comparison level, allows for parameters to be adjusted simply to obtain the best performance.
Registered model
You can see at a glance the difference
between the registered model and
measurement image.
Measurement image
Reduction in
correlation
Deformation
You can adjust a parameter called
No reduction the Acceptable Distortion Level to
enable measurements without
reducing the correlation even if
there is distortion.You can easily
adjust this parameter while
monitoring the comparison.
Chip