Download Dektak XT Surface Profiler

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Transcript 
System Overview
 The Dektak XT surface profiler is an advanced thin
and thick film step height measurement tool.
 In addition to profiling surface topography and
waviness, the Dektak XT system measures roughness
in the nanometer range.
 The system can produce three-dimensional
measurements and analyses when equipped with the
3D Mapping Option
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