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APCO P25 Analysis
APCO P25 Analysis
This measurement is only done for bursty HCPM data and not for High Deviation or Low Deviation
test patterns.
The Limits tab in the P25 Summary Settings control panel allows you to compare the results against
limits set for Pass/Fail.
This measurement result is not shown in the P25 Summary display when trigger measurements are
chosen.
NOTE. Read about important information related to HCPM bursty data measurements here (see page 262).
HCPM Transmitter Logical Channel Power Envelope (Phase 2 HCPM)
This is a measure of how well a portable radio controls the transmitter power as it inserts an inbound
HCPM TDMA burst into a frame on a voice channel. This measurement applies to inbound signals only.
All scalar results relevant to this measurement are shown both in P25 Power vs Time display and
the P25 Summary display.
The measurement results and the duration in which the measurements are made are shown graphically
in P25 Power vs Time display. The results are grouped under Power Info and Time Info in the table
at the bottom of the display.
This measurement is only done for bursty HCPM data and not for High Deviation or Low Deviation
test patterns.
The Limits tab in the P25 Summary Settings control panel allows you to compare the results against
limits set for Pass/Fail.
This measurement result is not shown in the P25 Summary display when trigger measurements are
chosen.
NOTE. Read about important information related to HCPM bursty data measurements here (see page 262).
P25 Test Patterns
A variety of test patterns are specified in the TIA-102 documents for use in performance testing of
transmitters. These test patterns allow the software to compare the measurement result to the standards
limit. Test engineers can select from the test patterns described in the following tables.
NOTE. Although this table gives the test patterns for measurements as recommended by the Standard, other
measurement results are also be provided as additional information for a given test pattern. For example,
Modulation Fidelity results can also be provided for High Deviation and Low Deviation test patterns.
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