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XG2130 E1/Datacom Tester
Overview
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Built-in 64kb/s tone channel listen capability
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CAS and CCS signaling monitoring
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Round trip delay measurement
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APS delay measurement
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PCM simulator
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Extensive alarm generation
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Frame data Si, Sa, A, FAS, CRC-4, MFAS, NMFAS and EBIT control and monitoring
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Idle word timeslot insertion
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VF tone generation and measurement
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CAS and CCS signaling generation and monitoring
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Frequency, offset and level measurement
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Up to ±999ppm transmit clock deviation
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Transmit
clock:
Internal,
Interface
and
External
2M
clock/signal (option)
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u
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Real time transmit circuit open/short indication
Datacom Testing:
Datacom (V.24, V.35, V.36, X.21, RS-449, RS-485, EIA-530,
EIA-530A) BER testing
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Asynchronous BER testing with baud rate 50b/s~57.6Kb/s
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Synchronous BER testing with data rate 1.2Kb/s~38.4Kb/s
and Nx64Kb/s(N=1~32)
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DTE or DCE emulation mode
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Synchronous clock source and sense selection
Clock source: Internal or Interface
Clock sense: Rising edge or falling edge
72-0027-03A
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