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XG2130 E1/Datacom Tester Overview ü Built-in 64kb/s tone channel listen capability ü CAS and CCS signaling monitoring • Round trip delay measurement • APS delay measurement • PCM simulator ü Extensive alarm generation ü Frame data Si, Sa, A, FAS, CRC-4, MFAS, NMFAS and EBIT control and monitoring ü Idle word timeslot insertion ü VF tone generation and measurement ü CAS and CCS signaling generation and monitoring • Frequency, offset and level measurement • Up to ±999ppm transmit clock deviation • Transmit clock: Internal, Interface and External 2M clock/signal (option) • u • Real time transmit circuit open/short indication Datacom Testing: Datacom (V.24, V.35, V.36, X.21, RS-449, RS-485, EIA-530, EIA-530A) BER testing • Asynchronous BER testing with baud rate 50b/s~57.6Kb/s • Synchronous BER testing with data rate 1.2Kb/s~38.4Kb/s and Nx64Kb/s(N=1~32) • DTE or DCE emulation mode • Synchronous clock source and sense selection Clock source: Internal or Interface Clock sense: Rising edge or falling edge 72-0027-03A 6