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Chapter 7 - Troubleshooting Procedures
7.7
MultiMux Functional Testing Procedures
There are tests available on the MultiMux which check various functions
within the MultiMux logic. These tests will assist you in trouble shooting
problems which are not related to the composite communications
channel or local channel devices. The two tests described below will
check the non-volatile memory used for parameter storage and internal
circuitry, called the Watch-Dog circuitry, which is responsible for keeping
the MultiMux functioning normally.
Table 7-4. MultiMux Functional Testing Pocedures
Note: Executing the Battery/Memory test procedure will result in the
destruction of stored parameters.
1
Before checking the non-volatile memory feature, enter an ATL
command and record all channel parameters.
2
Place the MultiMux in Test mode 8 (i.e., executing the non-volatile
Memory test) by entering the following command:
AT&T8 (hit Return)
(let the test complete its cycle)
The supervisory console will display the following message:
Memory test - This test will destroy all stored onfigurations.
Do you wish to continue? (Y/N)
3
Press the Y key (the message “writing” will appear while the test is
running) and the following message will be displayed on the
supervisory console:
Turn power off for 10 seconds and then back on.
Then enter AT to end test.
4
As the message indicates, turn power off for ten seconds and then
back on. Depending on the condition of the memory, one of the
following messages will appear on your supervisory console:
Non-Volatile Memory Test Passed
or
Non-Volatile Memory Test Failed
Enter the following:
AT (hit Return)
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