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PQM-701 Operating manual 10.10 Event detection The PQM-701 analyzer gives a lot of event detection options in the tested mains system. An event is the situation when the parameter value exceeds the user-defined threshold. The fact of event occurrence is recorded on the memory card as an entry which includes: • parameter type, • channel in which the event occurred, • times of event beginning and end, • user-defined threshold value, • parameter extreme value measure during the event, • parameter average value measure during the event. Depending on the parameter type, you can set one, two or three thresholds which will be checked by the analyzer. The table below lists all parameters for which the events can be detected, including specification of threshold types. Table 10. Even threshold types for individual parameters U f CF U u2 Pst Plt I CF I i2 P Q1, QB S D, SN PF cosϕ tanϕ EP+, EPEQ+, EQES THDF U Uh2..Uh50 THDF I Ih2..Ih50 K Parameter RMS voltage Frequency Voltage crest factor Voltage negative sequence unbalance Short-term flicker Pst Long-term flicker Plt RMS current Current crest factor Current negative sequence unbalance Active power Reactive power Apparent power Distortion power Power factor Displacement power factor tanϕ Active energy (consumed and supplied) Reactive energy (consumed and supplied) Apparent energy Voltage THDF Voltage harmonic amplitudes (order n = 2…50) Current THDF Current harmonic amplitudes (order n = 2…50) K-Factor Interruption Dip Swell • • • Minimum Maximum • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • • Some parameters can take positive and negative values. Examples are active power, reactive power and power factor. As the event detection threshold can only be positive, in order to ensure correct detection for above-mentioned parameters, the analyzer compares with the threshold their absolute values. 132